公开(公告)号：US20160266110A1

公开(公告)日：2016-09-15

申请号：US15019942

申请日：2016-02-09

Applicant: Washington University

Inventor： Sahin Kaya Ozdemir ,  Lan Yang

IPC: G01N33/543 ,  G01N15/14 ,  G01N21/45

CPC classification number: G01N33/54373 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/1463 ,  G01N21/21 ,  G01N21/45 ,  G01N21/7746 ,  G01N2015/0038 ,  G01N2015/1454 ,  G01N2021/458 ,  G01N2201/06113 ,  G01N2201/0683 ,  G01N2201/08

Abstract: A micro-resonator and fiber taper based sensing system, which uses mode splitting or frequency shift methods and polarization measurements for particle sensing.

Abstract translation: 基于微谐振器和基于光纤锥度的感测系统，其使用模式分割或频移方法和用于粒子感测的偏振测量。

公开(公告)号：US20160265029A1

公开(公告)日：2016-09-15

申请号：US15036398

申请日：2014-11-07

Applicant: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH

Inventor： Jackie Y. YING ,  Saravana Kumar KUMARASAMY

IPC: C12Q1/68 ,  G01N21/25 ,  G01N21/78

CPC classification number: C12Q1/686 ,  B01L7/52 ,  B01L2200/026 ,  B01L2200/147 ,  B01L2300/023 ,  B01L2300/024 ,  B01L2300/0829 ,  B01L2300/1822 ,  G01N21/251 ,  G01N21/253 ,  G01N21/78 ,  G01N2201/062 ,  G01N2201/0638 ,  G01N2201/0683

Abstract: A colorimetric-based DNA diagnostic system which includes a detector module, a processor and a memory is provided. The detector module is disposed to record an image of a DNA sample illuminated by a light source. The memory includes computer program code which along with the memory is configured, with the processor, to perform (a) sending a signal to adjust the temperature of the DNA sample to be within an approximate temperature range over which the color of the DNA sample changes, (b) sending a signal to the detector module to capture an image of the DNA sample at defined intervals within the approximate temperature range, (c) processing the captured images to extract color information, and (d) processing the extracted color information to objectively determine a melting temperature within the approximate temperature range at which the color of the DNA sample changes.

Abstract translation: 提供了一种基于比色的DNA诊断系统，其包括检测器模块，处理器和存储器。 检测器模块设置成记录由光源照射的DNA样品的图像。 存储器包括计算机程序代码，其与存储器一起配置处理器，以执行（a）发送信号以将DNA样本的温度调节到DNA样本的颜色变化的近似温度范围内 （b）向检测器模块发送信号以在大致温度范围内以规定的间隔捕获DNA样品的图像，（c）处理所捕获的图像以提取颜色信息，以及（d）将所提取的颜色信息处理为 客观地确定在DNA样品的颜色变化的近似温度范围内的熔融温度。

公开(公告)号：US20160258949A1

公开(公告)日：2016-09-08

申请号：US15028370

申请日：2014-10-09

Applicant: UNIVERSITY OF ROCHESTER ,  THE UAB RESEARCH FOUNDATION

Inventor： Benjamin L. MILLER ,  Moon H. NAHM

IPC: G01N33/569 ,  G01N21/55 ,  G01N21/21

CPC classification number: G01N33/56944 ,  G01N21/211 ,  G01N21/55 ,  G01N33/54373 ,  G01N2201/06113 ,  G01N2201/0683 ,  G01N2333/3156

Abstract: According to aspects illustrated herein, there are provided a sensor chip suitable for serological detection of Streptococcus pneumoniae, a method for detecting serotypes of Streptococcus pneumoniae using the sensor chip, a detection system that includes the sensor chip, and a method for detecting serotypes of Streptococcus pneumoniae using the detection system described herein.

Abstract translation: 根据本文所述的方面，提供了适用于肺炎链球菌血清学检测的传感器芯片，使用传感器芯片检测肺炎链球菌血清型的方法，包括传感器芯片的检测系统和检测链球菌血清型的方法 使用本文所述的检测系统。

公开(公告)号：US20160258879A1

公开(公告)日：2016-09-08

申请号：US15058115

申请日：2016-03-01

Applicant: KLA-Tencor Corporation

Inventor： Ardis Liang ,  Martin Plihal ,  Raghav Babulnath ,  Sankar Venkataraman

IPC: G01N21/88 ,  G01N23/20 ,  G01N21/95

CPC classification number: G01N21/8806 ,  G01N21/9501 ,  G01N23/20008 ,  G01N2021/8809 ,  G01N2201/061 ,  G01N2201/0683

Abstract: Methods and systems for generating inspection results for a specimen with an adaptive nuisance filter are provided. One method includes selecting a portion of events detected during inspection of a specimen having values for at least one feature of the events that are closer to at least one value of at least one parameter of the nuisance filter than the values for at least one feature of another portion of the events. The method also includes acquiring output of an output acquisition subsystem for the sample of events, classifying the events in the sample based on the acquired output, and determining if one or more parameters of the nuisance filter should be modified based on results of the classifying. The nuisance filter or the modified nuisance filter can then be applied to results of the inspection of the specimen to generate final inspection results for the specimen.

Abstract translation: 提供了一种用于产生具有自适应扰动滤波器的样本检测结果的方法和系统。 一种方法包括选择在样本检查期间检测到的事件的一部分，该样本具有关于事件的至少一个特征的值，该值至少与有害过滤器的至少一个参数的值相比， 另一部分事件。 该方法还包括获取用于事件采样的输出采集子系统的输出，基于所获取的输出对样本中的事件进行分类，以及基于分类结果确定是否应该修改妨扰滤波器的一个或多个参数。 然后可以将妨扰过滤器或修改后的滋扰过滤器应用于样品的检查结果，以产生样品的最终检验结果。

公开(公告)号：US20160252449A1

公开(公告)日：2016-09-01

申请号：US14423382

申请日：2014-03-07

Applicant: HALLIBURTON ENERGY SERVICES, INC.

Inventor： James M. Price ,  David L. Perkins

IPC: G01N21/31

CPC classification number: G01N21/31 ,  G01J3/0224 ,  G01J3/12 ,  G01J3/42 ,  G01J3/433 ,  G01N21/21 ,  G01N21/39 ,  G01N2201/0683

Abstract: Multivariate optical computing using polarizers to modulate the intensity of sample-interacted light. The polarizer(s), along with other device components, produce a spectroscopic intensity profile that mimics the regression vector that corresponds to the sample characteristic(s) of interest.

Abstract translation: 使用偏振器的多变量光学计算来调制样品相互作用光的强度。 偏振器与其它器件组件一起产生光谱强度分布，其模拟对应于感兴趣的样本特征的回归矢量。

公开(公告)号：US20160233116A1

公开(公告)日：2016-08-11

申请号：US15093424

申请日：2016-04-07

Applicant: COHERENT LASERSYSTEMS GMBH & CO. KG

Inventor： Paul VAN DER WILT

IPC: H01L21/67 ,  G01N21/21 ,  G01N21/47 ,  G02B21/00 ,  G01N21/95 ,  G01N21/84

CPC classification number: H01L21/67253 ,  C30B1/02 ,  C30B29/06 ,  G01N21/21 ,  G01N21/4788 ,  G01N21/8422 ,  G01N21/8851 ,  G01N21/9501 ,  G01N2021/8461 ,  G01N2021/8477 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/105 ,  G02B21/002 ,  G02B21/0092 ,  H01L21/02532 ,  H01L21/02686 ,  H01L21/268 ,  H01L22/12

Abstract: A method is disclosed evaluating a silicon layer crystallized by irradiation with pulses form an excimer-laser. The crystallization produces periodic features on the crystallized layer dependent on the number of and energy density ED in the pulses to which the layer has been exposed. An area of the layer is illuminated with light. A microscope image of the illuminated area is made from light diffracted from the illuminated are by the periodic features. The microscope image includes corresponding periodic features. The ED is determined from a measure of the contrast of the periodic features in the microscope image.

Abstract translation: 公开了评估通过用脉冲照射形成准分子激光而结晶的硅层的方法。 结晶层上产生周期性特征，取决于层暴露于的脉冲中的数量和能量密度ED。 该层的一个区域用光照亮。 照明区域的显微镜图像由从被照明的周期特征衍射的光制成。 显微镜图像包括相应的周期特征。 ED是从显微镜图像中的周期特征的对比度的量度确定的。

公开(公告)号：US20160223458A1

公开(公告)日：2016-08-04

申请号：US15095724

申请日：2016-04-11

Applicant: DEKA Products Limited Partnership

Inventor： Jacob W. Scarpaci ,  Jason M. Sachs ,  Simon C. Helmore

IPC: G01N21/21 ,  A61M1/14

CPC classification number: G01N21/21 ,  A61M1/14 ,  G01J4/04 ,  G01N21/90 ,  G01N2201/0612 ,  G01N2201/0683

Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/−45 degrees relative to the first and second light source polarization axes.

公开(公告)号：US20160216217A1

公开(公告)日：2016-07-28

申请号：US15088673

申请日：2016-04-01

Applicant: Hitachi High-Technologies Corporation

Inventor： Toshifumi Honda ,  Yuta Urano ,  Takahiro Jingu ,  Akira Hamamatsu

IPC: G01N21/95 ,  G01N21/956

CPC classification number: G01N21/8806 ,  G01J1/0474 ,  G01J1/44 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/12

Abstract: To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

公开(公告)号：US20160187262A1

公开(公告)日：2016-06-30

申请号：US14746427

申请日：2015-06-22

Applicant: Samsung Display Co., Ltd.

Inventor： Wal jun KIM ,  JoongYoung RYU ,  Seung-Young BAECK ,  Changhyun RYU ,  Deok joo LIM

IPC: G01N21/88 ,  G01N21/84 ,  G01N21/95

CPC classification number: G01N21/8806 ,  G01N21/8422 ,  G01N21/95 ,  G01N2021/8427 ,  G01N2021/8848 ,  G01N2201/0683

Abstract: An inspection device of a display device includes a first illumination unit providing a first incident light to the display device at a first incident angle, a second illumination unit providing a second incident light to the display device at a second incident angle, a third illumination unit providing a third incident light to the display device at a third incident angle, and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device.

Abstract translation: 显示装置的检查装置包括以第一入射角向显示装置提供第一入射光的第一照明单元，以第二入射角向显示装置提供第二入射光的第二照明单元，第三照明单元 以第三入射角向显示装置提供第三入射光;以及缺陷检测器，其接收从第一反射角度的由显示装置反射的第一入射光获得的第一反射光中的至少一个，获得的第二反射光 从显示装置以第二反射角反射的第二入射光和由第三反射角反射的第三入射光获得的第三反射光，以检测显示装置的缺陷。

公开(公告)号：US09335276B2

公开(公告)日：2016-05-10

申请号：US14195656

申请日：2014-03-03

Applicant: Coherent LaserSystems GmbH & Co. KG

Inventor： Paul Van Der Wilt

IPC: H01L21/268 ,  G01N21/95 ,  H01L21/66 ,  G01N21/84 ,  G01N21/88 ,  G02B21/00 ,  G01N21/47 ,  H01L21/02

CPC classification number: H01L21/67253 ,  C30B1/02 ,  C30B29/06 ,  G01N21/21 ,  G01N21/4788 ,  G01N21/8422 ,  G01N21/8851 ,  G01N21/9501 ,  G01N2021/8461 ,  G01N2021/8477 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/105 ,  G02B21/002 ,  G02B21/0092 ,  H01L21/02532 ,  H01L21/02686 ,  H01L21/268 ,  H01L22/12

Abstract: A method is disclosed evaluating a silicon layer crystallized by irradiation with pulses form an excimer-laser. The crystallization produces periodic features on the crystallized layer dependent on the number of and energy density ED in the pulses to which the layer has been exposed. An area of the layer is illuminated with light. A microscope image of the illuminated area is made from light diffracted from the illuminated are by the periodic features. The microscope image includes corresponding periodic features. The ED is determined from a measure of the contrast of the periodic features in the microscope image.

Abstract translation: 公开了评估通过用脉冲照射形成准分子激光而结晶的硅层的方法。 结晶层上产生周期性特征，取决于层暴露于的脉冲中的数量和能量密度ED。 该层的一个区域用光照亮。 照明区域的显微镜图像由从被照明的周期特征衍射的光制成。 显微镜图像包括相应的周期特征。 ED是从显微镜图像中的周期特征的对比度的量度确定的。