Abstract:
Method of forming an epitaxial crystalline layer on a crystalline substrate by depositing a first portion at a rapid growth rate and a second portion at a slower growth rate.
Abstract:
A modified, Czochralski-grown, single-crystalline spinel has a nominal composition (MgO)(Al2O3)x, where x can be between 1 and 2.3. The spinel has an (OH) ion content in its lattice that is related to the infra-red absorption coefficient Alpha , where Alpha varies with the MgO/Al2O3 ratio and at wave number 3360 cm 1 can be between 0.3 and 3.0 cm 1. The novel spinel is grown by a modified Czochralski method wherein the spinel is pulled from a melt of MgO and Al2O3 in an ambient, comprising between 0.2% and 2.0% oxygen, an inert gas, and water vapor substantially saturating (90 - 100% relative humidity) the abmient.
Abstract translation:改性的切克劳斯基生长的单晶尖晶石具有标称组成(MgO)(Al 2 O 3)x,其中x可以在1和2.3之间。 尖晶石在其晶格中具有与红外吸收系数α有关的(OH)离子含量,其中α随MgO / Al 2 O 3比变化,波数3360cm -1可以在0.3和3.0cm之间 < - > 1。 新型尖晶石通过改性Czochralski法生长,其中尖晶石在环境中从MgO和Al 2 O 3的熔体中拉出,包含0.2%至2.0%的氧气,惰性气体和基本饱和的水蒸气(90-100%相对 湿度)。
Abstract:
A radiation hardened silicon-on-insulator semiconductor device and method of making the same is disclosed. A region is formed in the silicon layer adjacent the insulating substrate which has a high density of naturally occurring crystallographic defects. This region substantially reduces the back-channel leakage that occurs when the device is operated after being irradiated.
Abstract:
A radiation hardened silicon-on-insulator semiconductor device and method of making the same is disclosed. A region is formed in the silicon layer adjacent the insulating substrate which has a high density of naturally occurring crystallographic defects. This region substantially reduces the back-channel leakage that occurs when the device is operated after being irradiated.
Abstract:
A radiation hardened silicon-on-insulator semiconductor device and method of making the same is disclosed. A region is formed in the silicon layer adjacent the insulating substrate which has a high density of naturally occurring crystallographic defects. This region substantially reduces the back-channel leakage that occurs when the device is operated after being irradiated.