公开(公告)号：US10801864B2

公开(公告)日：2020-10-13

申请号：US16242788

申请日：2019-01-08

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Jong-Ahn Kim ,  Jae-Wan Kim ,  Jae-Yong Lee ,  Jonghan Jin ,  Jae-Heun Woo

IPC: G01D5/347

Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.

公开(公告)号：US10309011B2

公开(公告)日：2019-06-04

申请号：US15562545

申请日：2016-07-28

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Sang Woo Kang ,  Ji Hun Mun

IPC: C01B17/20 ,  C01G39/06 ,  C23C16/02 ,  C23C16/30 ,  C23C16/52 ,  C30B25/16 ,  C30B25/18 ,  C30B29/46 ,  C30B29/64 ,  C23C16/455

Abstract: The present invention relates to a method for preparing a two-dimensional transition metal dichalcogenide and, more particularly, to a method for preparing a highly uniform two-dimensional transition metal dichalcogenide thin film. More specifically, the present invention is directed to a preparation method for a highly uniform two-dimensional transition metal dichalcogenide thin film at low temperature of 500° C. or below.

公开(公告)号：US10233561B2

公开(公告)日：2019-03-19

申请号：US15246980

申请日：2016-08-25

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Geun-Woo Lee ,  Soo Heyong Lee

IPC: C30B7/02 ,  C30B30/02 ,  C30B30/08 ,  B23K26/70 ,  B01D1/00

Abstract: An electrostatic levitation crystal growth apparatus for a solution and a crystal growing method using the same. The apparatus may include an upper electrode, a lower electrode vertically spaced apart from the upper electrode, a power supply unit configured to apply a vertical electrostatic field between the upper electrode and the lower electrode, and a droplet dispenser configured to eject a solution into a region between the upper and lower electrodes and thereby to form a solution droplet. The solution droplet may be maintained in a charged state and may be electrostatically levitated against the gravity exerted thereon, by the vertical electrostatic field. The solution droplet may be evaporated in the electrostatically levitated state, and a solute dissolved in the solution may be grown to form a crystal.

公开(公告)号：US10191081B2

公开(公告)日：2019-01-29

申请号：US15238326

申请日：2016-08-16

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Byong Chon Park ,  DalHyun Kim ,  ChaeHo Shin

IPC: G01Q60/32 ,  G01Q10/06

Abstract: Provided is a measuring method for an atomic force microscope that scans a surface of a sample with a probe to measure a surface property of the sample, the measuring method including detecting a motion of the probe while vibrating the probe on the surface of the sample, acquiring surface information on the sample by using a variation in the motion of the probe, and controlling the probe by using the surface information on the sample. The surface information on the sample may include a position and a slope of the surface. The vibrating of the probe on the surface of the sample may include performing a circular motion by the probe around axes perpendicular to a scan direction of the probe and to a height direction of the sample.

公开(公告)号：US10145785B2

公开(公告)日：2018-12-04

申请号：US14906433

申请日：2014-05-13

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Yong Jai Cho ,  Won Chegal ,  Hyun Mo Cho

IPC: G01N21/21 ,  G01J4/00 ,  G01J4/04

Abstract: Provided is an optical element rotation type Mueller-matrix ellipsometer for solving a problem of measurement accuracy and measurement precision occurring due to residual polarization of a light source, polarization dependence of a photo-detector, measurement values of Fourier coefficients of a high order term in dual optical element rotation type Mueller-matrix ellipsometers according to the related art capable of measuring some or all of components of a Mueller-matrix for any sample.

公开(公告)号：US10121658B2

公开(公告)日：2018-11-06

申请号：US15576664

申请日：2016-03-24

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Hyuksang Kwon ,  Jeong Won Kim ,  Eun Seong Lee

IPC: H01L21/02 ,  H01L21/428 ,  H01L21/205 ,  H01L29/24 ,  H01L29/34 ,  H01L29/786 ,  H01L31/032 ,  H01L33/26

Abstract: The present invention relates to a method of fabricating a black phosphorus thin film and a black phosphorus thin film thereof and, more particularly, to a method of fabricating a black phosphorus ultrathin film by forming the black phosphorous ultrathin film in a chamber by active oxygen and removing accompanying black phosphorus oxide film water. The black phosphorus ultrathin film has a surface that does not substantially have defects and is uniform in a large area, and has a surface roughness property of 1 nm or less, to represent a high application property to an optoelectronic device and a field effect transistor.

公开(公告)号：US10082468B2

公开(公告)日：2018-09-25

申请号：US15580117

申请日：2017-04-27

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Hyuksang Kwon

IPC: G01J3/44 ,  G01N21/65 ,  G01N21/25

CPC classification number: G01N21/658 ,  G01N21/255 ,  G01N2201/06113 ,  G01N2201/12

Abstract: The present invention relates to a method for evaluating a SERS sensor substrate, comprising the steps of: a) measuring, through a dark-field microscope, the color of nanoparticles positioned on the SERS sensor substrate; b) converting the measured color into a distance between the nanoparticles; c) acquiring the Raman signal intensity of the SERS sensor substrate; d) acquiring the standard Raman signal intensity of a standard SERS sensor substrate including the nanoparticles having the distance that is the same as the converted distance; and e) comparing the Raman signal intensity and the standard Raman signal intensity.

公开(公告)号：US09989503B2

公开(公告)日：2018-06-05

申请号：US15080228

申请日：2016-03-24

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Namgoo Kang

IPC: G01N30/32 ,  G01N30/02

CPC classification number: G01N30/32 ,  G01N2030/025 ,  G01N2030/328

Abstract: Provided is an apparatus for quantitatively analyzing one or more gas components contained in a gas sample. More particularly, an apparatus for quantitatively analyzing gas components with an automatic feed control function of a gas, includes a multi-position valve, a pump, and a control part controlling the multi-position valve and the pump, such that the apparatus for quantitatively analyzing gas components may allow a professional worker performing analysis to secure an efficient research time while ensuring accuracy at the level equivalent to analysis results by a highly skilled professional worker regardless of proficiency of a newly employed person being in charge of quantitative analysis of the gas components of the gas sample in a sample bag.

公开(公告)号：US09965077B2

公开(公告)日：2018-05-08

申请号：US15216821

申请日：2016-07-22

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY ,  KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Heesuk Kim ,  Jong Ho Kim ,  Sang-Soo Lee ,  Yon Kyu Park ,  Min-Seok Kim

IPC: G06F3/045 ,  G06F3/041 ,  G06F3/044 ,  G01L1/14

CPC classification number: G06F3/044 ,  G01L1/146 ,  G01L1/148 ,  G06F2203/04103

Abstract: The present disclosure relates to a force sensor including a first substrate, a first electrode installed in a pattern on an upper surface of the first substrate, a second substrate disposed above and spaced apart from the first substrate, a second electrode installed in a pattern on a lower surface of the second substrate, facing the first electrode, and a dielectric interposed between the first substrate and the second substrate, wherein the dielectric includes a first dielectric surrounding an outside of the second electrode, and a pressure rib connecting the first dielectric to the first electrode, and a method for preparing the same, and shows a remarkably superior effect to related art, in terms of capacitance, interactivity and durability.

公开(公告)号：US09939461B2

公开(公告)日：2018-04-10

申请号：US15323078

申请日：2015-12-23

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Dal Hyun Kim ,  Byong Chon Park ,  Chae Ho Shin

IPC: G01Q60/32

CPC classification number: G01Q60/32 ,  G01Q20/02 ,  G01Q30/02 ,  G01Q30/18 ,  G01Q60/38

Abstract: An object of the application is to provide a head-integrated for an atomic force microscope capable of realizing minimization of a weight and a volume and improvement of structural stability by optimizing a head structure of the atomic force microscope. Another object of the application is to provide a head-integrated atomic force microscope capable of being utilized for imaging a large-area sample by enabling high-rate head scan due to dynamic characteristics improved by mounting the integrated-head described above. Still another object of the application is to provide a composite microscope including a head-integrated atomic force microscope, capable of performing high-rate position search and imaging and performing precise observation of a three-dimensional shape up to an atomic image level in a region of interest by combining the head-integrated atomic force microscope having the improved dynamic characteristics as described above and an electron microscope or an optical microscope with each other.