Abstract:
An integrated device comprising a MOS transistor and a Schottky diode which are formed on a semiconductor substrate (1, 2; 1, 20) of a first conductivity type is shown. The device comprises a plurality of body region stripes (3) of a second conductivity type which are adjacent and parallel to each other, a first metal layer (12) placed over said substrate (1, 2; 1, 20) and a second metal layer placed under said substrate (1, 2; 1, 20). The device comprises a plurality of elementary structures (6, 7) parallel to each other each one of which comprises first zones provided with a silicon oxide layer (6) placed over a portion of the substrate which is comprised between two adjacent body region stripes (3), a polysilicon layer (7) superimposed to the silicon oxide layer (6), a dielectric layer (11) placed over and around the polysilicon layer (7). Some body region stripes (3) comprise source regions (10) of the first conductivity type which are placed adjacent to the first zones of the elementary structures (6, 7) to form elementary cells of said MOS transistor. The elementary structures (6, 7) and the body regions stripes (3) extend longitudinally in a transversal way to the formation of the channel in the elementary cells of the MOS transistor and the first metal layer (12) contacts the source regions (10). At least one elementary structure (6, 7) comprises at least a second zone (8) adapted to allow the direct contact between the first metal layer (12) and the underlying substrate portion (5) arranged between two adiacent body regions stripes (3) to perform the Schottky diode.
Abstract:
An integrated device comprising a MOS transistor and a Schottky diode which are formed on a semiconductor substrate (1, 2; 1, 20) of a first conductivity type is shown. The device comprises a plurality of body region stripes (3) of a second conductivity type which are adjacent and parallel to each other, a first metal layer (12) placed over said substrate (1, 2; 1, 20) and a second metal layer placed under said substrate (1, 2; 1, 20). The device comprises a plurality of elementary structures (6, 7) parallel to each other each one of which comprises first zones provided with a silicon oxide layer (6) placed over a portion of the substrate which is comprised between two adjacent body region stripes (3), a polysilicon layer (7) superimposed to the silicon oxide layer (6), a dielectric layer (11) placed over and around the polysilicon layer (7). Some body region stripes (3) comprise source regions (10) of the first conductivity type which are placed adjacent to the first zones of the elementary structures (6, 7) to form elementary cells of said MOS transistor. The elementary structures (6, 7) and the body regions stripes (3) extend longitudinally in a transversal way to the formation of the channel in the elementary cells of the MOS transistor and the first metal layer (12) contacts the source regions (10). At least one elementary structure (6, 7) comprises at least a second zone (8) adapted to allow the direct contact between the first metal layer (12) and the underlying substrate portion (5) arranged between two adiacent body regions stripes (3) to perform the Schottky diode.
Abstract:
A vertical conduction electronic power device and corresponding realisation method, the device being integrated on a semiconductor substrate (10) and comprising respective gate (20), source (25) and drain (30) areas, realised in an epitaxial layer (40) arranged on said semiconductor substrate (10) and comprising respective gate (21), source (26) and drain (31) metallisations realised by means of a first metallisation level as well as gate (60), source and drain (70) terminals or pads realised by means of a second metallisation level. The device is configured as a set of modular areas (100) extending parallel to each other, each having a rectangular elongate source area (25) perimetrically surrounded by a narrow gate area (20), and separated from each other by regions (30a) with drain area (30) extending parallel and connected at the opposite ends thereof to a second closed region (30b) with drain area (30) forming a device outer peripheral edge; as well as a sinker structure (45) extending perpendicularly to the substrate and formed by a grid of sinker (S) located below both the first parallel regions (30a) and the second closed region (30b) with drain area (30) in order to favour a conductive channel for a current coming from the source area (25) and directed towards the drain area (30) across the substrate (10).