Light-operated control device
    141.
    发明授权
    Light-operated control device 失效
    光操作控制装置

    公开(公告)号:US3679906A

    公开(公告)日:1972-07-25

    申请号:US3679906D

    申请日:1970-03-25

    Applicant: XERCON INC

    Inventor: MYERS CLIFFORD E

    Abstract: A light-operated control device including a spherical housing mounted on a second housing for universal swiveling movement relative thereto. An arm extending out from the second housing overlies the sphere and is clamped thereagainst to secure the sphere in any selected position. A photocell mounted in the sphere has a light-sensitive side which faces out through an aperture in a side of the sphere. A light-channeling passage having deflector surfaces along its sides extends between the aperture and the light-sensitive side of the photocell. This passage inhibits ambient light from striking the photocell. The photocell is connected to control circuitry in the second housing by elongated flexible conductors which permit free swiveling of the sphere.

    Abstract translation: 一种光操作控制装置,包括安装在第二壳体上的球形壳体,用于相对于其进行通用的旋转运动。 从第二壳体延伸出的臂覆盖在球体上并且被夹紧在其上以将球体固定在任何选定的位置。 安装在球体中的光电管具有通过球体侧面的孔面向外的感光侧。 具有沿其侧面的偏转器表面的光通道通道在光电孔的光圈和光敏侧之间延伸。 该通道阻止环境光照射光电池。 光电管通过允许球体自由旋转的细长柔性导体连接到第二壳体中的控制电路。

    Optical measurement system, optical measurement method, and mirror plate for optical measurement system
    145.
    发明授权
    Optical measurement system, optical measurement method, and mirror plate for optical measurement system 有权
    光学测量系统,光学测量方法和光学测量系统的镜面板

    公开(公告)号:US09239259B2

    公开(公告)日:2016-01-19

    申请号:US14000872

    申请日:2011-10-13

    Abstract: An optical measurement system includes an integrating sphere having a reflecting surface on its inner wall and having a first window. The optical measurement system further includes a support member for supporting a light source at a substantially central position of the integrating sphere, and a first baffle arranged on a line connecting the first window and the light source supported by the support member. The support member is connected, in a region opposite to the first window with respect to the light source, to the inner wall of the integrating sphere.

    Abstract translation: 光学测量系统包括积分球,其在其内壁上具有反射表面并且具有第一窗口。 光学测量系统还包括用于将光源支撑在积分球的大致中心位置处的支撑构件和布置在连接由支撑构件支撑的第一窗口和光源的线路上的第一挡板。 支撑构件在与第一窗口相对于光源相对的区域中连接到积分球的内壁。

    Optical measuring system and optical measuring device thereof
    147.
    发明授权
    Optical measuring system and optical measuring device thereof 有权
    光学测量系统及其光学测量装置

    公开(公告)号:US09127979B2

    公开(公告)日:2015-09-08

    申请号:US14026947

    申请日:2013-09-13

    Abstract: An optical measuring device includes a case, a reflective layer and a light collecting lens module. A measuring chamber and a channel, which is connected to the measuring chamber and is connected to an opening of the case, reside in the case. The reflective layer is disposed onto an inner surface of the measuring chamber. The light collecting lens module is located inside the channel. A light beam emits into the channel of the optical measuring device through an opening, passes through the light collecting lens module and enters the measuring chamber afterward.

    Abstract translation: 光学测量装置包括壳体,反射层和聚光透镜模块。 连接到测量室并连接到壳体的开口的测量室和通道驻留在壳体中。 反射层设置在测量室的内表面上。 光收集透镜模块位于通道内。 光束通过开口发射到光学测量装置的通道中,然后通过聚光透镜模块并进入测量室。

    Systems and methods for simultaneous optical testing of a plurality of devices under test
    149.
    发明授权
    Systems and methods for simultaneous optical testing of a plurality of devices under test 有权
    用于同时光学测试多个待测设备的系统和方法

    公开(公告)号:US08823406B2

    公开(公告)日:2014-09-02

    申请号:US13275107

    申请日:2011-10-17

    Abstract: Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.

    Abstract translation: 用于同时光学测试多个待测设备的系统和方法。 这些系统和方法可以包括使用光学探针组件,该光学探针组件包括电源结构,该电源结构被配置为向被测试的多个被测设备(DUT)提供电流,以及配置成同时收集电磁辐射的光学收集结构 其可以由多个DUT产生并且将收集的电磁辐射提供给一个或多个光学检测装置。 所述系统和方法还可以包括在光学探针系统中使用光学探针组件来评估多个DUT中的每一个的一个或多个性能参数。

    DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP
    150.
    发明申请
    DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP 审中-公开
    用于发光二极管芯片的检测装置

    公开(公告)号:US20140159733A1

    公开(公告)日:2014-06-12

    申请号:US13836493

    申请日:2013-03-15

    Abstract: A detection apparatus for light-emitting diode chip comprising a light-collecting apparatus having an opening, a bracing component and a probing device is disclosed. The bracing component is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two flexible current-transporting elements. The two ends of the current-transporting elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Besides, the detection apparatus for light-emitting diode chip of the present invention further comprises a thimble to push the light-emitting diode chip into the inside of the light-collecting apparatus via the opening such that the light beams emitted by the light-emitting diode chip are collected by the light-collecting apparatus.

    Abstract translation: 公开了一种发光二极管芯片的检测装置,其包括具有开口的光收集装置,支撑部件和探测装置。 支撑部件被设计成承载至少一个发光二极管芯片。 探测装置包括电源和至少两个柔性电流传输元件。 电流传输元件的两端分别电连接到发光二极管芯片和电源,以使得发光二极管芯片能够发射光束。 此外,本发明的发光二极管芯片的检测装置还包括通过开口将发光二极管芯片推入集光装置的内部的套管,使得由发光二极管芯片发出的光束 二极管芯片由光收集装置收集。

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