Abstract:
Circuit for discharging to ground, supplied by a supply voltage, comprising a reference voltage, a negative potential node, first circuitry adapted to couple the negative potential node to the reference voltage in response to a control signal. Second circuitry is provided adapted to determine in the first circuitry the passage of a controlled current for the discharge of the negative potential node.
Abstract:
A method and related circuit for adjusting the duration of a pulse synchronization signal for the reading phase of memory cells in electronic memory devices which are integrated on semiconductors are discussed. The pulse synchronization signal is produced by a pulse generator when it detects a logical state commutation on at least one input terminal of a plurality of addressing input terminals of the memory cells. The method produces a logical sum between the signal produced by the generator and a pulse signal having a predetermined duration. The logical sum is used to start up the reading phase.
Abstract:
Circuit for discharging to ground, supplied by a supply voltage, comprising a reference voltage, a negative potential node, first circuitry adapted to couple the negative potential node to the reference voltage in response to a control signal. Second circuitry is provided adapted to determine in the first circuitry the passage of a controlled current for the discharge of the negative potential node.
Abstract:
A method and related circuit for adjusting the duration of a pulse synchronization signal for the reading phase of memory cells in electronic memory devices which are integrated on semiconductors are discussed. The pulse synchronization signal is produced by a pulse generator when it detects a logical state commutation on at least one input terminal of a plurality of addressing input terminals of the memory cells. The method produces a logical sum between the signal produced by the generator and a pulse signal having a predetermined duration. The logical sum is used to start up the reading phase.
Abstract:
An electronic circuit generates a stable voltage signal for the polarization during a reading step of a UPROM redundancy cell incorporating at least one memory element of EPROM or Flash type, having at least one terminal to be polarized, and MOS transistors which connect such memory element to a low voltage power supply reference. The circuit includes a current mirror structure with a first control branch and a second output branch. The current mirror stricture includes a first series of MOS transistors (M2, M3, M4) in said first branch between the supply reference and a ground; and a second series of transistors (M5, M6, M7) in said second branch. The circuit also includes an input terminal connected to the gate terminal of a transistor of the first series of transistors and an output terminal corresponding to an interconnection node of the second series of transistors. The stable voltage is obtained through a current which passes through at least a pair of transistors of the second series.
Abstract:
The memory device (1) has a plurality of local boost circuits (10), each connected to a sector (4) of the memory array (3), and each having a control circuit (10), at least a respective boost capacitor (13), and a respective drive circuit (16a, 16b). Each drive circuit is only enabled in read mode, on receiving signal ATD and a sector enabling signal (ENi), for reading memory cells (5) forming part of the respective sector (4a, 4b). The boost voltage (VBN) is only supplied to the final inverter (9) of the row decoder (7); a clamping diode (14) limits the boost voltage to prevent undesired direct biasing of the PMOS transistors (38) of the final inverters (9) connected to the nonaddressed word lines (6); and the overvoltage is therefore only supplied locally when and where necessary.
Abstract:
A nonvolatile memory (35) presenting a data memory array (2) including memory cells 85); a read circuit (40) including a plurality of sense amplifiers (10), each connected to a respective array branch (17) to be connected to the memory cells; and a reference generating circuit (55) including a single reference cell (60) arranged outside the data memory array (2) and generating a reference signal (IR). The reference generating circuit (55) presents a plurality of reference branches (41), each connected to a respective sense amplifier (10); and current mirror circuits (53, 54, 62, 63) interposed between the reference cell (60) and the reference branches (41), and supplying the reference branches with the reference signal (IR).