Abstract:
A memory cell reading circuit has a reference cell bit line and a matrix cell bit line connected to a supply voltage through respective loads and furthermore connected by normally-off equalization transistors which are enabled by a first clock signal. The bit lines are further connected by normally-off resistive equalization transistors whose resistance is significant in conducting conditions. The equalization transistors are enabled by a first clock signal and the resistive equalization transistor are enabled by a second clock signal which has a duration that extends longer than the first clock signal. The memory cell reading circuit decreases the "read" time required for a memory cell, as compared to reading circuits previously used.
Abstract:
A wholly integrated, multistage, CMOS voltage multiplier utilizes as a diode structure for transferring electric charge from an input node to an output node of each stage an enhancement type MOS transistor, the gate of which is coupled to the same switching phase to which the output capacitor of the stage is connected by means of a coupling capacitor. During a semicycle of charge transfer through said MOS transistor, the coupling capacitor charges through a second MOS transistor of the same type and having the same threshold of said charge transfer MOS transistor, connected in a diode configuration between the output node of the stage and the gate of the charge transfer MOS transistor, in order to cut-off the latter when reaching a voltage lower than the voltage reached by the output node by a value equal to the threshold value of said second transistor. In this way, a significant voltage drop across the charge transfer transistor is efficiently eliminated, thus allowing the generation of a sufficiently high output voltage though having available a relatively low supply voltage.
Abstract:
The present invention relates to a device for generating and regulating a gate voltage in an electrically programmable non-volatile memory with single power supply (Vcc) of the type comprising a voltage booster (15) driven by a clock signal (CK) applied to a first input terminal (16) thereof and having an output terminal (18) on which is produced a signal with higher voltage (HV). This device comprises a lower regulator block (27) and a programming switching block (68) inserted in parallel each other between said output terminal (18) of the voltage booster (15) and an output terminal (OUT) of the gate voltage generating and regulating device (14) with said lower regulator block (27) being driven by a plurality of switching signals (PROG_VER, SOFTP - , DEPL_VER, ERASE_VER) to supply on the output terminal (OUT) of the device a plurality of regulated voltages (Vxreg) and feed the control gates of the non-volatile memory cells.
Abstract:
A memory cell reading circuit has a reference cell bit line and a matrix cell bit line connected to a supply voltage through respective loads and furthermore connected by normally-off equalization transistors which are enabled by a first clock signal. The bit lines are further connected by normally-off resistive equalization transistors whose resistance is significant in conducting conditions. The equalization transistors are enabled by a first clock signal and the resistive equalization transistor are enabled by a second clock signal which has a duration that extends longer than the first clock signal. The memory cell reading circuit decreases the "read" time required for a memory cell, as compared to reading circuits previously used.