公开(公告)号：US20060187453A1

公开(公告)日：2006-08-24

申请号：US11241827

申请日：2005-09-30

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01B11/00

CPC classification number: G01N21/55 ,  G01N21/8806

Abstract: A device for examining the optical properties of surfaces includes a first radiation source which emits radiation to an examination surface, at least one first detector device, for detecting the radiation reflected off the surface and emitting at least one signal that is characteristic of at least one parameter of the detected radiation, wherein the detector device includes a plurality of image capturing components arranged in a specified detection area and wherein a control is provided for compensating signal changes caused by a shift of the location where the reflected radiation is incident on the detection area.

公开(公告)号：US09581546B2

公开(公告)日：2017-02-28

申请号：US13538284

申请日：2012-06-29

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: H04N7/18 ,  G01N21/47 ,  G01N21/55 ,  G01N21/88 ,  G01N21/17

CPC classification number: G01N21/474 ,  G01N21/55 ,  G01N21/8806 ,  G01N2021/1765

Abstract: Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.

Abstract translation: 照射装置以相对于要被研究的表面上的表面的预定入射角照射辐射，并且由该表面散射和/或反射的辐射到达布置在预定位置的辐射检测器装置 相对于表面的检测角度并具有记录黑白图像的图像记录单元，其中该放射线检测器装置允许对到达其的辐射的空间分辨检测。 照射装置将第一波长范围的辐射引导到表面上，并且图像记录单元记录从表面散射和/或反射的该辐射的第一空间分辨图像，并且照射装置将第二波长范围内的辐射引导到表面上 并且图像记录单元记录从表面散射和/或反射的该辐射的第二空间分辨图像。

公开(公告)号：US08355141B2

公开(公告)日：2013-01-15

申请号：US12833709

申请日：2010-07-09

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01B11/24

CPC classification number: G01N21/898 ,  G01J3/50

Abstract: A method for optical investigation of textured surfaces involves the steps of irradiation of radiation onto the surface to be investigated; reception of an image from at least part of the radiation irradiated onto the surface and reflected by the surface; location-resolved evaluation of the image recorded and determination of at least one value K which is characteristic of this image. A parameter G which is characteristic of the surface is determined while using the characteristic value K and while using at least one further property E known beforehand or determined of the surface.

Abstract translation: 纹理表面的光学研究方法涉及将辐射照射到待研究的表面上的步骤; 从辐射到表面上并被表面反射的辐射的至少一部分接收图像; 记录的图像的位置解析评价和作为该图像的特征的至少一个值K的确定。 在使用特征值K的同时，使用预先知道或确定的表面的至少一个其他性质E来确定表面特性的参数G。

公开(公告)号：US08102530B2

公开(公告)日：2012-01-24

申请号：US12267301

申请日：2008-11-07

Applicant: Uwe Sperling ,  Peter Schwarz

Inventor： Uwe Sperling ,  Peter Schwarz

IPC: G01J3/50

CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/0297 ,  G01J3/52 ,  G01J3/524

Abstract: A colour measuring unit (1) comprising a radiation device (2) which emits light onto a surface (9) to be examined, wherein the radiation device (2) comprises at least one semiconductor-based light source (6), and a radiation detector device (12) which receives at least a portion of the light scattered by the surface and outputs a signal characteristic of this light, wherein the radiation detector device (12) allows a spectral analysis of the light impinging thereon. According to the invention, the colour measuring unit comprises at least one sensor device (10) which determines at least one electrical parameter of the light source (6), and also a processor device (14) which outputs from this measured parameter at least one value characteristic of the light emitted by the radiation device (2).

Abstract translation: 一种颜色测量单元（1），包括在待检查的表面（9）上发射光的辐射装置（2），其中所述辐射装置（2）包括至少一个基于半导体的光源（6）和辐射 检测器装置（12），其接收由表面散射的光的至少一部分，并输出该光的特征信号，其中，辐射检测器装置（12）允许对其上的光的光谱分析。 根据本发明，颜色测量单元包括至少一个确定光源（6）的至少一个电参数的传感器装置（10），以及一个处理器装置（14），该装置从该测量参数输出至少一个 由辐射装置（2）发射的光的特性值。

公开(公告)号：US20080073603A1

公开(公告)日：2008-03-27

申请号：US11859673

申请日：2007-09-21

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01N21/17

CPC classification number: G01N21/55 ,  G01N21/4738 ,  G01N21/474 ,  G01N2021/4754

Abstract: An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analysed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analysed, a first radiation detector device (8) which receives at least part of the radiation thrown back from the surface (9) to be analysed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device (10, 11) is provided which is at least partially illuminated by the first illumination device (6, 7) and which transmits scattered radiation onto the surface (9) to be analysed.

Abstract translation: 一种用于分析表面特性的装置（1），包括：第一辐射装置（4），其将辐射直接发射到待分析的表面（9）上;第一照明装置（6,7），用于将表面（9）间接照射到 分析第一辐射检测器装置（8），其接收从待分析的表面（9）向后抛射的至少一部分辐射，并且输出至少一个是该辐射部分特征的信号。 根据本发明，提供了辐射散射装置（10,11），其至少部分地被第一照明装置（6,7）照射，并且将散射的辐射传播到待分析的表面（9）上。

公开(公告)号：US07184147B2

公开(公告)日：2007-02-27

申请号：US10880361

申请日：2004-06-29

Applicant: Uwe Sperling

Inventor： Uwe Sperling

IPC: G01N21/55 ,  G01N21/00

CPC classification number: G01N21/8806 ,  G01N21/474

Abstract: A device for determining the properties of surfaces having at least one first radiation means having a least one radiation source which emits radiation, at least one radiation detector means which captures at least a portion of the radiation emmitting from the at least one radiation source and then diffused and/or reflected off a measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, an optical divider means having a specified thickness positioned in the optical path between the radiation means and the radiation detector means. The optical divider means includes at least one aperture extending at least in sections at a specified angle different from 0 degrees to the thickness of said optical divider means.

Abstract translation: 用于确定具有至少一个具有发射辐射的至少一个辐射源的第一辐射装置的表面的性质的装置，至少一个辐射检测器装置，其捕获从所述至少一个辐射源发出的辐射的至少一部分，然后 扩散和/或从测量表面反射并且发射至少一个作为反射和/或扩散辐射的特征的测量信号;具有定位在辐射装置和辐射检测器装置之间的光路中的指定厚度的分光装置 。 光分路器装置包括至少一个孔，至少以与所述光分路器装置的厚度成0度的规定角度分段延伸。

公开(公告)号：US20060119854A1

公开(公告)日：2006-06-08

申请号：US11230316

申请日：2005-09-19

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01N21/47

CPC classification number: G01N21/57

Abstract: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

公开(公告)号：US07006229B2

公开(公告)日：2006-02-28

申请号：US10267578

申请日：2002-10-09

Applicant: Uwe Sperling ,  Peter Schwarz

Inventor： Uwe Sperling ,  Peter Schwarz

IPC: G01N21/55

CPC classification number: G01N21/474 ,  G01J3/10 ,  G01N21/57 ,  G01N21/8806

Abstract: Illuminating means for illuminating a measurement surface and device for determining the properties of reflective objects. The illuminating means comprises a radiating means having radiation sources, an aperture means and a scattering means. The scattering means is arranged in the path of radiation and the light emitted by the sources of radiation is directable to the aperture means. The device comprises an illuminating means as a first optical means which radiates light onto a measurement surface. Said first optical means has a radiating means comprising radiation sources, an aperture means and a scattering means arranged in the path of radiation. The light emitted by the sources of radiation is directable to the aperture means. A second optical means is configured as detector means and registers the light reflected from the measurement surface. Said detector means outputs a measurement value which is characteristic for at least a portion of the light as received. A memory means is furthermore provided and a control means serves for the controlling of the measurement sequence, wherein a characteristic parameter which characterizes the measurement surface is determined.

公开(公告)号：US20060033922A1

公开(公告)日：2006-02-16

申请号：US11187694

申请日：2005-07-22

Applicant: Uwe Sperling ,  Peter Schwarz

Inventor： Uwe Sperling ,  Peter Schwarz

IPC: G01N21/47

CPC classification number: G01N21/57 ,  G01J3/504 ,  G01N2021/575

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device emitting radiation to a surface to be examined at least at a first predetermined spatial angle, at least one first detector for capturing the radiation emitted to and reflected back from the surface, wherein the detector, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface. At least one spatial angle at which the radiation device and/or the detector are positioned, is variable and the radiation device and the detector are positioned in a space at least part of which exhibits light-reflecting properties.

Abstract translation: 用于检查表面的光学特性的装置包括至少一个第一辐射装置，至少以第一预定空间角发射到待检测表面的辐射，至少一个第一检测器，用于捕获从表面发射并从表面反射的辐射 ，其中允许检测到的辐射的局部分辨率的所述检测器相对于所述表面至少位于第二预定空间角度。 辐射装置和/或检测器所在的至少一个空间角度是可变的，并且辐射装置和检测器被定位在其至少一部分呈现光反射性质的空间中。

公开(公告)号：US5917183A

公开(公告)日：1999-06-29

申请号：US809373

申请日：1997-05-27

Applicant: Uwe Sperling

Inventor： Uwe Sperling

IPC: G01J1/42 ,  H01L31/10 ,  H01L33/00 ,  H01S5/068 ,  H01J7/24

CPC classification number: G01J1/42 ,  H01L33/0095

Abstract: The proposed method of temperature compensation for opto-electronic devices, more specifically opto-electronic semiconductor devices, involves operation of the device under predetermined constant conditions, where a first temperature dependent characteristic value is measured which is then compared with a comparison value determined under identical constant conditions but at a different temperature. A correction function is derived from the relationship between the characteristic value and the comparison value and used to correct the measured value obtained from the semiconductor device so as to compensate for the effect of temperature.

Abstract translation: PCT No.PCT / EP95 / 03784 Sec。 371日期：1997年5月27日 102（e）日期1997年5月27日PCT提交1995年9月24日PCT公布。 WO96 / 09667 PCT出版物 日期：1996年3月28日光电子器件，特别是光电子半导体器件的温度补偿方法，涉及在预定的恒定条件下操作器件，其中测量第一温度依赖特性值，然后将其与 在相同恒定条件下但在不同温度下测定比较值。 根据特征值与比较值之间的关系导出校正函数，并用于校正从半导体器件获得的测量值，以补偿温度的影响。