Optical system with a window having a conicoidal inner surface, and testing of the optical system
    111.
    发明授权
    Optical system with a window having a conicoidal inner surface, and testing of the optical system 有权
    具有锥形内表面的窗口的光学系统和光学系统的测试

    公开(公告)号:US06180938B2

    公开(公告)日:2001-01-30

    申请号:US09187432

    申请日:1998-11-05

    CPC classification number: F42B10/46 F41G7/2253 F41G7/2293

    Abstract: An optical system includes a window made of a curved piece of a transparent material having an inner surface and an outer surface. The inner surface has a nominal inner surface shape defined by a first conicoidal relationship, and the outer surface has a nominal general aspheric surface shape. The optical system also typically includes a sensor and an optical train on the side of the inner surface of the window. The accuracy of the shape of the inner surface is tested by directing a coherent light beam through a remote focus of the inner surface, reflecting the light beam from the inner surface toward an adjacent focus of the inner surface, reflecting the light beam from a spherical reflector at the adjacent focus of the inner surface and back toward the inner surface, reflecting the light beam from the inner surface back toward the remote focus, and interferometrically comparing the reflected beam arriving at the remote focus with a reference beam.

    Abstract translation: 光学系统包括由具有内表面和外表面的透明材料的弯曲件制成的窗户。 内表面具有由第一锥形关系限定的标称内表面形状,并且外表面具有标称的一般非球面表面形状。 光学系统通常还包括在窗的内表面一侧的传感器和光学系列。 通过将相干光束引导通过内表面的远焦点来测试内表面的形状的精度,将来自内表面的光束反射到内表面的相邻焦点,将来自球形的光束 反射器在内表面的相邻焦点处并且朝向内表面反射,将来自内表面的光束反射回远焦点,并且将到达远焦点的反射光束与参考光束进行干涉比较。

    Two-dimensional beam writing position detecting device and image forming apparatus using the detecting device
    113.
    发明授权
    Two-dimensional beam writing position detecting device and image forming apparatus using the detecting device 失效
    二维光束写入位置检测装置和使用该检测装置的图像形成装置

    公开(公告)号:US06825457B2

    公开(公告)日:2004-11-30

    申请号:US10085583

    申请日:2002-03-01

    Inventor: Junshin Sakamoto

    Abstract: A two-dimensional beam writing position detecting device for providing an optical system for scanning on a photoconductor by laser beams emitted from a semiconductor laser to form an electrostatic latent image and arranging a plurality of the laser beams in two dimensions and slantingly scanning each the laser beam for forming the electrostatic latent image on the photoconductor at a predetermined angle and detecting the laser beams for determining the first writing position on the photoconductor of the laser beams is characterized in that a longitudinal direction of a beam light receiving surface of the detecting device 1 inclines at the substantially same angle as the slant scanning angle with respect to the perpendicular of a scanning direction of the plural beams.

    Abstract translation: 一种二维光束写入位置检测装置,用于提供光学系统,用于通过从半导体激光器发射的激光束在光电导体上扫描以形成静电潜像,并且在两个维度上布置多个激光束并且倾斜扫描每个激光器 用于以预定角度在感光体上形成静电潜像并检测用于确定激光束的感光体上的第一写入位置的激光束的光束的特征在于,检测装置1的光束受光面的纵向方向 相对于多个光束的扫描方向的垂直方向以与倾斜扫描角度大致相同的角倾斜。

    Apparatus for optical scanning along with measurement of optical characteristics within scanning region
    114.
    发明授权
    Apparatus for optical scanning along with measurement of optical characteristics within scanning region 失效
    用于光学扫描的装置以及扫描区域内的光学特性的测量

    公开(公告)号:US06815663B2

    公开(公告)日:2004-11-09

    申请号:US10160153

    申请日:2002-06-04

    Applicant: Takeshi Ueda

    Inventor: Takeshi Ueda

    CPC classification number: B41J2/442 G02B26/123 G02B26/127

    Abstract: A scanning type optical device comprises one optical characteristics measuring unit per color. Each optical characteristics measuring unit further includes three units. The first unit is provided on a writing start side within a scanning region, the second unit is provided on the other end side within the scanning region, and the third unit is arranged substantially at the center in the scanning region. Laser beams emitted from each of four semiconductor lasers are modulated based on signals detected by the three units in such a manner that a difference between a real image height and an ideal image height is reduced over the entire scanning region.

    Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof
    115.
    发明授权
    Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof 失效
    用于记录和读取数据的装置以及使用其接触电阻测量记录和读取数据的方法

    公开(公告)号:US06762402B2

    公开(公告)日:2004-07-13

    申请号:US09973869

    申请日:2001-10-11

    CPC classification number: G11B9/1463 B82Y10/00 G11B9/04 G11B9/14

    Abstract: An apparatus for recording and reading data by measuring contact resistance and a method for recording and reading data thereof are provided. The apparatus for recording and reading data includes a storage medium and a probe which is installed to face the storage medium and is used for recording data on the storage medium and reading the data from the storage medium. The storage medium includes a substrate, a conductive layer formed on the substrate and a dielectric layer formed on the conductive layer. With the apparatus for recording and reading data, it is possible to solve problems concerning data retention, data read speed and signal-to-noise ratio which have been at issue in developing data storage media with the use of conventional scanning probe microscopic techniques.

    Abstract translation: 提供了一种通过测量接触电阻​​来记录和读取数据的装置及其记录和读取数据的方法。 用于记录和读取数据的装置包括存储介质和探针,该存储介质和探针安装成面向存储介质,并用于在存储介质上记录数据并从存储介质读取数据。 存储介质包括基板,形成在基板上的导电层和形成在导电层上的电介质层。 利用用于记录和读取数据的装置,可以利用常规的扫描探针显微技术来解决在开发数据存储介质中已经存在的关于数据保持,数据读取速度和信噪比的问题。

    Electron beam apparatus
    116.
    发明授权
    Electron beam apparatus 有权
    电子束装置

    公开(公告)号:US06740888B2

    公开(公告)日:2004-05-25

    申请号:US10438040

    申请日:2003-05-14

    CPC classification number: H01J37/141 H01J2237/28

    Abstract: In order to ensure that an electromagnetic field lens is capable of high-resolution observation using a magnetic field lens without leakage of magnetic flux, there is provided a magnetic field superimposing-type lens 1 for focusing an electron beam onto a sample 3 so as to irradiate the sample 3 is provided with an upper magnetic pole 213 a long way from the sample 3 and a lower side magnetic pole 214 close to the sample 3, with electrical insulation being provided between the upper magnetic pole 213 and the lower magnetic pole 214 by a ferrite insulator 215 provided between the upper magnetic pole 213 and the lower magnetic pole 214 in an integral manner with the magnetic poles so that the upper magnetic pole 213 and the lower magnetic pole 214 may be held at different potentials. There is therefore no leak in flux from between the upper magnetic pole 213 and the lower-magnetic pole 214, the chromatic aberration coefficient Cc can be made small, and high-resolution observation of the sample can be achieved.

    Abstract translation: 为了确保电磁场透镜能够使用磁场透镜进行高分辨率观察而不漏磁通,设置有用于将电子束聚焦到样品3上的磁场叠加型透镜1,以便 照射样品3设置有距离样品3很远的上磁极213和靠近样品3的下侧磁极214,电绝缘通过上磁极213和下磁极214之间设置在上磁极213和下磁极214之间, 铁氧体绝缘体215以与磁极成一体的方式设置在上磁极213和下磁极214之间,使得上磁极213和下磁极214可以保持在不同的电位。 因此,在上磁极213和下磁极214之间不存在磁通泄漏,可以使色差系数Cc小,并且可以实现样品的高分辨率观察。

    Light beam scanning device for micro-area light source
    117.
    发明授权
    Light beam scanning device for micro-area light source 有权
    用于微区光源的光束扫描装置

    公开(公告)号:US06740869B2

    公开(公告)日:2004-05-25

    申请号:US09944180

    申请日:2001-09-04

    CPC classification number: G02B26/123 G06K15/1295

    Abstract: Microarea light-emitting diodes, which have no variation in light output power the like due to mode-hopping, are used and changes in properties such as light output and the like due to generated heat are prevented. Pulses having a constant period and a substantially constant power are used, a number of the pulses within a period for forming an image corresponding to one pixel is determined on the basis of image data, and light beams emitted from the microarea light-emitting diodes are modulated by pulse signals including the determined pulses.

    Abstract translation: 使用由于跳频而不具有光输出功率变化的微区域发光二极管,并且防止由于产生的热量而导致的诸如光输出等的特性的变化。 使用具有恒定周期和基本恒定功率的脉冲,基于图像数据确定用于形成对应于一个像素的图像的周期内的脉冲数,并且从微区域发光二极管发射的光束为 由包括确定的脉冲的脉冲信号进行调制。

    Aberration corrector for instrument utilizing charged-particle beam
    118.
    发明授权
    Aberration corrector for instrument utilizing charged-particle beam 有权
    使用带电粒子束的仪器畸变校正器

    公开(公告)号:US06723997B2

    公开(公告)日:2004-04-20

    申请号:US10281378

    申请日:2002-10-25

    CPC classification number: H01J37/153 G01N23/225 G21K1/087 H01J37/265 H01J37/28

    Abstract: An aberration corrector comprises four stages of electrostatic quadrupole elements, two stages of electrostatic quadrupole elements for superimposing a magnetic potential distribution analogous to the electric potential distribution created by the two central ones of the four stages of the electrostatic quadrupole elements on the electric potential distribution, an objective lens, a manual operation portion permitting a user to modify the accelerating voltage or the working distance, a power supply for supplying voltages to the four stages of electrostatic quadrupole elements, a power supply for exciting the two stages of magnetic quadrupole elements, a power supply for the objective lens, and a control portion for controlling the power supplies according to a manual operation or setting performed on the manual operation portion.

    Abstract translation: 像差校正器包括四级静电四极元件,两级静电四极元件,用于叠加与由静电四极元件四级中的两个中心的电位分布类似的电位分布,该电位分布与电位分布相同, 物镜,允许用户修改加速电压或工作距离的手动操作部分,用于向四级静电四极元件提供电压的电源,用于激励两级磁四极元件的电源, 用于物镜的电源,以及用于根据在手动操作部分执行的手动操作或设置来控制电源的控制部分。

    Near-field microscope
    119.
    发明授权
    Near-field microscope 有权
    近场显微镜

    公开(公告)号:US06710331B2

    公开(公告)日:2004-03-23

    申请号:US09986012

    申请日:2001-11-07

    CPC classification number: G01Q60/22 G01Q10/06 G01Q30/06 Y10S977/862

    Abstract: A near-field microscope comprising: a probe for scattering a near-field light; light emitting device including a light source for emitting light to a sample or said probe; and light sampling device for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising: control device for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling device; inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling device; and computing device for computing a measurement result obtained by subtracting a noise from said light intensity.

    Abstract translation: 一种近场显微镜,包括:用于散射近场光的探针; 发光器件包括用于向样品或所述探针发射光的光源; 以及用于采样和检测包括由所述探针散射的样品的信息的光的光取样装置,所述显微镜包括:用于将所述样品或探针与由所述发光产生的近场光的场隔开的控制装置, 在近场光场中的浅的位置处的样品或探针,从而通过所述光采样装置检测噪声; 将所述样品或探针深深地插入由所述发光产生的近场光的场中,从而由所述光采样装置检测光强度; 以及用于计算通过从所述光强减去噪声而获得的测量结果的计算装置。

    Light-receiving element array device and optical demultiplexer using the same
    120.
    发明授权
    Light-receiving element array device and optical demultiplexer using the same 失效
    光接收元件阵列器件和使用其的光解复用器

    公开(公告)号:US06710330B1

    公开(公告)日:2004-03-23

    申请号:US09744541

    申请日:2001-01-25

    Abstract: In the light-receiving element array device according to the present invention, a light-receiving section can be arranged at a position close to an input optical fiber so that the light-receiving element array device can be used as an optical demultiplexer based on the Littrow arrangement. Further the present invention enables suppression of coma aberration and minimization of an optical demultiplexer by shortening a length of the optical system. To achieve the above-described object, a rectangular chip having a light-receiving section with a number of light-receiving elements arrayed in row thereon is sealed in a rectangular package having external leads and the bonding pads on the chip and the bonding terminals of the packages are connected with a bonding wire or the like. This light-receiving element array device has any of the following constructions: (1) in which no bonding pad is provided along one longer edge of the chip in an area around a light-receiving section of the chip, (2) in which no bonding terminal is provided along one longer edge of the package, or (3) in which no external lead is provided along one longer edge of the package, or a combination of the constructions, and the chip is accommodated in the package at a position displaced to one side of the package.

    Abstract translation: 在根据本发明的光接收元件阵列器件中,光接收部分可以布置在靠近输入光纤的位置处,使得光接收元件阵列器件可以用作基于 Littrow安排。 此外,本发明通过缩短光学系统的长度能够抑制彗形像差和光解复用器的最小化。 为了实现上述目的,将具有多个排列在其上的光接收元件的受光部分的矩形芯片密封在具有外部引线的矩形封装中,并且芯片上的接合焊盘和接合端子 封装与接合线等连接。 该光接收元件阵列器件具有以下结构之一:(1)其中在芯片的光接收部分周围的区域中沿着芯片的一个较长边缘没有设置焊盘,(2)其中不存在 沿着封装的一个较长的边缘设置接合端子,或者(3)其中沿着封装的一个较长边缘没有设置外部引线或者这些结构的组合,并且芯片被容纳在封装中的位置处 到包装的一边。

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