-
公开(公告)号:US11950882B2
公开(公告)日:2024-04-09
申请号:US18069791
申请日:2022-12-21
Applicant: ILLUMISONICS INC.
Inventor: Parsin Haji Reza , Kevan Bell
CPC classification number: A61B5/0095 , A61B1/00004 , A61B1/00172 , A61B1/0615 , A61B5/0035 , A61B5/14532 , A61B5/14542 , G01N21/1702 , G01N21/64 , A61B1/00117 , A61B5/02042 , G01N2021/1706 , G01N2201/0683 , G01N2201/08
Abstract: A photoacoustic remote sensing system for imaging a subsurface structure in a sample, comprising exactly one laser source configured to generate a pulsed or intensity-modulated excitation beam configured to generate ultrasonic pressure signals in the sample at an excitation location, and an interrogation beam incident on the sample at the excitation location, a portion of the interrogation beam returning from the sample that is indicative of the generated ultrasonic pressure signals, an optical system configured to focus the excitation beam and the interrogation beam below a surface of the sample, a detector configured to detect the returning portion of the interrogation beam, and a processor configured to calculate an image of the sample based on a detected intensity modulation of the returning portion of the interrogation beam from below the surface of the sample.
-
公开(公告)号:US11815466B2
公开(公告)日:2023-11-14
申请号:US17367790
申请日:2021-07-06
Inventor: Qi Lang , Jinbo Jiang , Changli Wu
IPC: G01N21/88 , G02B27/00 , G02B3/02 , G02B3/14 , G02F1/1335 , G02B27/10 , G02B5/18 , G01N21/95 , G02F1/13363
CPC classification number: G01N21/8806 , G01N21/95 , G02B3/02 , G02B3/14 , G02B5/1876 , G02B27/0025 , G02B27/1013 , G02F1/13363 , G02F1/133528 , G01N2021/9513 , G01N2201/063 , G01N2201/0683
Abstract: A display inspection system for inspecting a light beam emitted from a panel with pixels positioned at several focal planes is provided. The display inspection system includes a focus tunable lens adjustable in a focal distance for focusing at the panel, a first sensing unit for receiving the light beam, a reduced aberration optical system arranged between the focus tunable lens and the first sensing unit for focusing at the first sensing unit, and one or more optical elements placed within a back focal length of the reduced aberration optical system. The reduced aberration optical system comprises a first serial cascade lens group of a first aplanatic lens and a first doublet lens for correcting an optical aberration. The first aplanatic lens and the first doublet lens are co-configured that the back focal length is extended in a manner that the light beam is incident to the first sensing unit.
-
公开(公告)号:US11781982B2
公开(公告)日:2023-10-10
申请号:US17380883
申请日:2021-07-20
Applicant: K Sciences GP, LLC
Inventor: Valentin Korman
IPC: G01N21/359 , G01N33/49 , G01N21/3577 , A61B5/145 , A61B5/1455 , A61B5/00 , G01N21/21
CPC classification number: G01N21/359 , A61B5/1455 , A61B5/14532 , A61B5/14558 , A61B5/6815 , G01N21/21 , G01N21/3577 , G01N33/49 , A61B5/7225 , A61B2560/0443 , A61B2562/0238 , G01N2201/062 , G01N2201/0683
Abstract: A glucose sensor comprising an optical energy source having an emitter with an emission pattern; a first polarizer intersecting the emission pattern; a second polarizer spaced a distance from the first polarizer and intersecting the emission pattern, the second polarizer rotated relative to the first polarizer by a first rotational amount Θ; a first optical detector intersecting the emission pattern; a second optical detector positioned proximal to the second polarizer, the first polarizer and the second polarizer being positioned between the optical energy source and the second optical detector, the second optical detector intersecting the emission pattern; a compensating circuit coupled to the second optical detector; and a subtractor circuit coupled to the compensating circuit and the first optical detector.
-
公开(公告)号:US20190259147A1
公开(公告)日:2019-08-22
申请号:US15902076
申请日:2018-02-22
Applicant: The Boeing Company
Inventor: Jeffrey H. Hunt
CPC classification number: G01N21/94 , G01N21/8806 , G01N2021/8472 , G01N2021/8845 , G01N2021/8848 , G01N2201/0683
Abstract: An active real-time characterization system for identifying the presence of surface contaminants on to an outer surface of an article under test. Infrared and visible light sources controllably output a beam of coherent light directed at a particular area on the article under test, the infrared light source having an optical parametric oscillator coupled to an optical parametric amplifier. A series of cameras, including a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, a sum-frequency camera and a third-order camera each include an associated filter system and are each configured to receive return beams of light at predetermined frequencies controlled by the filter system. A processor determines whether the received signals have a spectral response that is different from a baseline spectral response thereby indicating that contaminants exist on the surface of the article under test.
-
145.
公开(公告)号:US20190212253A1
公开(公告)日:2019-07-11
申请号:US16243780
申请日:2019-01-09
Applicant: Shahid Abbas HAIDER , Alexander Sheung Lai WONG , Farnoud KAZEMZADEH
Inventor: Shahid Abbas HAIDER , Alexander Sheung Lai WONG , Farnoud KAZEMZADEH
IPC: G01N21/21
CPC classification number: G01N21/21 , G01N2201/0683
Abstract: There is disclosed a system and method for measuring the polarization of light which utilizes a spatially-varying polarization beam. This measurement is analyzed and improved using novel imaging methods and image processing methods on a digital signal processing (DSP) system to determine the polarization of light. Various embodiments are described which can measure light polarization, determine polarizing material distributions, determine the optical rotary dispersion of samples, and determine the circular dichroism of samples. In certain embodiments, the binding constants and binding activity of molecular samples can be achieved. Given its reduced complexity and size, the system may be configured to be portable such that the system may be used in various applications outside of a lab setting.
-
146.
公开(公告)号:US20190204217A1
公开(公告)日:2019-07-04
申请号:US15858609
申请日:2017-12-29
Applicant: Palo Alto Research Center Incorporated
Inventor: Alex Hegyi
CPC classification number: G01N21/45 , G01J3/2823 , G01J3/4531 , G01J3/4537 , G01N21/21 , G01N2201/0683 , G02F1/1393
Abstract: A voltage is applied to a liquid-crystal variable retarder that monotonically changes a retardance and changes a first derivative with respect to time of the retardance of the liquid-crystal variable retarder over a time period. An interferogram of light passing through the liquid-crystal variable retarder is measured during the time period.
-
公开(公告)号:US20190120773A1
公开(公告)日:2019-04-25
申请号:US16216389
申请日:2018-12-11
Applicant: Samsung Display Co., Ltd.
Inventor: Jin SEO , Yong Jun PARK , Jong Soo LEE
CPC classification number: G01N21/9505 , G01N21/21 , G01N2021/216 , G01N2021/8477 , G01N2201/0683
Abstract: A method of evaluating crystallinity includes irradiating light from below a polycrystalline silicon substrate, allowing the irradiated light to pass through the polycrystalline silicon substrate and a circular polarizing plate disposed above the polycrystalline silicon substrate, measuring an intensity of light having passed through the circular polarizing plate at a location vertically above the circular polarizing plate, notifying that there is an error in a crystallinity of the polycrystalline silicon substrate when the measured intensity of the light is out of an error margin of a predetermined criterion intensity of light.
-
公开(公告)号:US20180348122A1
公开(公告)日:2018-12-06
申请号:US16031026
申请日:2018-07-10
Applicant: K Sciences GP, LLC
Inventor: Valentin Korman
IPC: G01N21/359 , G01N33/49 , G01N21/3577 , A61B5/145
CPC classification number: G01N21/359 , A61B5/14532 , A61B5/1455 , A61B5/14558 , A61B5/6815 , A61B5/7225 , A61B2560/0443 , A61B2562/0238 , G01N21/21 , G01N21/3577 , G01N33/49 , G01N2201/062 , G01N2201/0683
Abstract: A glucose sensor comprising an optical energy source having an emitter with an emission pattern; a first polarizer intersecting the emission pattern; a second polarizer spaced a distance from the first polarizer and intersecting the emission pattern, the second polarizer rotated relative to the first polarizer by a first rotational amount Θ; a first optical detector intersecting the emission pattern; a second optical detector positioned proximal to the second polarizer, the first polarizer and the second polarizer being positioned between the optical energy source and the second optical detector, the second optical detector intersecting the emission pattern; a compensating circuit coupled to the second optical detector; and a subtractor circuit coupled to the compensating circuit and the first optical detector.
-
公开(公告)号:US20180299252A1
公开(公告)日:2018-10-18
申请号:US16013664
申请日:2018-06-20
Applicant: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
Inventor: Yoel Arieli , Yoel Cohen
CPC classification number: G01B9/02091 , G01B9/02019 , G01J3/0208 , G01J3/0224 , G01J3/447 , G01J3/453 , G01N21/31 , G01N2201/0636 , G01N2201/0683
Abstract: Apparatus and methods are described including a line spectrometer that receives a point of light. The line spectrometer includes a first optical element, and a second optical element configured to convert the point of light to a line of light and to direct the line of light toward the first optical element. The first optical element defines first and second surfaces, a distance between the first and second surface varying as a function of distance along the first optical element, the first optical element thereby being configured to generate first and second reflected lines of light that reflect respectively from the first and second surfaces. A detector array receives the first and second lines of light, and generates an interferogram in response thereto. A computer processor determines a spectrum of the point of light, by analyzing the interferogram. Other applications are also described.
-
公开(公告)号:US20180233872A1
公开(公告)日:2018-08-16
申请号:US15948141
申请日:2018-04-09
Applicant: KLA-Tencor Corporation
Inventor: Yung-Ho Chuang , J. Joseph Armstrong , Justin Dianhuan Liou , Vladimir Dribinski , David L. Brown
CPC classification number: H01S3/0057 , G01N21/21 , G01N21/9501 , G01N2201/06113 , G01N2201/0683 , G01N2201/0697 , G02B5/0816 , G02B5/3083 , G02B27/281 , G02B27/283 , G02B27/286 , H01S3/083
Abstract: A pulse multiplier includes a polarizing beam splitter, a wave plate, and a set of multi-surface reflecting components (e.g., one or more etalons and one or more mirrors). The polarizing beam splitter passes input laser pulses through the wave plate to the multi-surface reflecting components, which reflect portions of each input laser pulse back through the wave plate to the polarizing beam splitter. The polarizing beam splitter reflects each reflected portion to form an output of the pulse multiplier. The multi-surface reflecting components are configured such that the output pulses exiting the pulse multiplier have an output repetition pulse frequency rate that is at least double the input repetition pulse frequency.
-
-
-
-
-
-
-
-
-