Electromagnetic wave emittance-based specimen analysis

    公开(公告)号:US10761019B2

    公开(公告)日:2020-09-01

    申请号:US16248238

    申请日:2019-01-15

    Abstract: A method may include emitting a band of electromagnetic (EM) radiation towards a specimen that covers at least a first and a second wavelength of EM radiation. The method may also include receiving, at a first receiver configured to receive the first wavelength of EM radiation, responses to the EM radiation after the EM radiation interacts with the specimen; and receiving, at a second receiver configured to receive the second wavelength of EM radiation, responses to the EM radiation after the EM radiation interacts with the specimen. The method may also include extracting markers from a combination of first signals representative of the received responses at the first receiver and second signals representative of the received responses at the second receiver, the extracting including replicating and mixing the first signals and the second signals to extract the plurality of markers.

    MULTICHROMATIC CALIBRATION METHOD AND DEVICE
    134.
    发明申请

    公开(公告)号:US20200264046A1

    公开(公告)日:2020-08-20

    申请号:US16651060

    申请日:2018-09-26

    Abstract: A Multichromatic Calibration (MC) method of at least a spectral sensor which is one of a list comprising at least a spectrometer, a multispectral sensor, a hyperspectral sensor, a spectral camera, a color camera. The method comprises a. generating a plurality of different multichromatic spectra, wherein i. a spectrum from the plurality of different multichromatic spectra contains light intensity measurable by the at least one spectral sensor and by a reference spectral device, and ii. a spectrum from the plurality of different multichromatic spectra contains light centered around at least two different wavelengths and is configured to be integrated during an exposure time of a single measurement from any of the at least one spectral sensor or the reference spectral device; b. measuring each multichromatic spectrum of the plurality of different multichromatic spectra with the reference spectral device and the at least one spectral sensor; and from all data of the measured multichromatic spectra, compute a transfer function which relates a response of the at least one spectral sensor to a corresponding response of the reference spectral device, without measuring the spectral response of the at least one spectral sensor.

    System for matching coarseness appearance of coatings

    公开(公告)号:US10746376B2

    公开(公告)日:2020-08-18

    申请号:US15659430

    申请日:2017-07-25

    Abstract: Systems and method for matching appearance of a target coating on a substrate is provided herein. The system includes a coating chip including a chip coating layer. The chip coating layer has a chip coarseness. The system further includes an illumination component configured to illuminate the chip coating layer with a light having an illumination color. The chip coating layer exhibits the chip coarseness and the illumination color in the presence of the light having the illumination color. The chip coating layer exhibiting the chip coarseness and the illumination color is utilized for matching the appearance of the target coating.

    Apparatus and method for analyzing component of object, and image sensor

    公开(公告)号:US10739195B2

    公开(公告)日:2020-08-11

    申请号:US16253450

    申请日:2019-01-22

    Abstract: A method and an apparatus for analyzing a component of an object are provided. The apparatus includes an image sensor including an optical module, and the optical module includes a light source configured to emit a source light, a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident, and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object. The apparatus further includes a processor configured to calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light, and analyze the component of the object, based on the calculated scattering coefficient and the calculated absorption coefficient.

    OPTICAL APPARATUS USING REFLECTION GEOMETRY
    138.
    发明申请

    公开(公告)号:US20200240838A1

    公开(公告)日:2020-07-30

    申请号:US16668943

    申请日:2019-10-30

    Abstract: Provided is an optical apparatus using reflection geometry. The optical apparatus includes a lens element disposed to face an object to be measured, a light source generating an incident beam that passes through the lens element to be incident on the object, and a photodetector receiving light that is scattered by the object. The incident beam is obliquely incident on the object off an optical center axis of the lens element, without passing through the optical center axis. The scattered light is transmitted to the photodetector by passing through the optical center axis of the focusing lens element and a region therearound.

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