2.
    发明专利
    未知

    公开(公告)号:DE69941456D1

    公开(公告)日:2009-11-05

    申请号:DE69941456

    申请日:1999-12-31

    Abstract: This invention relates to a method of fabricating a SOI (Silicon-On-Insulator) wafer suitable to manufacture electronic semiconductor devices and including a substrate of monocrystalline silicon with a top surface, and a doped buried region in the substrate. The method comprises at least one step of forming trench-like openings extended from the substrate surface down to the buried region, and comprises: a selective etching step carried out through said openings to change said buried region of monocrystalline silicon into porous silicon; a subsequent step of oxidising the buried region that has been changed into porous silicon, to obtain an insulating portion of said SOI wafer.

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