公开(公告)号：DE602004009150D1

公开(公告)日：2007-11-08

申请号：DE602004009150

申请日：2004-02-18

Applicant: ST MICROELECTRONICS SRL ,  SGS THOMSON MICROELECTRONICS

Inventor： GARDELLA PIER LUIGI ,  BARONE MASSIMILIANO ,  SWEET GARY ,  PAU DANILO ,  HILL STEPHEN ,  GODA SIMON

IPC: H04N1/41 ,  G06T3/40 ,  G09G3/20 ,  G09G5/02 ,  H04N1/40 ,  H04N1/64 ,  H04N7/26

Abstract: A dither matrix is applied to a high-resolution image to compare the value of each of the pixels that compose it with a threshold value of the matrix and to obtain an output value of the matrix (Dither matrix value) from each comparison. To each pixel value (in_value_r) of the image there is applied the algorithm represented by the schematic layout of Figure 7 to obtain the pixel values (Out_r) of a low-resolution image. C1-C5 and n1-n10 are parameters that may be selected by means of predetermined criteria based on comparisons of the low-resolution image, obtained by means of the operations described above, with an equivalent low-resolution image obtained by means of a sample method.

公开(公告)号：AT374502T

公开(公告)日：2007-10-15

申请号：AT04425101

申请日：2004-02-18

Applicant: ST MICROELECTRONICS SRL ,  SGS THOMSON MICROELECTRONICS

Inventor： GARDELLA PIER LUIGI ,  BARONE MASSIMILIANO ,  SWEET GARY ,  PAU DANILO ,  HILL STEPHEN ,  GODA SIMON

IPC: H04N1/41 ,  G06T3/40 ,  G09G3/20 ,  G09G5/02 ,  H04N1/40 ,  H04N1/64 ,  H04N7/26

Abstract: A dither matrix is applied to a high-resolution image to compare the value of each of the pixels that compose it with a threshold value of the matrix and to obtain an output value of the matrix (Dither matrix value) from each comparison. To each pixel value (in_value_r) of the image there is applied the algorithm represented by the schematic layout of Figure 7 to obtain the pixel values (Out_r) of a low-resolution image. C1-C5 and n1-n10 are parameters that may be selected by means of predetermined criteria based on comparisons of the low-resolution image, obtained by means of the operations described above, with an equivalent low-resolution image obtained by means of a sample method.

公开(公告)号：DE60312162D1

公开(公告)日：2007-04-12

申请号：DE60312162

申请日：2003-09-11

Applicant: ST MICROELECTRONICS SRL

Inventor： POUTET BRUNO ,  BARONE MASSIMILIANO ,  GARDELLA PIER LUIGI ,  PAU DANILO

IPC: G06T9/00 ,  H04N7/26