公开(公告)号：US07145146B2

公开(公告)日：2006-12-05

申请号：US10788275

申请日：2004-03-01

Applicant: Taro Ogawa ,  Toshiki Sugawara ,  Kazuhiko Hosomi ,  Masataka Shirai ,  Toshio Katsuyama ,  Kaoru Umemura ,  Masaru Izawa ,  Kazuhiko Sagara ,  Hiroshi Kakibayashi

Inventor： Taro Ogawa ,  Toshiki Sugawara ,  Kazuhiko Hosomi ,  Masataka Shirai ,  Toshio Katsuyama ,  Kaoru Umemura ,  Masaru Izawa ,  Kazuhiko Sagara ,  Hiroshi Kakibayashi

IPC: G01N21/35

CPC classification number: G01N21/31 ,  B01L3/502715 ,  B01L2200/027 ,  B01L2300/0654 ,  B01L2300/0816 ,  B01L2300/0887 ,  G01N21/05 ,  G01N2021/0346 ,  G01N2021/058 ,  G01N2201/0873

Abstract: A micro-spectroscopic measuring device having a structure in which a spectroscopic element made of an array of photonic crystals with defects, flow paths for introducing a sample, and light detecting elements with sensitivity to a band from near infrared to infrared are stacked.

Abstract translation: 具有这样的结构的微分光学测量装置被堆叠，其中由具有缺陷的光子晶体阵列制成的分光元件，用于引入样品的流动路径和对从近红外线到红外线的频带具有灵敏度的光检测元件。

公开(公告)号：US5446534A

公开(公告)日：1995-08-29

申请号：US27026

申请日：1993-03-05

Applicant: Don S. Goldman

Inventor： Don S. Goldman

IPC: G01J3/42 ,  G01N21/55 ,  G02B6/122 ,  G02B6/30 ,  G02B6/34 ,  G01N21/41

CPC classification number: G01N21/31 ,  G01J3/0259 ,  G01J3/42 ,  G01N21/552 ,  G02B6/122 ,  G02B6/1228 ,  G02B6/30 ,  G02B6/34 ,  G01N2201/0873

Abstract: A spectrometer for analyzing a sample of material utilizing a broad band source of electromagnetic radiation and a detector. The spectrometer employs a waveguide possessing an entry and an exit for the electromagnetic radiation emanating from the source. The waveguide further includes a surface between the entry and exit portions which permits interaction between the electromagnetic radiation passing through the wave guide and a sample material. A tapered portion forms a part of the entry of the wave guide and couples the electromagnetic radiation emanating from the source to the waveguide. The electromagnetic radiation passing from the exit of the waveguide is captured and directed to a detector for analysis.

Abstract translation: 用于使用宽带电磁辐射源和检测器分析材料样品的光谱仪。 光谱仪使用具有从源发出的电磁辐射的入口和出口的波导。 波导还包括入口部分和出口部分之间的表面，其允许穿过波导管的电磁辐射与样品材料之间的相互作用。 锥形部分形成波导入口的一部分，并将从源发出的电磁辐射耦合到波导。 从波导出口通过的电磁辐射被捕获并导向检测器进行分析。

公开(公告)号：US5066126A

公开(公告)日：1991-11-19

申请号：US385746

申请日：1989-07-18

Applicant: Masami Hatori

Inventor： Masami Hatori

IPC: G01J1/42 ,  G01J3/00 ,  G01J3/12 ,  G02F1/11 ,  G02F1/125

CPC classification number: G01J3/1256 ,  G01J3/0259 ,  G01J2001/4242 ,  G01N2201/0873

Abstract: An optical spectrum analyzer includes a surface elastic wave generator for generating in an optical waveguide a surface elastic wave which has a continuously varying frequency and which diffracts and deflects a guided wave as it travels across the path of the guided wave, which guided wave is introduced as a measured light beam into and travels in the optical wave guide. The measured light beam which has been deflected is emitted from the optical waveguide and detected by a light detector. A modulator turns on and off or modulates the surface elastic wave by repeatedly energizing and de-energizing the surface elastic wave generator, the frequency of the modulation being lower than the continuously varying frequency. A filter receives a signal corresponding to the modulation frequency from the modulator and a signal corresponding to the measured light beam from the detector, and extracts a signal component having the same frequency as the modulation frequency from the signal received from the light detector. The frequency of the surface elastic wave is detected on the basis of the signal component extracted by the filler when the measured light beam is detected by the light detector.

Abstract translation: 光谱分析仪包括：表面弹性波发生器，用于在光波导中产生具有连续变化频率的表面弹性波，并且当导波在导波的路径上行进时衍射和偏转导波，该引导波被引入 作为测量光束进入并在光波导中行进。 已经偏转的测量光束从光波导发射并由光检测器检测。 调制器通过反复激励和断开表面弹性波发生器，使调制频率低于连续变化的频率来打开和关闭或调制表面弹性波。 滤波器从调制器接收对应于调制频率的信号和对应于来自检测器的测量光束的信号，并从从光检测器接收的信号中提取具有与调制频率相同频率的信号分量。 当由光检测器检测到测量光束时，基于由填料提取的信号分量来检测表面弹性波的频率。

公开(公告)号：US20180321138A1

公开(公告)日：2018-11-08

申请号：US15973155

申请日：2018-05-07

Applicant: Cummins Inc.

Inventor： Shu Li ,  Alok A. Joshi ,  Matthew L. Schneider ,  John P. Coates

IPC: G01N21/25 ,  G01N21/27 ,  G01N21/15 ,  G01M15/10

CPC classification number: G01N21/255 ,  G01M15/108 ,  G01N21/15 ,  G01N21/27 ,  G01N2201/0636 ,  G01N2201/0873

Abstract: An exhaust gas detection assembly, comprising a sensing system comprising a wide-band light source and a detector, a probe configured for mounting in a port of a component of an engine exhaust system, and a fiber optic bundle connected between the sensing system and the probe to carry source light from the light source to the probe and reflected light from the probe to the detector, wherein the detector comprises a filter that passes reflected light received from the probe in a wavelength range corresponding to a wavelength range affected by the presence of a type of gas molecules in the probe.

公开(公告)号：US09939565B2

公开(公告)日：2018-04-10

申请号：US14670691

申请日：2015-03-27

Applicant: Qualitrol Company LLC

Inventor： Yuvi Kahana ,  Alexander Kots ,  Alexander Paritsky

IPC: G02B6/00 ,  G02B5/09 ,  G01D5/26 ,  G01K5/56 ,  G01N21/47 ,  G02B1/02 ,  G02B6/26 ,  G01K5/62

CPC classification number: G02B5/09 ,  G01D5/268 ,  G01K5/56 ,  G01K5/62 ,  G01N21/47 ,  G01N2021/4709 ,  G01N2201/0873 ,  G01N2201/088 ,  G02B1/02 ,  G02B6/262

Abstract: A reflective element for directing an optical signal into a fiber optic sensor having an optical fiber includes a plane containing a sharply defined straight line that separates between a first area of low reflectivity and a second area of high reflectivity. The plane is disposed parallel to a free end surface of the optical fiber so that the free end surface intersects the line of the reflective element, whereby relative movement between the free end surface of the optical fiber and the line in response to a physical change sensed by the fiber optic sensor induces variations in an optical signal reflected by the reflective element through the optical fiber, which variations allow measurement of the physical change.

公开(公告)号：US20170241904A1

公开(公告)日：2017-08-24

申请号：US15437808

申请日：2017-02-21

Applicant: Commissariat à l'Energie Atomique et Aux Energies Alternatives

Inventor： Pierre BARRITAULT ,  Serge GIDON

IPC: G01N21/3504

CPC classification number: G01N21/3504 ,  G01J3/42 ,  G01N21/0303 ,  G01N21/031 ,  G01N21/61 ,  G01N2201/068 ,  G01N2201/0873

Abstract: A sensor including an optical cavity capable of receiving the gas, and defined by first and second opposite ends and a connecting portion connecting said ends; a light source arranged to emit infrared light in the optical cavity; at least one infrared detector arranged to detect the infrared light; at least one mirror arranged in the optical cavity to guide the infrared light towards said at least one infrared detector; the sensor being remarkable in that it includes first and second reflective elements respectively extending at the first and second ends of the optical cavity, and having an infrared light reflection coefficient greater than or equal to 75% for any angle of incidence.

公开(公告)号：US20170205351A1

公开(公告)日：2017-07-20

申请号：US15432732

申请日：2017-02-14

Applicant: International Business Machines Corporation

Inventor： Yann A. N. Astier ,  Ning Li ,  Devendra K. Sadana ,  Joshua T. Smith ,  William T. Spratt

IPC: G01N21/64 ,  G02B6/132 ,  G02B6/122 ,  H01L31/16 ,  H01L33/32 ,  H01L33/00 ,  H01L31/0304 ,  G02B6/136 ,  G02B6/12

CPC classification number: G01N21/6454 ,  B01L3/502707 ,  B01L3/502715 ,  B01L2300/0654 ,  G01N15/1436 ,  G01N15/1459 ,  G01N15/1484 ,  G01N21/6428 ,  G01N21/645 ,  G01N2015/1006 ,  G01N2021/6439 ,  G01N2021/6482 ,  G01N2201/0873 ,  G02B6/12004 ,  G02B6/122 ,  G02B6/131 ,  G02B6/132 ,  G02B6/136 ,  G02B2006/12078 ,  G02B2006/12123 ,  H01L27/14 ,  H01L27/15 ,  H01L31/03044 ,  H01L31/16 ,  H01L33/007 ,  H01L33/32

Abstract: A method of forming a semiconductor structure includes forming a first optical waveguide and a second optical waveguide on a sapphire substrate. The first optical waveguide and the second optical waveguide each include a core portion of gallium nitride (GaN), and a cladding layer laterally surrounding the core portion. The cladding layer includes a material having a refractive index less than a refractive index of the sapphire substrate. The method further includes etching a portion of the cladding layer to form a microfluidic channel therein and forming a capping layer on a top surface of the first optical waveguide, the second optical waveguide and the microfluidic channel.

公开(公告)号：US20170205349A1

公开(公告)日：2017-07-20

申请号：US15432696

申请日：2017-02-14

Applicant: International Business Machines Corporation

Inventor： Yann A. N. Astier ,  Ning Li ,  Devendra K. Sadana ,  Joshua T. Smith ,  William T. Spratt

IPC: G01N21/64 ,  G02B6/12 ,  H01L31/16 ,  H01L33/00 ,  H01L31/0304 ,  G02B6/122 ,  H01L33/32

CPC classification number: G01N21/6454 ,  B01L3/502707 ,  B01L3/502715 ,  B01L2300/0654 ,  G01N15/1436 ,  G01N15/1459 ,  G01N15/1484 ,  G01N21/6428 ,  G01N21/645 ,  G01N2015/1006 ,  G01N2021/6439 ,  G01N2021/6482 ,  G01N2201/0873 ,  G02B6/12004 ,  G02B6/122 ,  G02B6/131 ,  G02B6/132 ,  G02B6/136 ,  G02B2006/12078 ,  G02B2006/12123 ,  H01L27/14 ,  H01L27/15 ,  H01L31/03044 ,  H01L31/16 ,  H01L33/007 ,  H01L33/32

Abstract: A semiconductor structure includes a first optical waveguide and a second optical waveguide located on a sapphire substrate. The first optical waveguide and the second optical waveguide each include a core portion of gallium nitride (GaN), and a cladding layer laterally surrounding the core portion. The cladding layer includes a material having a refractive index less than a refractive index of the sapphire substrate.

公开(公告)号：US09651475B2

公开(公告)日：2017-05-16

申请号：US14444000

申请日：2013-11-27

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Takahiko Hirai ,  Kazuki Yamaguchi

IPC: G01N21/09 ,  G01N21/3504 ,  C23C14/08 ,  C23C14/14 ,  C23C16/06 ,  C23C16/40

CPC classification number: G01N21/09 ,  C23C14/081 ,  C23C14/14 ,  C23C16/06 ,  C23C16/403 ,  G01N21/314 ,  G01N21/3504 ,  G01N2201/0873

Abstract: An optical sensor apparatus includes a light receiving element configured to produce an output according to a light receiving state, and an optical element including a reflecting layer including a metal film, and being arranged such that at least some of incident light on the light receiving element is light that is reflected by the reflecting layer. The optical element further includes a corrosion resistant layer for suppressing corrosion of the reflecting layer, and the reflecting layer includes a surface covered by the corrosion resistant layer formed by vapor plating.

公开(公告)号：US20170115206A1

公开(公告)日：2017-04-27

申请号：US15301749

申请日：2015-03-31

Applicant: Nederlandse Organisatie voor toegepast-natuurweten schappelijk onderzoek TNO

Inventor： Bart Michiel DE BOER, Boer ,  Peter Johan HARMSMA ,  Dario Maria Rosario LO CASCIO

IPC: G01N21/03 ,  G02B6/34 ,  G01N21/05

CPC classification number: G01N21/0303 ,  G01N21/05 ,  G01N21/552 ,  G01N21/7746 ,  G01N21/8483 ,  G01N2021/0321 ,  G01N2021/0367 ,  G01N2201/06 ,  G01N2201/0873 ,  G02B6/34 ,  G02B6/4225

Abstract: The present disclosure concerns an apparatus (10) and method for reading out an optical chip (20). A light source (13) is arranged for emitting single mode source light (S1) from its emitter surface (A1) towards an optical input (21) of the optical chip (20). A light detector (14) is arranged for receiving measurement light (S2) impinging onto its receiver surface (A2) from an optical output (22) of the optical chip (20), and measuring said received measurement light (S2). The emitted source light (S1) is aligned to enter the optical input (21) of the optical chip (20) and the measurement light (S2) is aligned back onto the receiver surface (A2). The receiver surface (A2) is larger than the emitter surface (A1) for facilitating the overall alignment.