公开(公告)号：IT1317248B1

公开(公告)日：2003-05-27

申请号：ITMI20000832

申请日：2000-04-13

Applicant: ST MICROELECTRONICS SRL

Inventor： ROCCHI ALESSANDRO ,  BISIO MARCO ,  DE SANDRE GUIDO ,  GUAITINI GIOVANNI ,  PASOTTI MARCO ,  ROLANDI PIER LUIGI

IPC: G01R31/28

Abstract: A digital device for testing and calibrating the oscillation frequency of an integrated oscillator circuit, the testing and calibrating device has as input at least first and second control parameters corresponding to limiting values of a predetermined range of values of the oscillation frequency sought for the integrated oscillator circuit, and it includes a comparison circuit for comparing a signal of known duration and a signal from the integrated oscillator circuit; a circuit connected to the comparison circuit, for generating calibration values for the signal from the integrated oscillator circuit; and a circuit for forcing storage of final calibration values of the signal from the integrated oscillator circuit into a storage and control section of the integrated oscillator circuit.

公开(公告)号：ITMI20000832A1

公开(公告)日：2001-10-15

申请号：ITMI20000832

申请日：2000-04-13

Applicant: ST MICROELECTRONICS SRL

Inventor： GUAITINI GIOVANNI ,  ROLANDI PIER LUIGI ,  ROCCHI ALESSANDRO ,  BISIO MARCO ,  DE SANDRE GUIDO ,  PASOTTI MARCO

IPC: G01R31/28

Abstract: A digital device for testing and calibrating the oscillation frequency of an integrated oscillator circuit, the testing and calibrating device has as input at least first and second control parameters corresponding to limiting values of a predetermined range of values of the oscillation frequency sought for the integrated oscillator circuit, and it includes a comparison circuit for comparing a signal of known duration and a signal from the integrated oscillator circuit; a circuit connected to the comparison circuit, for generating calibration values for the signal from the integrated oscillator circuit; and a circuit for forcing storage of final calibration values of the signal from the integrated oscillator circuit into a storage and control section of the integrated oscillator circuit.

公开(公告)号：ITMI20000832D0

公开(公告)日：2000-04-13

申请号：ITMI20000832

申请日：2000-04-13

Applicant: ST MICROELECTRONICS SRL

Inventor： GUAITINI GIOVANNI ,  ROLANDI PIER LUIGI ,  ROCCHI ALESSANDRO ,  BISIO MARCO ,  DE SANDRE GUIDO ,  PASOTTI MARCO

IPC: G01R31/28

Abstract: A digital device for testing and calibrating the oscillation frequency of an integrated oscillator circuit, the testing and calibrating device has as input at least first and second control parameters corresponding to limiting values of a predetermined range of values of the oscillation frequency sought for the integrated oscillator circuit, and it includes a comparison circuit for comparing a signal of known duration and a signal from the integrated oscillator circuit; a circuit connected to the comparison circuit, for generating calibration values for the signal from the integrated oscillator circuit; and a circuit for forcing storage of final calibration values of the signal from the integrated oscillator circuit into a storage and control section of the integrated oscillator circuit.

公开(公告)号：DE60009031D1

公开(公告)日：2004-04-22

申请号：DE60009031

申请日：2000-03-28

Applicant: ST MICROELECTRONICS SRL

Inventor： ROCCHI ALESSANDRO ,  BISIO MARCO ,  PASOTTI MARCO ,  ROLANDI PIER LUIGI

IPC: G06F12/02 ,  G06F3/06