公开(公告)号：US20160187194A1

公开(公告)日：2016-06-30

申请号：US14911610

申请日：2013-10-07

Applicant: HALLIBURTON ENERGY SERVICES, INC.

Inventor： David A. Barfoot ,  Mikko Jaaskelainen

IPC: G01J1/04 ,  G01J1/44 ,  G01N21/47

CPC classification number: G01J1/0425 ,  G01J1/44 ,  G01J2001/444 ,  G01N21/47 ,  G01N21/474 ,  G01N2021/4709 ,  G01N2021/4742 ,  G01N2201/088

Abstract: A fiber optic sensor interrogation system with inbuilt passive power limiting capability that provides improved safety performance for use in explosive atmospheres.

Abstract translation: 具有内置无源功率限制功能的光纤传感器询问系统，可提供在爆炸性环境中使用的改进的安全性能。

公开(公告)号：US09332616B1

公开(公告)日：2016-05-03

申请号：US14585225

申请日：2014-12-30

Applicant: Google Inc.

Inventor： Yash Modi ,  Anthony Michael Fadell ,  Mark Rajan Malhotra ,  Shao-Po Ma

IPC: H05B37/02 ,  G01J1/44

CPC classification number: H05B37/0218 ,  G01J1/4204 ,  G01J1/44 ,  G01J2001/444 ,  H05B33/0845 ,  H05B37/0227 ,  H05B37/0281 ,  Y02B20/42 ,  Y02B20/46

Abstract: A path light that utilizes an ambient light sensor to determine the lighting conditions may experience feedback from its light source if it determines that the lighting conditions are appropriate to illuminate the path light's light source. The path light, as disclosed herein, may compute an offset value to ascertain the amount of feedback from the light source. Upon learning the offset value, the path light may subtract the offset value from a detected amount of light to determine whether the lighting conditions of its surroundings still meet a threshold level of darkness for the path light to illuminate.

Abstract translation: 利用环境光传感器来确定照明条件的路径光如果确定照明条件适合于照亮路灯的光源，则可能会经历来自其光源的反馈。 如本文所公开的路径光可以计算偏移值以确定来自光源的反馈量。 在学习偏移值时，路径光可以从检测到的光量中减去偏移值，以确定其周围环境的照明条件是否仍然满足路径光照明的阈值黑暗水平。

公开(公告)号：US09297694B2

公开(公告)日：2016-03-29

申请号：US14414718

申请日：2013-08-01

Applicant: NEC CORPORATION

Inventor： Rintaro Nomura

IPC: G01J1/18 ,  H04B10/69 ,  H03M1/10 ,  G01J1/44

CPC classification number: G01J1/18 ,  G01J1/44 ,  G01J2001/186 ,  G01J2001/444 ,  G01J2001/4466 ,  H03M1/1038 ,  H04B10/69

Abstract: The objective of the present invention is to quickly and precisely correct the measured value for light reception power to the actual value with few resources, by installing a correction device for a light reception power monitor for signal light in an optical module. The correction device is equipped with a correction table which is referenced when correcting the measured value for the light reception power of signal light, and in this correction table multiple correction values are stored in advance on the basis of the correspondence relationships between multiple reference values and multiple actual values. In the correction table, for segments wherein the change in the actual values with respect to the change in the measured values is small, the interval between the reference values is made smaller and more correction values are stored than for segments wherein the change in the actual values with respect to the change in the measured values is large. When an input value indicating the measured value for the light reception power of the signal light matches a reference value in the correction table, the correction device reads from the correction table the correction value corresponding to the reference value. When an input value does not match a reference value in the correction table, the correction device calculates a correction value in accordance with a prescribed calculation formula on the basis of the input value.

Abstract translation: 本发明的目的是通过在光学模块中安装用于信号光的光接收功率监视器的校正装置，以很少的资源将光接收功率的测量值快速和精确地校正为实际值。 校正装置配备有校正表，其在校正信号光的光接收功率的测量值时参考，并且在该校正表中，根据多个参考值与多个参考值之间的对应关系预先存储多个校正值 多个实际值。 在校正表中，对于其中实际值相对于测量值的变化的变化小的段，使参考值之间的间隔变小并且存储更多的校正值而不是实际值的变化 关于测量值的变化的值很大。 当指示信号光的光接收功率的测量值的输入值与校正表中的参考值相匹配时，校正装置从校正表读取与参考值对应的校正值。 当校正表中的输入值与参考值不匹配时，校正装置根据输入值根据规定的计算公式计算校正值。

公开(公告)号：US09277154B2

公开(公告)日：2016-03-01

申请号：US14583885

申请日：2014-12-29

Applicant: Sony Corporation

Inventor： Toshiyuki Nishihara

IPC: H04N5/335 ,  H04N5/3745 ,  H04N5/32 ,  H04N5/355 ,  H04N5/357 ,  H04N5/363 ,  H04N5/374 ,  H04N5/378 ,  G01J1/44 ,  H04N5/353

CPC classification number: H04N5/37455 ,  G01J1/44 ,  G01J2001/444 ,  H04N5/32 ,  H04N5/3355 ,  H04N5/3535 ,  H04N5/355 ,  H04N5/357 ,  H04N5/363 ,  H04N5/3742 ,  H04N5/378

Abstract: An image sensor includes a plurality of pixels, a plurality of sense circuits, and a count circuit. Each sense circuit is configured to read out electrical signals from at least one pixel associated with the sense circuit in order to generate data representing whether or not photons have been received by the sense circuit. The count circuit is in communication with a sense circuit selected from the plurality of sense circuits. The count circuit is configured to provide integration results for the pixels associated with the sense circuits based on the data received from the sense circuits.

公开(公告)号：US20160033327A1

公开(公告)日：2016-02-04

申请号：US14421581

申请日：2014-06-30

Applicant: BOE TECHNOLOGY GROUP CO., LTD. ,  BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.

Inventor： Zijin LIN ,  Haisheng ZHAO ,  Xiaoguang PEI ,  Chaoyang DENG ,  Haitao MA

IPC: G01J1/44 ,  G01N21/95

CPC classification number: G01J1/44 ,  G01J2001/444 ,  G01N21/9501 ,  G06T5/001 ,  G06T7/30 ,  G06T2207/30148

Abstract: The present disclosure relates to an image calibrating method and device of a testing apparatus for thin film transistor (TFT) substrate. The method comprises following steps of: calculating an image offset value by using coordinate information of each pixel in a prescribed target image obtained by the testing apparatus for the thin film transistor substrate; and determining whether the offset value is smaller than a prescribed threshold value, in a case where the offset value is not smaller than the prescribed threshold value, adjusting the image by using the offset value and recalculating the offset value by using the coordinate information of each pixel in the adjusted image; in a case where the offset value is smaller than the prescribed threshold value, calibrating the image obtained by the testing apparatus for the thin film transistor substrate with the offset value as a calibrating value. The calibrating efficiency and calibrating accuracy of the testing method for the thin film transistor substrate are enhanced according to the present disclosure.

Abstract translation: 本公开涉及一种用于薄膜晶体管（TFT）衬底的测试装置的图像校准方法和装置。 该方法包括以下步骤：通过使用由薄膜晶体管基板的测试装置获得的规定目标图像中的每个像素的坐标信息来计算图像偏移值; 并且在所述偏移值不小于所述规定阈值的情况下，判断所述偏移值是否小于规定的阈值，通过使用所述偏移值来调整所述图像，并且通过使用所述偏移值的坐标信息重新计算所述偏移值 调整图像中的像素; 在偏移值小于规定阈值的情况下，校正由偏移值作为校准值的薄膜晶体管基板的测试装置获得的图像。 根据本公开，增强了薄膜晶体管衬底的测试方法的校准效率和校准精度。

公开(公告)号：US20150377695A1

公开(公告)日：2015-12-31

申请号：US14314482

申请日：2014-06-25

Applicant: Ketra, Inc.

Inventor： Kuo-Lih Chang ,  Mickey Malone ,  Horace C. Ho

IPC: G01J1/02 ,  G01J1/44

CPC classification number: G01J1/0252 ,  G01J1/32 ,  G01J3/0286 ,  G01J3/465 ,  G01J3/505 ,  G01J2001/4252 ,  G01J2001/444 ,  H05B33/0827 ,  H05B33/0857 ,  H05B37/0272

Abstract: An illumination device comprises one or more emitter modules having improved thermal and electrical characteristics. According to one embodiment, each emitter module comprises a plurality of light emitting diodes (LEDs) configured for producing illumination for the illumination device, one or more photodetectors configured for detecting the illumination produced by the plurality of LEDs, a substrate upon which the plurality of LEDs and the one or more photodetectors are mounted, wherein the substrate is configured to provide a relatively high thermal impedance in the lateral direction, and a relatively low thermal impedance in the vertical direction, and a primary optics structure coupled to the substrate for encapsulating the plurality of LEDs and the one or more photodetectors within the primary optics structure.

Abstract translation: 照明装置包括具有改进的热和电特性的一个或多个发射器模块。 根据一个实施例，每个发射器模块包括被配置用于为照明装置产生照明的多个发光二极管（LED），被配置用于检测由多个LED产生的照明的一个或多个光电探测器， LED和所述一个或多个光电检测器被安装，其中所述基板被配置为在横向方向上提供相对较高的热阻抗，并且在垂直方向上提供相对低的热阻抗，以及耦合到所述基板的主要光学结构， 多个LED和主光学结构内的一个或多个光电检测器。

公开(公告)号：US20150338269A1

公开(公告)日：2015-11-26

申请号：US14284965

申请日：2014-05-22

Applicant: International Business Machines Corporation

Inventor： Matthew B. Frank ,  Raymond A. Richetta

IPC: G01J1/18 ,  G01J1/42

CPC classification number: G01J1/18 ,  G01J1/4228 ,  G01J1/44 ,  G01J2001/444 ,  G01J2001/446

Abstract: A dark photodiode that is optically isolated from the signal photodiode and having a dark current in the absence of photons. A reference generating circuit configured to produce a reference voltage based on voltage at an anode of the signal photodiode. A voltage regulator circuit configured to regulate dark photodiode voltage at an anode of the dark photodiode based on the reference voltage. A current mirror circuit configured to produce, at an anode connecting to the signal photodiode, a mirrored current that is a mirrored version of a portion of the dark current.

公开(公告)号：US20150177056A1

公开(公告)日：2015-06-25

申请号：US14575831

申请日：2014-12-18

Applicant: Jie Lian ,  Nabyl Bennouri ,  Nattapon Chaimanonart

Inventor： Jie Lian ,  Nabyl Bennouri ,  Nattapon Chaimanonart

IPC: G01J1/42 ,  G01J1/04 ,  A61B5/00 ,  G01J1/44

CPC classification number: G01J1/429 ,  A61B5/441 ,  G01J1/0219 ,  G01J1/0233 ,  G01J1/0403 ,  G01J1/44 ,  G01J2001/4266 ,  G01J2001/444 ,  G01T1/02 ,  G06F1/163

Abstract: A UV exposure dosimetry system includes at least one UV sensor that accurately measures the UV irradiance intensity. The UV dosimetry system integrates the measured UV irradiance intensity over time to calculate the real-time UV dosage and the vitamin D production by taking into account factors comprising UV sensor location, body surface area, clothing coverage, and sunscreen usage. Based on the measurement, the system can predict the time remaining to skin burn and the time remaining to reach daily goal of vitamin D production. The system also calculates the UV index in real-time, and can crowd source the measured data in a network. The UV dosimetry system supports multi-user control through an advanced and user friendly input and output interface.

Abstract translation: UV曝光剂量测定系统包括至少一个UV传感器，其精确地测量紫外线辐照强度。 UV剂量测定系统通过考虑到UV传感器位置，体表面积，衣物覆盖率和防晒霜使用量的因素，将测量的紫外线辐照度随时间整合，以计算实时紫外线剂量和维生素D的生产。 基于测量，该系统可以预测皮肤灼伤的时间和剩余的时间达到维生素D生产的每日目标。 该系统还实时计算UV指数，并可以将网络中的测量数据聚集在一起。 UV剂量测定系统通过先进且用户友好的输入和输出接口支持多用户控制。

公开(公告)号：US20150083896A1

公开(公告)日：2015-03-26

申请号：US14493219

申请日：2014-09-22

Applicant: ams AG

Inventor： Gonggui XU

IPC: G01J1/46 ,  H03M1/12 ,  H03M1/10

CPC classification number: G01J1/46 ,  G01J1/18 ,  G01J2001/444 ,  H03M1/10 ,  H03M1/12

Abstract: An optical sensor arrangement (10) comprises a light sensor (11), a current source (41), an analog-to-digital converter (12) and a switch (44) which selectively couples the light sensor (11) or the current source (41) to an input (14) of the analog-to-digital converter (12).

Abstract translation: 光学传感器装置（10）包括光传感器（11），电流源（41），模数转换器（12）和开关（44），其选择性地耦合光传感器（11）或电流 源（41）连接到模数转换器（12）的输入端（14）。

公开(公告)号：US20140367556A1

公开(公告)日：2014-12-18

申请号：US13917955

申请日：2013-06-14

Applicant: Avago Technologies General IP (Singapore) Pte. Ltd.

Inventor： Thomas Lichtenegger ,  Martin Weigert ,  Robert Swoboda

IPC: H03F3/08

CPC classification number: H03F3/08 ,  G01J1/4228 ,  G01J2001/444

Abstract: A photodetector integrated circuit (IC) having an electromagnetic interference (EMI) sensor integrated therein is provided for sensing EMI at the photodetector. Integrating the EMI sensor into the photodetector IC ensures that the EMI sensor is in proximity to the photodetector so that any EMI that is sensed is actually EMI to which the photodetector is exposed. The sensed EMI may then be used for a number of reasons, such as to determine the root cause of damage to circuitry of the system, to determine the point in time at which an EMI event occurred, or to trigger a warning when a determination is made that an EMI limit has been reached.

Abstract translation: 提供集成有电磁干扰（EMI）传感器的光电检测器集成电路（IC），用于在光电检测器处感测EMI。 将EMI传感器集成到光电检测器IC中确保EMI传感器位于光电检测器附近，使得感测到的任何EMI实际上都是光电探测器暴露于的EMI。 然后可以使用感测的EMI，例如确定系统电路损坏的根本原因，以确定EMI事件发生的时间点，或者当确定是 使得EMI达到了极限。