Abstract:
A trench (5) is formed in a semiconductor body (2); the side walls and the bottom of the trench are covered with a first dielectric material layer (9); the trench (5) is filled with a second dielectric material layer (10); the first and the second dielectric material layers (9, 10) are etched via a partial, simultaneous and controlled etching such that the dielectric materials have similar etching rates; a gate-oxide layer (13) having a thickness smaller than the first dielectric material layer (9) is deposited on the walls of the trench (5); a gate region (14) of conductive material is formed within the trench (5); and body regions (7) and source regions (8) are formed within the semiconductor body (2), at the sides of and insulated from the gate region (14). Thereby, the gate region (14) extends only on top of the remaining portions of the first and second dielectric material layers (9, 10).
Abstract:
A back contacted photovoltaic cell composed of an integrated diode structure of polycrystalline silicon (briefly polysilicon) or in any case of silicon in a at least partially crystalline state, processed according to a so called thin film technology, that is not requiring the use of silicon wafer or of multi micron-thick layers of silicon wafer separated from a mother wafer, and a relative process of fabrication, are disclosed.