Abstract:
A light-operated control device including a spherical housing mounted on a second housing for universal swiveling movement relative thereto. An arm extending out from the second housing overlies the sphere and is clamped thereagainst to secure the sphere in any selected position. A photocell mounted in the sphere has a light-sensitive side which faces out through an aperture in a side of the sphere. A light-channeling passage having deflector surfaces along its sides extends between the aperture and the light-sensitive side of the photocell. This passage inhibits ambient light from striking the photocell. The photocell is connected to control circuitry in the second housing by elongated flexible conductors which permit free swiveling of the sphere.
Abstract:
A differential goniophotometer includes: an integrating sphere including an interior bounded by an interior wall and that receives, in the interior, a primary light source that provides primary light; and a fisheye lens disposed in the interior of the integrating sphere in optical communication with the primary light source such that the fisheye lens: receives the primary light from the primary light source, and provides a curvilinear image of the interior of the integrating sphere and the primary light.
Abstract:
A photoreceiver device includes a light detector connected between a power supply node and a first node, and first to third switching elements. The light detector is configured to detect an incident optical data signal, and to output photocurrent corresponding to a magnitude of the optical data signal through the first node. The first switching element is connected between the first node and a ground node. The second switching element is connected between the power supply node and a second node. The third switching element is connected between the second node and the ground node. The third switching element has a control node connected to the first node.
Abstract:
An optical measurement system includes an integrating sphere having a reflecting surface on its inner wall and having a first window. The optical measurement system further includes a support member for supporting a light source at a substantially central position of the integrating sphere, and a first baffle arranged on a line connecting the first window and the light source supported by the support member. The support member is connected, in a region opposite to the first window with respect to the light source, to the inner wall of the integrating sphere.
Abstract:
A void-arranged structure that includes a pair of principal surfaces opposing each other and a plurality of void sections that penetrate through the pair of principal surfaces. The void-arranged structure is configured of a plurality of unit structures each of which includes a first void section and a second void section having a different shape from a shape of the first void section, and the overall shape of the unit structure, when the principal surface is viewed from above, is not mirror-symmetric with respect to a predetermined imaginary plane orthogonal to the principal surface of the void-arranged structure.
Abstract:
An optical measuring device includes a case, a reflective layer and a light collecting lens module. A measuring chamber and a channel, which is connected to the measuring chamber and is connected to an opening of the case, reside in the case. The reflective layer is disposed onto an inner surface of the measuring chamber. The light collecting lens module is located inside the channel. A light beam emits into the channel of the optical measuring device through an opening, passes through the light collecting lens module and enters the measuring chamber afterward.
Abstract:
A lighting dome that can be used to inspect semiconductor wafers can include a small aperture, backlighting, a reflectance gradient and/or a broad spectrum light source.
Abstract:
Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.
Abstract:
A detection apparatus for light-emitting diode chip comprising a light-collecting apparatus having an opening, a bracing component and a probing device is disclosed. The bracing component is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two flexible current-transporting elements. The two ends of the current-transporting elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Besides, the detection apparatus for light-emitting diode chip of the present invention further comprises a thimble to push the light-emitting diode chip into the inside of the light-collecting apparatus via the opening such that the light beams emitted by the light-emitting diode chip are collected by the light-collecting apparatus.