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公开(公告)号：US11002665B2
公开(公告)日：2021-05-11
申请号：US16465824
申请日：2017-11-29
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US10809184B1
公开(公告)日：2020-10-20
申请号：US16366982
申请日：2019-03-27
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Mustafa Kansiz
Abstract: Properties of a sample that are dependent upon wavelength, such as IR absorption, can be detected and deconstructed into wavelets or other basis functions. These basis functions can be compared to determine which have a relatively high likelihood of being noise or signal, and an attenuation factor can be applied to each wavelet. A spectrum can be reconstructed from these wavelets that exhibits a significantly higher signal-to-noise ratio than raw data co-adding would produce in significantly less measurement time.
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公开(公告)号：US12276603B2
公开(公告)日：2025-04-15
申请号：US18452023
申请日：2023-08-18
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , David Grigg , Derek Decker
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号：US12140475B2
公开(公告)日：2024-11-12
申请号：US18311748
申请日：2023-05-03
Applicant: Photothermal Spectroscopy Corp.
Inventor： Derek Decker , Craig Prater
Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
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15.发明公开公开(公告)号：US20240280477A1
公开(公告)日：2024-08-22
申请号：US18171161
申请日：2023-02-17
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller
IPC: G01N21/35 , G06T5/50 , G06V10/141 , H04N23/20
CPC classification number: G01N21/35 , G06T5/50 , G06V10/141 , H04N23/20 , G06T2207/10024 , G06T2207/10048 , G06T2207/20221
Abstract: Methods described herein provide improvements on composite infrared absorption imaging. Scanning patterns described herein reduce erroneous measurements caused by thermal drift, as well as optical interference that occurs between light scattering from the top surface of the sample and light scattering from an underlying substrate.
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Patent Agency Ranking
公开(公告)号：US12066328B2
公开(公告)日：2024-08-20
申请号：US17955122
申请日：2022-09-28
Applicant: Photothermal Spectroscopy Corp.
Inventor： Derek Decker , Craig Prater
CPC classification number: G01J3/0297 , G01J3/0216 , G01J3/0229 , G01J3/108 , G01J2003/102
Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
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17.发明公开公开(公告)号：US20240110872A1
公开(公告)日：2024-04-04
申请号：US18538506
申请日：2023-12-13
Applicant: PHOTOTHERMAL SPECTROSCOPY CORP.
Inventor： Craig Prater
IPC: G01N21/64 , G01J3/02 , G01N21/3563 , G01N21/359
CPC classification number: G01N21/645 , G01J3/0227 , G01N21/3563 , G01N21/359 , G01N21/6428 , G01N21/6456 , G01N2021/3595 , G01N2021/6471
Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.
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公开(公告)号：US20220065772A1
公开(公告)日：2022-03-03
申请号：US17316453
申请日：2021-05-10
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US20210215601A1
公开(公告)日：2021-07-15
申请号：US17250124
申请日：2019-05-31
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Derek Decker , Roshan Shetty
IPC: G01N21/3563 , H04N5/235 , G06T7/00 , G02B21/36 , G02B21/06
Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
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公开(公告)号：US10942116B2
公开(公告)日：2021-03-09
申请号：US16155089
申请日：2018-10-09
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
IPC: G01N21/35 , G01N21/65 , G01N21/59 , H01J37/26 , G01N23/20091 , G01N23/207 , G01N21/552 , G01N21/17 , G01N21/3563 , H01J49/26 , G01N21/47 , G01N21/64
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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