Abstract:
The invention is directed to a reflectance measuring apparatus having a predetermined aperture for the receiving optic. A light-conducting device arranged between the measuring aperture and the specimen enlarges the effective measuring surface of the latter so that even specimens having a large surface structure can be measured without difficulty.
Abstract:
A probe, for use with a spectrophotometer, which senses the reflectance of a sample remote from the spectrophotometer. The probe includes a housing having a probe portion positionable proximate the sample, and an integrating chamber disposed within the probe housing and having a radiation input port, a sample port for passing diffused radiation to the sample and returning reflected radiation from the sample, a reference port, and an exit port to receive radiation reflected from the sample through the sample port. The probe further includes a guide for directing radiation to the radiation input port from a radiation source, and an element, responsive to the exit port and the reference port, for selectively conveying reflected radiation from the sample and the wall of the integrating chamber in the probe to the remote spectrophotometer.
Abstract:
A spectrophotometer (10) is provided having the capability to accurately measure spectral reflectance at relatively long sample distances. A first illumination optics arrangement (14) assures uniform illumination to a portion of the sample and a second optical arrangement (20) focuses the reflected image of part of the illuminated sample onto a polychromator (22). Reference beam means are provided so that the polychromator sequentially measures the spectral characteristics of the reference beam and the sample. Continuous monitoring of the illumination at select wavelengths provides illumination normalization data so that a microprocessor (40) can normalize the illumination and compare the reference beam and sample measurements to accurately determine the spectral reflectance characteristics of the sample. Angular and raster scanning capability is also provided.
Abstract:
A lens for utilization in the radiation energy exit port of a radiation energy integrating sphere is provided, and functions to prevent instrumental specular radiation energy reflections from striking the interior wall surfaces of the sphere and being collected thereby. The instrumental specular radiation energy reflections include those from the lens, per se, and those from instrumentation disposed without the integrating sphere.
Abstract:
The holding mechanism holds an object under inspection in a manner that the substantially entire surface of the object may relatively be scanned by a laser beam. A spherical integrating light collector has an opening disposed close to the inspected surface of the object held by the holding mechanism. A laser beam illuminating mechanism is coupled with the other end of the spherical integrating light collector, and illuminates the inspected surface of the object with the laser beam through the opening. A photo-electric converter receives the scattered light as is reflected by the inspected surface and collected by the spherical integrating light collector, and converts the scattered light into an electrical signal representing an amount of light. An analog to digital converter converts the electrical signal derived from the photo-electric converter into a digital signal. A peak detector receives the digital signal derived from the analog to digital converter to detect peak values at predetermined periods. A mean value calculator calculates a mean value using a digital signal output from the analog to digital converter. A reference value storing memory stores a reference value to determine defects present on the inspected surface of the object. A threshold level calculator calculates the threshold level using the reference value and the mean value. A defect detector compares peak values derived from the peak detector with the threshold level, and detects the surface defects on the basis of the result of the comparison.
Abstract:
A water vapor distribution measurement apparatus comprises: a light source that emits near-infrared light; a near-infrared light measurement device that is located across a measurement space from the light source and that measures the near-infrared light; an optical system that expands and applies the near-infrared light emitted from the light source in the measurement space in which a cross-section of the measurement space perpendicular to a direction connecting the light source to the near-infrared light measurement device has an area; and a distribution deriving means for deriving a water vapor distribution in the cross-section of the measurement space on the basis of a measurement result obtained by the near-infrared light measurement device. Water vapor in a measurement region having a prescribed size can be measured by this water vapor distribution measurement apparatus.
Abstract:
According to an example aspect of the present invention, there is provided a sample container for use inside an optically integrating cavity, comprising an enclosing member comprised of fluorocarbon plastic, the enclosing member having diffuse transmittance of at least 80% and the sample container being adapted to contain a solid or liquid sample.
Abstract:
Provided herein is an apparatus for assessing a color characteristic of a gemstone. The apparatus comprises an optically opaque platform for supporting a sample gemstone to be assessed, a daylight-approximating light source to provide uniform illumination to the gemstone, an image capturing component, and a telecentric lens positioned to provide an image of the illuminated gemstone to the image capturing component. Also provided are methods of color analysis based on images collected using such an apparatus.
Abstract:
A fluorescence spectrophotometer includes: a light source; an excitation side spectroscope configured to separate light from the light source to generate excitation light; an integrating sphere having an inner surface configured to scatter the excitation light that has entered the integrating sphere; a sample holder, which is provided at a position on the integrating sphere that is not directly irradiated with the excitation light that has entered the integrating sphere and that is capable of being irradiated with the excitation light that has been scattered by the inner surface, and which is capable of holding a sample to be measured; a detector configured to detect fluorescent light emitted from the sample irradiated with the excitation light that has been scattered by the inner surface; and an imaging device configured to take the sample image of the sample that emits the fluorescent light.
Abstract:
The invention relates to a device (1) for the automated analysis of solids or fluids. Said device comprises a first station (5) having a metering unit (51) for the filling of at least one sample chamber (2) with a specified sample quantity, a second station (6) having at least one measurement device (61) for an analysis of the sample situated in a sample chamber (2) and a third station (7) having an emptying device and cleaning device (71, 72) for the at least one sample chamber (2). Moreover, there is provided a transport device (3) for a revolving transport of the at least one sample chamber (2) from one station to the next until the first station (5) is reached again. According to the invention, the measurement device (61) of the second station (6) is a spherical measurement system, through the interior of which it is possible to guide the at least one sample chamber (2).