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    APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX
    141.
    发明申请
    APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX 有权
    用于测量总LUMINOUS FLUX的装置和方法

    公开(公告)号：US20100296082A1

    公开(公告)日：2010-11-25

    申请号：US12779045

    申请日：2010-05-13

    Applicant: Kazuaki OHKUBO ,  Shunsuke Mishima

    Inventor： Kazuaki OHKUBO ,  Shunsuke Mishima

    IPC: G01J1/02

    CPC classification number: G01J1/02 ,  G01J1/0219 ,  G01J1/0223 ,  G01J1/04 ,  G01J1/0403 ,  G01J1/0448 ,  G01J2001/0481

    Abstract: In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured.

    Abstract translation: 在根据实施例的总光通量测量装置中，当在物体和积分单元之间提供相对运动以基本上整个光线曝光时，基于使用测量单元测量照度的结果来计算由物体发射的总光束 将物体的表面发射到积分单元的内部空间。 具体地说，在物体被设置成从一个样品孔穿透到另一个样品孔的条件下，测量在积分单元的内部空间内的物体的一部分的光通量，然后移动积分单元 并且测量相应地包含在积分单元的内部空间中的部分的光通量。

    Optical Emission Spectroscopic (OES) Instrument with Automatic Top and Bottom Slit Curtains
    142.
    发明申请
    Optical Emission Spectroscopic (OES) Instrument with Automatic Top and Bottom Slit Curtains 有权
    具有自动顶部和底部狭缝窗的光发射光谱仪（OES）仪器

    公开(公告)号：US20100284003A1

    公开(公告)日：2010-11-11

    申请号：US12771846

    申请日：2010-04-30

    Applicant: Mark A. Hamilton

    Inventor： Mark A. Hamilton

    IPC: G01J3/02

    CPC classification number: G01J3/0229 ,  G01J1/02 ,  G01J1/0266 ,  G01J1/04 ,  G01J1/0403 ,  G01J1/0437 ,  G01J1/0448 ,  G01J3/443

    Abstract: An optical emission spectroscopic (OES) instrument includes a spectrometer, a processor and an adjustable mask controlled by the processor. The adjustable mask defines a portion of an analytical gap imaged by the spectrometer. The instrument automatically adjusts the size and position of an opening in the mask, so the spectrometer images an optimal portion of plasma formed in the analytical gap, thereby improving signal and noise characteristics of the instrument, without requiring tedious and time-consuming manual adjustment of the mask during manufacture or use.

    Abstract translation: 光发射光谱（OES）仪器包括光谱仪，处理器和由处理器控制的可调掩模。 可调节掩模定义了由光谱仪成像的分析间隙的一部分。 仪器自动调整面罩开口的尺寸和位置，因此光谱仪将分析间隙中形成的等离子体的最佳部分图像化，从而提高仪器的信号和噪声特性，而不需要繁琐乏味的手动调节 面具在制造或使用过程中。

    MEASURING DEVICE FOR MEASURING A FOCUSED LASER BEAM
    143.
    发明申请
    MEASURING DEVICE FOR MEASURING A FOCUSED LASER BEAM 有权
    用于测量聚焦激光束的测量装置

    公开(公告)号：US20100253937A1

    公开(公告)日：2010-10-07

    申请号：US12677776

    申请日：2008-09-12

    Applicant: Bernd Zerl ,  Olaf Kittelmann

    Inventor： Bernd Zerl ,  Olaf Kittelmann

    IPC: G01J1/42

    CPC classification number: G01J1/4257 ,  G01J1/04 ,  G01J1/0411 ,  G01J1/0448

    Abstract: According to an embodiment, a measuring device for measuring a laser beam comprises a magnification lens system with a total of two lenses which are arranged in series in the beam path of the laser beam and whose foci are coinciding, as well as a camera which is arranged behind the two lenses in the focus of the last lens and includes an electronic image sensor which generates an electronic image of the magnified laser beam. The lenses together with the camera are adjustable along the beam path relative to a reference point of the measuring device, for the purpose of locating the beam waist of the laser beam and of determining a diameter profile of the laser beam. The measuring device further comprises an adapter enclosing the beam path for coupling the measuring device to a laser system which provides the laser beam. The adapter forms an abutment surface or the laser system, which is axially directed with respect to a beam axis of the laser beam, and permits the measuring device to be coupled in situ at the installation site of the laser system.

    Abstract translation: 根据实施例，用于测量激光束的测量装置包括具有总共两个透镜的放大透镜系统，该透镜系统在激光束的光束路径中串联布置并且其焦点重合，以及相机 布置在最后一个镜头的焦点上的两个透镜后面，并且包括产生放大激光束的电子图像的电子图像传感器。 镜头与照相机相对于测量装置的参考点沿光束路径是可调节的，以便定位激光束的光束腰部并确定激光束的直径轮廓。 测量装置还包括封闭光束路径的适配器，用于将测量装置耦合到提供激光束的激光系统。 适配器形成邻接表面或激光系统，其相对于激光束的光束轴线轴向指向，并且允许测量装置在激光系统的安装位置处原位耦合。

    DISPLACEMENT SENSOR
    144.
    发明申请
    DISPLACEMENT SENSOR 有权
    位移传感器

    公开(公告)号：US20100171955A1

    公开(公告)日：2010-07-08

    申请号：US12646577

    申请日：2009-12-23

    Applicant: Takahiro SUGA ,  Hiroaki Takimasa

    Inventor： Takahiro SUGA ,  Hiroaki Takimasa

    IPC: G01B11/14 ,  G01J4/00

    CPC classification number: G01B11/026 ,  G01J1/0242 ,  G01J1/0448

    Abstract: This invention provides a displacement measurement device, a displacement measurement method, and a thickness measurement device capable of easily ensuring a conjugate relationship between the light source and the diaphragm and capable of accurately measuring the change in distance with the testing target. In the displacement measurement device, the light from the laser diode is collected towards the pin hole of the diaphragm plate at the collective lens, and then sent to the objective lens through the pin hole. The light is reflected at a surface of work, and detected by a photodiode through the objective lens, the pin hole, the collective lens, and the half mirror. That is, the pin hole becomes a substantial light source, and becomes a diaphragm with respect to the incident light on the work. The spot diameter collected on the pin hole by the collective lens is greater than the diameter of the pin hole. The light receiving quantity signal of the return light component on a diaphragm plate, shown with an outlined arrow, is removed by a high-pass filter.

    Abstract translation: 本发明提供一种位移测量装置，位移测量方法和厚度测量装置，其能够容易地确保光源和隔膜之间的共轭关系，并能够精确地测量与测试目标的距离变化。 在位移测量装置中，来自激光二极管的光被聚集在聚光透镜的光阑板的针孔上，然后通过针孔被发送到物镜。 光在工件表面反射，并通过物镜，针孔，集体透镜和半反射镜由光电二极管检测。 也就是说，针孔成为实质的光源，并且相对于工件上的入射光成为隔膜。 通过集体透镜收集在针孔上的光斑直径大于针孔的直径。 通过高通滤波器去除用箭头所示的隔膜板上的返回光分量的光接收量信号。

    Optical sensor with rotary shaft-driven light intercepting member
    150.
    发明授权
    Optical sensor with rotary shaft-driven light intercepting member 有权
    具有旋转轴驱动遮光构件的光学传感器

    公开(公告)号：US07402792B2

    公开(公告)日：2008-07-22

    申请号：US11430012

    申请日：2006-05-09

    Applicant: Katsunori Michiyama ,  Takeshi Tsukamoto

    Inventor： Katsunori Michiyama ,  Takeshi Tsukamoto

    IPC: G01D5/34

    CPC classification number: G01J1/22 ,  G01J1/04 ,  G01J1/0403 ,  G01J1/0418 ,  G01J1/0437 ,  G01J1/044 ,  G01J1/0448 ,  G01J1/0462

    Abstract: An optical sensor includes a light receiving device disposed in a housing, an exterior filter rotatably mounted to an attachment surface of the housing, and a light intercepting member which rotates along with a rotation of the exterior filter to adjust an amount of light incident on a light receiving surface of the light receiving device. In this optical sensor, the light intercepting member has a rotary shaft fixed at its center, and has a light adjusting mechanism for adjusting the amount of light incident on the light receiving surface of the light receiving device in a range in a direction of rotation around the rotary shaft. Accordingly, the sensitivity of the optical sensor can be arbitrarily adjusted with a high accuracy.

    Abstract translation: 光学传感器包括设置在壳体中的光接收装置，可旋转地安装到壳体的附接表面的外部过滤器，以及与外部过滤器的旋转一起旋转的遮光部件，以调节入射到外壳 光接收装置的光接收表面。 在这种光学传感器中，遮光构件具有固定在其中心的旋转轴，并且具有调光机构，用于调节在光接收装置的光接收表面上的光量在旋转方向周围的范围内 旋转轴。 因此，可以高精度地任意调整光学传感器的灵敏度。

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