中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

234 records (took 0.017 seconds)

    OPTICAL INTERFEROMETER
    43.
    发明公开
    OPTICAL INTERFEROMETER 审中-公开
    光学干涉仪

    公开(公告)号：EP3321650A1

    公开(公告)日：2018-05-16

    申请号：EP15897747.0

    申请日：2015-07-10

    Applicant: Hamamatsu Photonics K.K.

    Inventor： WARASHINA, Yoshihisa ,  SUZUKI, Tomofumi ,  KASAMORI, Kohei ,  OKUMURA, Ryosuke ,  KOTANI, Kyosuke

    IPC: G01J3/45 ,  G01B9/02

    CPC classification number: G01B9/02049 ,  G01B9/02015 ,  G01B9/02027 ,  G01B9/02051 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0262 ,  G01J3/45 ,  G01J3/453 ,  G01J3/4535

    Abstract: An optical interferometer 1A includes a branching-combining unit 10, a first optical system 20, a second optical system 30, and a drive unit 40, which can be MEMS-based components. The branching-combining unit 10 includes a branching surface 11, an incident surface 12, an output surface 13, and a combining surface 14 on an interface between the interior and the exterior of a transparent member. The branching-combining unit 10, on the branching surface 11, partially reflects incident light L 0 and outputs as first branched light L 11 , and transmits the rest of the incident light into the interior as second branched light L 21 . The branching-combining unit 10, on the combining surface 14, outputs the first branched light L 12 to the outside, reflects the second branched light L 22 , and combines the light beams to be output to the outside as combined light L 3 . Thus, a MEMS-based optical interferometer capable of decreasing light loss from branching to combining and improving interference efficiency is realized.

    Abstract translation: 光干涉仪1A包括分支结合单元10，第一光学系统20，第二光学系统30和驱动单元40，其可以是基于MEMS的部件。 分支结合单元10包括在透明构件的内部和外部之间的界面上的分支表面11，入射表面12，输出表面13和结合表面14。 分支结合单元10在分支表面11上部分地反射入射光L0并作为第一分支光L11输出，并将其余的入射光透射到内部作为第二分支光L21。 分支合成单元10在合成面14上向外部输出第一分支光L12，反射第二分支光L22，并将要输出到外部的光束合成为合成光L3。 因此，实现了能够减少从分支到合并并提高干扰效率的光损耗的基于MEMS的光学干涉仪。

    FOURIER TRANSFORM SPECTROPHOTOMETER
    44.
    发明公开
    FOURIER TRANSFORM SPECTROPHOTOMETER 审中-公开

    公开(公告)号：EP3285053A4

    公开(公告)日：2018-05-02

    申请号：EP15889210

    申请日：2015-04-16

    Applicant: SHIMADZU CORP

    Inventor： KAMIKAKE TADAFUMI

    IPC: G01J3/45 ,  G01J3/28 ,  G01J3/453 ,  G01N21/35

    CPC classification number: G01J3/4535 ,  G01J3/108 ,  G01J3/45 ,  G01J2003/2866 ,  G01N2021/3595

    Abstract: Disclosed is a Fourier transform spectroscope having a control interferometer capable of facilitating optical axis adjustment and miniaturization by reducing the number of optical elements. Using a first reflection mirror 131 provided with a reflection surface 131a configured to reflect measurement light emitted from a measurement light source 110 toward a beam splitter 140 and a first through-hole 131b extending along an optical axis direction of the measurement light reflected on the reflection surface 131a and a laser light source holding portion configured to hold a laser light source 120 such that laser light emitted from the laser light source 120 is incident to the beam splitter 140 through the first through-hole 131b, optical axes of the measurement light and the laser light are aligned with each other. Since a laser reflection mirror for aligning the optical axes of the measurement light and the laser light of the related art is not necessary, it is possible to reduce the number of parts and facilitate optical axis adjustment and miniaturization.

    A METHOD FOR DETERMINING THE SPECTRAL SCALE OF A SPECTROMETER AND APPARATUS
    46.
    发明公开
    A METHOD FOR DETERMINING THE SPECTRAL SCALE OF A SPECTROMETER AND APPARATUS 审中-公开
    方法用于频谱光谱仪和设备的确定比额表

    公开(公告)号：EP3161436A1

    公开(公告)日：2017-05-03

    申请号：EP15811041.1

    申请日：2015-06-29

    Applicant: Spectral Engines OY

    Inventor： ANTILA, Jarkko ,  KANTOJÄRVI, Uula ,  AKUJÄRVI, Altti ,  TUOHINIEMI, Mikko ,  MÄKYNEN, Jussi

    IPC: G01J3/26 ,  G02B26/00 ,  G02B5/28 ,  G01J3/28 ,  G02F1/21

    CPC classification number: G01J3/0297 ,  G01J3/0227 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/26 ,  G01J3/28 ,  G01J3/45 ,  G01J2003/2879 ,  G02B26/001

    Abstract: A method for determining spectral calibration data (λcal(Sd), Sd,cal(λ)) of a Fabry-Perot interferometer (100) comprises: - forming a plurality of filtered spectral peaks (P'1, P'2) by filtering input light (LB1) with a Fabry-Perot etalon (50) such that a first filtered peak (Ρ'1) corresponds to a first transmittance peak (P1) of the etalon (50), and such that a second filtered peak (P'2) corresponds to a second transmittance peak (P2) of the etalon (50), - using the Fabry-Perot interferometer (100) for measuring a spectral intensity distribution (M(Sd)) of the filtered spectral peaks (Ρ'1, P'2), wherein the spectral intensity distribution (M(Sd)) is measured by varying the mirror gap (dFP) of the Fabry-Perot interferometer (100), and by providing a control signal (Sd) indicative of the mirror gap (dFP), and - determining the spectral calibration data (λcal(Sd), Sd,cal(λ)) by matching the measured spectral intensity distribution (M(Sd)) with the spectral transmittance (ΤΕ(λ)) of the etalon (50).

    Abstract translation: 一种用于确定性采矿光谱校准数据的方法（λcal（SD），SD，CAL（λ））法布里 - 珀罗干涉仪（100）的步骤包括： - 通过过滤形成过滤谱峰的多个（P'1，P'2） 输入光（LB1）配有一个法布里 - 珀罗标准具（50）检测做了第一滤波峰（Ρ'1）对应于标准具（50）的第一透射率峰（P1），并且这样做了第二经滤波的峰值（P “2）对应于第二峰的透射率（标准具的P2）（50）， - 使用用于测量的光谱强度分布（M（SD法布里 - 珀罗干涉仪（100））的滤波谱峰）（Ρ'1 ，P'2）worin光谱强度分布（M（SD））通过改变法布里 - 珀罗干涉仪（100）的镜间隙（DFP）测量，并且通过提供控制信号（SD）表示反射镜的 间隙（DFP），以及 - 确定性采矿光谱校正数据（λcal（SD），SD，CAL（λ））通过匹配所测量的光谱强度分布（M（SD））与光谱透射率（ΤΕ（λ）） 的标准具（50）。

    IMAGING SPECTROMETER WITH EXTENDED RESOLUTION
    48.
    发明公开
    IMAGING SPECTROMETER WITH EXTENDED RESOLUTION 审中-公开
    具有增强的分辨率成像光谱仪

    公开(公告)号：EP3105559A1

    公开(公告)日：2016-12-21

    申请号：EP15719114.9

    申请日：2015-04-16

    Applicant: Raytheon Company

    Inventor： ROBINSON, Ian S. ,  BLOOMER, John D. ,  FLANDERS, Bradley

    IPC: G01J3/45 ,  G01J3/453

    CPC classification number: G01J3/4535 ,  G01J3/0202 ,  G01J3/06 ,  G01J3/45 ,  G01J2003/4538

    Abstract: Interferometric transform spectrometer (ITS) systems and methods of operation thereof. In one example, an ITS system includes a Michelson interferometer that introduces a varying optical path length difference (OPD) between its two arms so as to produce an interferogram, a detector that receives and samples the interferogram, and a scan controller coupled to the detector and to Michelson interferometer. The scan controller controls the Michelson interferometer to vary the OPD in discrete steps such that the detector provides M samples of the interferogram for each of two scan segments. In the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value. In the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value.

    OBTAINING SPECTRAL INFORMATION FROM A MOVING OBJECT
    49.
    发明公开
    OBTAINING SPECTRAL INFORMATION FROM A MOVING OBJECT 审中-公开
    AUS EINEM SICH BEWEGENDEN OBJEKT的ERHALT VON SPEKTRALEN信息

    公开(公告)号：EP3035013A1

    公开(公告)日：2016-06-22

    申请号：EP15198314.5

    申请日：2015-12-07

    Applicant: Palo Alto Research Center, Incorporated

    Inventor： HEGYI, Alex ,  MARTINI, Joerg ,  KIESEL, Peter ,  BIEGELSEN, David K.

    IPC: G01J3/45 ,  G01J3/453 ,  G01J3/02

    CPC classification number: G01J3/447 ,  G01J3/0224 ,  G01J3/0229 ,  G01J3/0289 ,  G01J3/2823 ,  G01J3/45 ,  G01J3/4531 ,  G02B5/04 ,  G02B5/3083 ,  G02B27/283 ,  G02B27/286

    Abstract: An optical device includes a waveplate sandwiched between first and second polarizers and is arranged to receive light emanating from an object or object image that is in motion relative to the optical device. A detector array includes one or more detector elements and is optically coupled to receive light from the second polarizer. Each detector element of the detector array provides an electrical output signal that varies according to intensity of the light received from the second polarizer. The intensity of the light is a function of relative motion of the object or the object image and the optical device and contains spectral information about an object point of the object.

    Abstract translation: 光学装置包括夹在第一和第二偏振器之间的波片，并且布置成接收从相对于光学装置运动的物体或物体图像发出的光。 检测器阵列包括一个或多个检测器元件，并被光耦合以接收来自第二偏振器的光。 检测器阵列的每个检测器元件提供根据从第二偏振器接收的光的强度而变化的电输出信号。 光的强度是物体或物体图像和光学装置的相对运动的函数，并且包含关于物体的物点的光谱信息。

Patent Agency Ranking