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公开(公告)号：CN105890756A
公开(公告)日：2016-08-24
申请号：CN201610356985.0
申请日：2016-05-26
Applicant: 上海新产业光电技术有限公司
CPC classification number: G01J3/12 , G01J3/26 , G01J2003/1213 , G01J2003/262
Abstract: 本发明公开了一种基于旋转滤光片的单色器，包括第一分光镜、第二分光镜、第三分光镜、第一旋转滤光片、第二旋转滤光片、第三旋转滤光片、第四旋转滤光片、第一偏振分光棱镜、第二偏振分光棱镜、第三偏振分光棱镜和第四偏振分光棱镜，所述第一分光镜、第二分光镜和第三分光镜均为平面镜；所述第一分光镜置于平行光路中，第二分光镜位于第一分光镜的透射光的光路中，第三分光镜位于第一分光镜的反射光的光路中。本发明采用了旋转滤光片来实现光谱扫描，具有较高的光谱分辨率和较高的光通量；可实现可见光到红外光的宽光谱波段应用；应用灵活、并且旋转滤光片制作成本低，光学镜片更换方便，后期维护成本低。
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公开(公告)号：US20160195433A1
公开(公告)日：2016-07-07
申请号：US14986861
申请日：2016-01-04
Inventor： Tsutomu Kaneko , Manabu Kojima
CPC classification number: G01J3/18 , G01J3/0208 , G01J3/021 , G01J3/0216 , G01J3/0224 , G01J3/04 , G01J3/26 , G01J2003/262 , G02B5/3083 , G02B17/008 , G02B27/286 , G02B27/4244
Abstract: An optical device includes: a diffraction grating; a depolarization plate containing a birefringent material to eliminate polarization dependency of the diffraction grating; and an optical corrector configured to optically correct diffraction angle deviation of diffracted light due to diffraction at the diffraction grating. The optical corrector may be configured to bend back the diffracted light diffracted by the diffraction grating to re-emit the light to the diffraction grating.
Abstract translation: 光学装置包括：衍射光栅; 含有双折射材料的去极化板以消除衍射光栅的偏振依赖性; 以及光学校正器，被配置为光学校正由衍射光栅衍射引起的衍射光的衍射角偏差。 光学校正器可以被配置为将由衍射光栅衍射的衍射光弯曲回来，以将光重新发射到衍射光栅。
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公开(公告)号：US5357340A
公开(公告)日：1994-10-18
申请号：US838771
申请日：1992-03-10
Applicant: Michael Zochbauer
Inventor： Michael Zochbauer
CPC classification number: G01J3/26 , G01J2003/1269 , G01J2003/262
Abstract: The invention relates to a process for Fabry-Perot spectroscopy using a spectrometer in the radiation path of which there is a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a blend of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter F1 is set to a given value and the optical layer thickness of the second Fabry-Perot filter F2 is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector D is converted by a mathematically transformation into a spectrum as a function of wave numbers.
Abstract translation: PCT No.PCT / DE90 / 00747 Sec。 371日期：1992年3月10日 102（e）1992年3月10日PCT PCT 1990年10月1日PCT公布。 公开号WO91 / 05988 日期：1991年5月2日。本发明涉及一种法布里 - 珀罗光谱法，该方法使用辐射路径中的光谱仪，其具有辐射源，辐射通过的两个连续的法布里 - 珀罗干涉滤光器，物质的混合物 被检查和一个检测器。 将第一法布里 - 珀罗滤光器F1的光学层厚度设定为给定值，并调制第二法布里 - 珀罗滤光片F2的光学层厚度。 作为层厚度的函数的所得干涉图是待检查物质的特征。 在检测器D处接收到的干涉图被数学变换转换为作为波数的函数的频谱。
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公开(公告)号：US11965779B2
公开(公告)日：2024-04-23
申请号：US17763957
申请日：2020-10-28
Applicant: TimeGate Instruments Oy
Inventor： Lauri Kurki , Ilkka Alasaarela , Jussi Tenhunen
CPC classification number: G01J3/44 , G01J3/0208 , G01J3/0218 , G01J3/0297 , G01J3/14 , G01J3/1895 , G01J3/26 , G01J2003/262
Abstract: An apparatus for measuring time-resolved optical spectrum includes a light source, a sensor for collecting, forming, manipulating and measuring the intensity of the optical radiation, and a controller coupled to the light source and sensor. The sensor includes at least one optical delay element to provide a time delay to a first portion of the optical radiation. The sensor arrangement further includes an optical spectral disperser to split the delayed first portion and the second portion of the optical radiation into dispersed radiation having a plurality of wavelengths, and a sensor element configured to receive each wavelength of the dispersed radiation on a different spatial region, and measure the light intensity associated with each wavelength of the dispersed radiation. The controller collects the light intensity associated with each wavelength of the dispersed radiation measured by the sensor element to form a time-resolved optical spectrum.
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公开(公告)号：US20180094977A1
公开(公告)日：2018-04-05
申请号：US15718475
申请日：2017-09-28
Applicant: European Space Agency
Inventor： Matteo Taccola
CPC classification number: G01J3/26 , G01J3/021 , G01J3/0291 , G01J3/18 , G01J3/1809 , G01J3/2823 , G01J2003/262 , G02B5/1861 , G02B17/061 , G02B17/0615
Abstract: An imaging spectrometer receives a beam of light from a slit and outputs the beam of light to a focal plane. The output beam of light at the focal plane is dispersed in accordance with a spectral composition of the beam of light received from the slit. The imaging spectrometer comprises first to fourth curved reflective portions. The first to fourth curved reflective portions are arranged so that the beam of light, in its passage from the slit to the focal plane, sequentially strikes the first to fourth curved reflective portions and is reflected by the first to fourth curved reflective portions. Further, the first to fourth curved reflective portions are alternatingly concave or convex, respectively, along the passage of the beam of light. At least one of the first to fourth curved reflective portions has a reflective grating structure. Further disclosed is a method of manufacturing such imaging spectrometer.
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Patent Agency Ranking
公开(公告)号：US09863810B2
公开(公告)日：2018-01-09
申请号：US14986861
申请日：2016-01-04
Inventor： Tsutomu Kaneko , Manabu Kojima
CPC classification number: G01J3/18 , G01J3/0208 , G01J3/021 , G01J3/0216 , G01J3/0224 , G01J3/04 , G01J3/26 , G01J2003/262 , G02B5/3083 , G02B17/008 , G02B27/286 , G02B27/4244
Abstract: An optical device includes: a diffraction grating; a depolarization plate containing a birefringent material to eliminate polarization dependency of the diffraction grating; and an optical corrector configured to optically correct diffraction angle deviation of diffracted light due to diffraction at the diffraction grating. The optical corrector may be configured to bend back the diffracted light diffracted by the diffraction grating to re-emit the light to the diffraction grating.
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公开(公告)号：EP0494883A1
公开(公告)日：1992-07-22
申请号：EP90913792.0
申请日：1990-10-01
Applicant: Hartmann & Braun Aktiengesellschaft
Inventor： ZÖCHBAUER, Michael
IPC: G01J3
CPC classification number: G01J3/26 , G01J2003/1269 , G01J2003/262
Abstract: La présente invention se rapporte à un procédé pour la spectroscopie Fabry-Pérot ainsi qu'à un agencement pour la réalisation de ce procédé, comportant un spectromètre, dans le trajectoire des rayons duquel se trouvent une source de rayonnement, deux filtres d'interférence Fabry-Pérot traversés successivement par les rayons, un mélange de substance à examiner, ainsi qu'un détecteur. L'épaisseur de couche optique du premier filtre Fabry-Pérot (F1) est réglée à une valeur fixe, et l'épaisseur de couche optique du second filtre Fabry-Pérot (F2) est modulée. L'interférogramme résultant en fonction de l'épaisseur de couche est caractéristique de la substance à examiner. L'interférogramme reçu sur le détecteur (D) est converti par transformation mathématique en un spectre fonction du nombre d'ondes.
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公开(公告)号：EP0494883B1
公开(公告)日：1994-07-13
申请号：EP90913792.9
申请日：1990-10-01
Applicant: Hartmann & Braun Aktiengesellschaft
Inventor： ZÖCHBAUER, Michael
IPC: G01J3/26
CPC classification number: G01J3/26 , G01J2003/1269 , G01J2003/262
Abstract: The invention relates to a process for Fabry-Perot spectroscopy and a device for implementing it, with a spectrometer in the beam path of which there are a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a mixture of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter (F1) is set to a given value and that of the second (F2) is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector (D) is converted by mathematical transformation into a spectrum as a function of the wave number.
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公开(公告)号：WO2019055110A1
公开(公告)日：2019-03-21
申请号：PCT/US2018/041252
申请日：2018-07-09
Applicant: RAYTHEON COMPANY
Inventor： COOK, Lacy, G.
CPC classification number: G02B17/0631 , G01J3/0208 , G01J3/021 , G01J3/024 , G01J3/26 , G01J3/2823 , G01J2003/262 , G02B5/10 , G02B17/0642 , G02B17/0663
Abstract: A non-relayed reflective triplet and a double-pass imaging spectrometer including the reflective triplet configured as its objective. In one example the reflective triplet includes a primary mirror that receives and reflects electromagnetic radiation from a viewed scene and defines an optical axis of the optical system, a secondary mirror that receives and reflects the electromagnetic radiation reflected from the primary mirror, and a tertiary mirror that receives the electromagnetic radiation reflected from the secondary mirror and focuses the electromagnetic radiation onto an image plane to form an image of the viewed scene. The primary, secondary, and tertiary mirrors together are configured to form a virtual exit pupil for the optical system, the image plane being located between the tertiary mirror and the virtual exit pupil. The reflective triplet is on-axis in aperture and off-axis in field of view.
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公开(公告)号：WO1991005988A1
公开(公告)日：1991-05-02
申请号：PCT/DE1990000747
申请日：1990-10-01
Applicant: HARTMANN & BRAUN AKTIENGESELLSCHAFT , ZÖCHBAUER, Michael
Inventor： HARTMANN & BRAUN AKTIENGESELLSCHAFT
IPC: G01J03/26
CPC classification number: G01J3/26 , G01J2003/1269 , G01J2003/262
Abstract: The invention relates to a process for Fabry-Perot spectroscopy and a device for implementing it, with a spectrometer in the beam path of which there are a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a mixture of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter (F1) is set to a given value and that of the second (F2) is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector (D) is converted by mathematical transformation into a spectrum as a function of the wave number.
Abstract translation: 本发明涉及一种用于法布里 - 珀罗光谱的方法和用于实现该方法的装置，其中具有辐射源的光束路径中的光谱仪，辐射通过的两个连续的法布里 - 珀罗干涉滤光器，物质的混合物 被检查和检测器。 将第一法布里 - 珀罗滤光片（F1）的光学层厚度设定为给定值，并且调制第二（F2）的光学层厚度。 作为层厚度的函数的所得干涉图是待检查物质的特征。 在检测器（D）处接收的干涉图由数学变换转换为作为波数的函数的光谱。
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