Abstract:
An apparatus for dipping a substrate includes: a body having an internal plate formed therein, and including a backing plate provided over the internal plate; a crucible accommodating an aqueous solution therein and provided over the backing plate; a crucible driving unit provided in the body and connected to the crucible to move the crucible in a horizontal direction or a vertical direction of the body; a support having a lower end to which a substrate is fixed; a support driving unit provided to an upper side of the body and connected to the support to drive the support in a length direction of the support or rotate the support in the vertical direction of the body; and a controlling unit connected to the crucible driving unit and the support driving unit to control driving of the crucible driving unit and the support driving unit.
Abstract:
Provided are an object discrimination method and an object discrimination apparatus using an ultra-low magnetic field nuclear magnetic resonance (NMR). The method includes measuring the respective spin-lattice relaxation times at a plurality of strengths of prepolarization magnetic fields with respect to a measurement target and classifying the measurement target using the spin-lattice relaxation times.
Abstract:
The present disclosure relates to an apparatus embodied in order to correct efficiently changing of measured temperature value in a temperature sensor according to influence of irradiance. A radiosonde related an exemplary embodiment of the present disclosure includes a first temperature sensor; a second temperature sensor having higher emission ratio than the first temperature sensor; and a measuring unit in order to calculate corrected temperature value, but the radiosonde and the third temperature sensor are installed in a chamber before flying of the radiosonde, a first temperature change detected by the first temperature sensor by output light in a sunlight simulator and a second temperature change detected by the second temperature sensor are induces, compensation factors may be derived using the first temperature change, the second temperature change, and temperature value measured by the third temperature sensor.
Abstract:
The present invention relates to a sensor for sensing hydrogen. The sensor of the present invention comprises: a core which reacts with hydrogen to change a resistance value; at least two electrodes connected to the core; and a variable resistor which is connected to at least one of the two electrodes and of which the resistance value changes in response to a control signal, wherein the core includes palladium having a thin film shape, and graphene which is applied on the palladium and has a thin film shape.
Abstract:
An apparatus for dipping a substrate includes: a body having an internal plate formed therein, and including a backing plate 120 provided over the internal plate; a crucible accommodating an aqueous solution therein and provided over the backing plate; a crucible driving unit provided in the body and connected to the crucible so as to move the crucible in a horizontal direction or a vertical direction of the body; a support having a lower end to which a substrate is fixed; a support driving unit provided to an upper side of the body and connected to the support so as to drive the support in a length direction of the support or rotate the support in the vertical direction of the body; and a controlling unit connected to the crucible driving unit and the support driving unit to control driving of the crucible driving unit and the support driving unit.
Abstract:
Provided is a photo active layer for a solar cell or a light emitting diode and a fabricating method thereof. The photo active layer is formed by alternately stacking silicon quantum dot layers in which a plurality of silicon quantum dots containing conductive type impurities are formed in a medium, which is a silicon compound, and conductive layers, which are polycrystalline silicon layers, containing the same conductive type impurities as those of the silicon quantum dots.
Abstract:
Disclosed herein are a monochromator and a charged particle beam apparatus including the same. The monochromator may include a first electrostatic lens configured to have a charged particle beam discharged by an emitter incident on the first electrostatic lens, refract a ray of the charged particle beam, and include a plurality of electrodes and a second electrostatic lens spaced apart from the first electrostatic lens at a specific interval and configured to have a central axis disposed identically with a central axis of the first electrostatic lens, have the charged particle beam output by the first electrostatic lens incident on the second electrostatic lens, refract the ray of the charged particle beam, and comprise a plurality of electrodes. Accordingly, there is an advantage in that a charged particle beam can have an excellent profile even after passing through the monochromator.
Abstract:
An apparatus for forming fine patterns by employing polarization interference in a laser scanning method comprises a laser generator; a calcite wave plate configured to refract at least one of the S wave and the P wave, polarized by the polarization plate, an analyzer configured to make coincident with each other the polarization directions of the S wave and the P wave having the paths spaced apart from each other by the calcite wave plate; an exposure lens; an exposure head; an X stage; and a rotation stage configured to move the substrate mounting unit around a Z axis which is a vertical axis.
Abstract:
Disclosed herein are a monochromator and a charged particle beam apparatus including the same. The monochromator may include a first electrostatic lens configured to have a charged particle beam discharged by an emitter incident on the first electrostatic lens, refract a ray of the charged particle beam, and include a plurality of electrodes and a second electrostatic lens spaced apart from the first electrostatic lens at a specific interval and configured to have a central axis disposed identically with a central axis of the first electrostatic lens, have the charged particle beam output by the first electrostatic lens incident on the second electrostatic lens, refract the ray of the charged particle beam, and comprise a plurality of electrodes. Accordingly, there is an advantage in that a charged particle beam can have an excellent profile even after passing through the monochromator.
Abstract:
The present invention relates to a technology for measuring a nonlinear parameter of an object to be measured, and more particularly, to an apparatus and method for measuring a nonlinear parameter of an object to be measured.