Abstract:
An optical device includes: a diffraction grating; a depolarization plate containing a birefringent material to eliminate polarization dependency of the diffraction grating; and an optical corrector configured to optically correct diffraction angle deviation of diffracted light due to diffraction at the diffraction grating. The optical corrector may be configured to bend back the diffracted light diffracted by the diffraction grating to re-emit the light to the diffraction grating.
Abstract:
The invention relates to a process for Fabry-Perot spectroscopy using a spectrometer in the radiation path of which there is a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a blend of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter F1 is set to a given value and the optical layer thickness of the second Fabry-Perot filter F2 is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector D is converted by a mathematically transformation into a spectrum as a function of wave numbers.
Abstract:
An apparatus for measuring time-resolved optical spectrum includes a light source, a sensor for collecting, forming, manipulating and measuring the intensity of the optical radiation, and a controller coupled to the light source and sensor. The sensor includes at least one optical delay element to provide a time delay to a first portion of the optical radiation. The sensor arrangement further includes an optical spectral disperser to split the delayed first portion and the second portion of the optical radiation into dispersed radiation having a plurality of wavelengths, and a sensor element configured to receive each wavelength of the dispersed radiation on a different spatial region, and measure the light intensity associated with each wavelength of the dispersed radiation. The controller collects the light intensity associated with each wavelength of the dispersed radiation measured by the sensor element to form a time-resolved optical spectrum.
Abstract:
An imaging spectrometer receives a beam of light from a slit and outputs the beam of light to a focal plane. The output beam of light at the focal plane is dispersed in accordance with a spectral composition of the beam of light received from the slit. The imaging spectrometer comprises first to fourth curved reflective portions. The first to fourth curved reflective portions are arranged so that the beam of light, in its passage from the slit to the focal plane, sequentially strikes the first to fourth curved reflective portions and is reflected by the first to fourth curved reflective portions. Further, the first to fourth curved reflective portions are alternatingly concave or convex, respectively, along the passage of the beam of light. At least one of the first to fourth curved reflective portions has a reflective grating structure. Further disclosed is a method of manufacturing such imaging spectrometer.
Abstract:
An optical device includes: a diffraction grating; a depolarization plate containing a birefringent material to eliminate polarization dependency of the diffraction grating; and an optical corrector configured to optically correct diffraction angle deviation of diffracted light due to diffraction at the diffraction grating. The optical corrector may be configured to bend back the diffracted light diffracted by the diffraction grating to re-emit the light to the diffraction grating.
Abstract:
La présente invention se rapporte à un procédé pour la spectroscopie Fabry-Pérot ainsi qu'à un agencement pour la réalisation de ce procédé, comportant un spectromètre, dans le trajectoire des rayons duquel se trouvent une source de rayonnement, deux filtres d'interférence Fabry-Pérot traversés successivement par les rayons, un mélange de substance à examiner, ainsi qu'un détecteur. L'épaisseur de couche optique du premier filtre Fabry-Pérot (F1) est réglée à une valeur fixe, et l'épaisseur de couche optique du second filtre Fabry-Pérot (F2) est modulée. L'interférogramme résultant en fonction de l'épaisseur de couche est caractéristique de la substance à examiner. L'interférogramme reçu sur le détecteur (D) est converti par transformation mathématique en un spectre fonction du nombre d'ondes.
Abstract:
The invention relates to a process for Fabry-Perot spectroscopy and a device for implementing it, with a spectrometer in the beam path of which there are a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a mixture of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter (F1) is set to a given value and that of the second (F2) is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector (D) is converted by mathematical transformation into a spectrum as a function of the wave number.
Abstract:
A non-relayed reflective triplet and a double-pass imaging spectrometer including the reflective triplet configured as its objective. In one example the reflective triplet includes a primary mirror that receives and reflects electromagnetic radiation from a viewed scene and defines an optical axis of the optical system, a secondary mirror that receives and reflects the electromagnetic radiation reflected from the primary mirror, and a tertiary mirror that receives the electromagnetic radiation reflected from the secondary mirror and focuses the electromagnetic radiation onto an image plane to form an image of the viewed scene. The primary, secondary, and tertiary mirrors together are configured to form a virtual exit pupil for the optical system, the image plane being located between the tertiary mirror and the virtual exit pupil. The reflective triplet is on-axis in aperture and off-axis in field of view.
Abstract:
The invention relates to a process for Fabry-Perot spectroscopy and a device for implementing it, with a spectrometer in the beam path of which there are a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a mixture of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter (F1) is set to a given value and that of the second (F2) is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector (D) is converted by mathematical transformation into a spectrum as a function of the wave number.