Abstract:
The present invention provides a transfer substrate for transferring a metal wiring material to a transfer-receiving object, the transfer substrate comprising a substrate, at least one metal wiring material formed on the substrate and an underlying metal film formed between the substrate and the metal wiring material, wherein the metal wiring material is a molded article prepared by sintering, e.g., gold powder having a purity of 99.9% by weight or more and an average particle size of 0.01 µm to 1.0 µm and the underlying metal film is composed of a metal such as gold or an alloy. The transfer substrate is capable of transferring a metal wiring material to the transfer-receiving object even at a temperature for heating the transfer-receiving object of 80 to 300°C.
Abstract:
PROBLEM TO BE SOLVED: To provide a capacitor electrode which restrains catalyst activation of catalytic metal, especially a capacitor electrode which restrains catalyst activation of a platinum group electrode constituting a lamination structure with an oxide dielectric, its precursor material and a capacitor. SOLUTION: The capacitor electrode for a semiconductor memory contains catalytic metal with catalyst activation and anticatalyst restraining catalyst activation of the catalytic metal. An electrode precursor material is used for forming the capacitor electrode and contains catalytic metal and anticatalyst in the form of combination or independently. A capacitor for a semiconductor memory is formed by using the capacitor electrode and is constituted by holding an oxide dielectric by a capacitor electrode.