Abstract:
Methods and systems are provided which include configurations for the reassigning unit locations of a classification matrix at which two or more classification regions overlap as non-classification regions. In addition, methods and systems are provided which include configurations for mathematically creating classification regions which may be characterized by values which more accurately correspond to measured values of particles. Other embodiments of methods and systems include configurations for acquiring data corresponding to measurable parameters of a particle and identifying a location within a classification matrix to which at least some of the data corresponds. Such methods and systems further include configurations for translating either the data corresponding to the identified unit location or a target space located at known locations within the classification matrix a preset number of predetermined coordinate paths until a conclusion that the particle may be classified to particular particle category or a reject class is attained.
Abstract:
Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.
Abstract:
Methods, storage mediums, and systems for image data processing are provided. Embodiments for the methods, storage mediums, and systems include configurations to perform one or more of the following steps: background signal measurement, particle identification using classification dye emission and cluster rejection, inter-image alignment, inter-image particle correlation, fluorescence integration of reporter emission, and image plane normalization.
Abstract:
Methods, storage mediums, and systems for image data processing are provided. Embodiments for the methods, storage mediums, and systems include configurations to perform one or more of the following steps: background signal measurement, particle identification using classification dye emission and cluster rejection, inter-image alignment, inter-image particle correlation, fluorescence integration of reporter emission, and image plane normalization.
Abstract:
Methods and systems are provided which include configurations for the reassigning unit locations of a classification matrix at which two or more classification regions overlap as non-classification regions. In addition, methods and systems are provided which include configurations for mathematically creating classification regions which may be characterized by values which more accurately correspond to measured values of particles. Other embodiments of methods and systems include configurations for acquiring data corresponding to measurable parameters of a particle and identifying a location within a classification matrix to which at least some of the data corresponds. Such methods and systems further include configurations for translating either the data corresponding to the identified unit location or a target space located at known locations within the classification matrix a preset number of predetermined coordinate paths until a conclusion that the particle may be classified to particular particle category or a reject class is attained.
Abstract:
Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.
Abstract:
Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.
Abstract:
Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.
Abstract:
Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
Abstract:
Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.