ACTIVE REAL-TIME CHARACTERIZATION SYSTEM FOR IDENTIFYING SURFACE CONTAMINATION

    公开(公告)号:US20190259147A1

    公开(公告)日:2019-08-22

    申请号:US15902076

    申请日:2018-02-22

    Inventor: Jeffrey H. Hunt

    Abstract: An active real-time characterization system for identifying the presence of surface contaminants on to an outer surface of an article under test. Infrared and visible light sources controllably output a beam of coherent light directed at a particular area on the article under test, the infrared light source having an optical parametric oscillator coupled to an optical parametric amplifier. A series of cameras, including a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, a sum-frequency camera and a third-order camera each include an associated filter system and are each configured to receive return beams of light at predetermined frequencies controlled by the filter system. A processor determines whether the received signals have a spectral response that is different from a baseline spectral response thereby indicating that contaminants exist on the surface of the article under test.

    SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT

    公开(公告)号:US20180299252A1

    公开(公告)日:2018-10-18

    申请号:US16013664

    申请日:2018-06-20

    Abstract: Apparatus and methods are described including a line spectrometer that receives a point of light. The line spectrometer includes a first optical element, and a second optical element configured to convert the point of light to a line of light and to direct the line of light toward the first optical element. The first optical element defines first and second surfaces, a distance between the first and second surface varying as a function of distance along the first optical element, the first optical element thereby being configured to generate first and second reflected lines of light that reflect respectively from the first and second surfaces. A detector array receives the first and second lines of light, and generates an interferogram in response thereto. A computer processor determines a spectrum of the point of light, by analyzing the interferogram. Other applications are also described.

Patent Agency Ranking