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    OPTICAL DEVICES AND SYSTEMS USING THEM
    241.
    发明申请
    OPTICAL DEVICES AND SYSTEMS USING THEM 有权
    使用它们的光学设备和系统

    公开(公告)号：US20100110423A1

    公开(公告)日：2010-05-06

    申请号：US12478381

    申请日：2009-06-04

    Applicant: Julien S. Villaumie

    Inventor： Julien S. Villaumie

    IPC: G01J3/44

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/024 ,  G01J3/0291 ,  G01J3/0294 ,  G01J3/10 ,  G01J3/44 ,  G01J2003/1213 ,  G01J2003/1243 ,  G01N21/65 ,  G01N2021/6419 ,  G01N2021/6484 ,  G01N2201/0826 ,  G01N2201/0833

    Abstract: Certain examples described herein are directed to optical devices and systems that include first and second optical elements. In some examples, the first optical element may be configured to pass light received from an excitation source, and the second optical element may be optically coupled to the first optical element and may be configured to reflect incident light from the first optical element back to the first optical element and configured to pass the light reflected from the first optical element. Methods using the devices and systems are also described.

    Abstract translation: 本文描述的某些示例涉及包括第一和第二光学元件的光学装置和系统。 在一些示例中，第一光学元件可以被配置为通过从激励源接收的光，并且第二光学元件可以光耦合到第一光学元件，并且可以被配置为将来自第一光学元件的入射光反射回到 第一光学元件并且被配置为使从第一光学元件反射的光通过。 还描述了使用装置和系统的方法。

    BIOSENSOR DETECTION APPARATUS
    242.
    发明申请
    BIOSENSOR DETECTION APPARATUS 审中-公开
    生物传感器检测装置

    公开(公告)号：US20100027005A1

    公开(公告)日：2010-02-04

    申请号：US12443632

    申请日：2007-09-21

    Applicant: Nobuhiko Ogura

    Inventor： Nobuhiko Ogura

    IPC: G01J3/28 ,  G01N21/00

    CPC classification number: G01N21/253 ,  G01N2201/0826 ,  G01N2201/0833

    Abstract: A biosensor detection apparatus having increased processing power for measurement without complicated structure and increased size. The apparatus includes one or more spectrometers configured to spectrally separate each light beam reflected from each of a plurality of measurement regions defined on a biosensor simultaneously, and one or more optical receivers configured to receive each light beam spectrally separated by the one or more spectrometers simultaneously and to obtain a spectral intensity distribution of each light beam separately.

    Abstract translation: 一种生物传感器检测装置，其具有增加的测量处理能力，而不需要复杂的结构和增大的尺寸。 该装置包括一个或多个光谱仪，其被配置为频谱地分离由在生物传感器上同时定义的多个测量区域中的每一个反射的每个光束;以及一个或多个光学接收器，被配置为接收由一个或多个光谱仪同时光谱分离的每个光束 并分别获得每个光束的光谱强度分布。

    Apparatus for determining optimum position of focus of an imaging system
    243.
    发明授权
    Apparatus for determining optimum position of focus of an imaging system 有权
    用于确定成像系统的焦点的最佳位置的装置

    公开(公告)号：US07633041B2

    公开(公告)日：2009-12-15

    申请号：US11524684

    申请日：2006-09-21

    Applicant: Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    Inventor： Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    IPC: G02B7/04 ,  G01N21/86

    CPC classification number: G01N21/9501 ,  G01N21/8806 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/479 ,  G01N2021/8825 ,  G01N2201/0697 ,  G01N2201/0826

    Abstract: Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane assembly, optically forming a continuous surface of photo-detectors at the focal plane of the optical imaging system. The continuously moving wafer is illuminated by a laser pulse of duration significantly shorter than the pixel dwell time, such that there is effectively no image smear during the wafer motion. The laser pulse has sufficient energy and brightness to impart the necessary illumination to each sequentially inspected field of view required for creating an image of the inspected wafer die. A novel fiber optical illumination delivery system, which is effective in reducing the effects of source coherence is described. Other novel aspects of the system include a system for compensating for variations in the pulse energy of a Q-switched laser output, methods for autofocussing of the wafer imaging system, and novel methods for removal of repetitive features of the image by means of Fourier plane filtering, to enable easier detection of wafer defects.

    Abstract translation: 通过用来自重复脉冲激光器的短光脉冲照射晶片缺陷的快速在线电光检测，晶片的一部分在成像系统的视场内移动，并将移动的晶片成像到 焦平面组件，在光学成像系统的焦平面处光学地形成光电检测器的连续表面。 持续移动的晶片被持续时间明显短于像素停留时间的激光脉冲照亮，使得在晶片运动期间实际上没有图像污迹。 激光脉冲具有足够的能量和亮度，以对于产生被检查的晶片管芯的图像所需的每个顺序检查的视场赋予必要的照明。 描述了一种有效减少源相干效应的新型光纤照明传输系统。 该系统的其他新颖的方面包括用于补偿Q开关激光输出的脉冲能量变化的系统，用于晶片成像系统的自动聚焦的方法，以及通过傅里叶平面去除图像的重复特征的新颖方法 过滤，以便更容易地检测晶片缺陷。

    APPARATUS AND METHOD FOR DETECTING SURFACE DEFECTS ON A WORKPIECE SUCH AS A ROLLED/DRAWN METAL BAR
    246.
    发明申请
    APPARATUS AND METHOD FOR DETECTING SURFACE DEFECTS ON A WORKPIECE SUCH AS A ROLLED/DRAWN METAL BAR 有权
    用于检测工件表面缺陷的装置和方法，如滚筒/拉丝金属棒

    公开(公告)号：US20090046923A1

    公开(公告)日：2009-02-19

    申请号：US12236886

    申请日：2008-09-24

    Applicant: Tzyy-Shuh Chang ,  Daniel Gutchess ,  Hsun-Hau Huang

    Inventor： Tzyy-Shuh Chang ,  Daniel Gutchess ,  Hsun-Hau Huang

    IPC: G06K9/62

    CPC classification number: G01N21/952 ,  G01N2201/0826 ,  G01N2201/084 ,  H04N7/18

    Abstract: The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured. A removable cassette includes various mirrors. A protection tube isolates the moving metal bar from the line light assembly and image acquisition camera. A contaminant reduction mechanism applies a vacuum to remove airborne contaminants.

    Abstract translation: 本发明旨在解决与检测金属棒表面缺陷相关的问题以及将金属平面检查系统应用于金属棒以用于非破坏性表面缺陷检测相关的问题。 为了上述目的开发了一种专门设计的成像系统，由计算单元，线路灯和高数据速率线扫描摄像机组成。 目标应用是当给定形状的横截面积为1时，具有等于或小于4.25的圆周/横截面积比的金属棒（1），（2）横截面为圆形，椭圆形 ，或多边形的形状，（3）通过机械截面缩小工艺制造。 所述金属可以是钢，不锈钢，铝，铜，青铜，钛，镍等，和/或它们的合金。 所述金属棒可以处于制造时的温度。 可拆卸的盒子包括各种镜子。 保护管将移动的金属棒与线路灯组件和图像采集相机隔离。 污染物减少机制应用真空去除空气污染物。

    Dual illumination system for an imaging apparatus and method
    247.
    发明授权
    Dual illumination system for an imaging apparatus and method 有权
    用于成像设备和方法的双照明系统

    公开(公告)号：US07474399B2

    公开(公告)日：2009-01-06

    申请号：US11434606

    申请日：2006-05-15

    Applicant: David Nilson ,  Brad Rice ,  Tamara Troy

    Inventor： David Nilson ,  Brad Rice ,  Tamara Troy

    IPC: G01N21/00 ,  G01J3/30 ,  G01K9/00

    CPC classification number: G01N21/6456 ,  G01N2021/1787 ,  G01N2021/6471 ,  G01N2021/6484 ,  G01N2201/0227 ,  G01N2201/0826

    Abstract: A dual illumination system is disclosed for use with an imaging apparatus. The imaging apparatus defines a light-tight imaging compartment with an interior wall having a view port extending into the imaging compartment. This view port enables data acquisition of a biological specimen contained in the imaging compartment. The dual illumination system includes a first illumination assembly configured to direct structured light onto a first side of the specimen to enable structured light and surface topography measurements thereof. A second illumination assembly then directs light at the specimen wherein diffused fluorescent light emanates from a surface thereof for receipt through the view port to acquire fluorescence data of the specimen. The combination of structured light imaging and fluorescence imaging enables 3D diffuse tomographic reconstructions of fluorescent probe location and concentration.

    Abstract translation: 公开了一种与成像装置一起使用的双照明系统。 成像装置限定了具有内壁的不透光成像室，该内壁具有延伸到成像室中的视口。 该视图端口能够对包含在成像室中的生物样本进行数据采集。 双照明系统包括第一照明组件，其被配置为将结构化光引导到样本的第一侧上，以使其能够进行结构化的光和表面形貌测量。 第二照明组件然后引导样品的光，其中扩散的荧光从其表面发出，以通过视口接收，以获取样本的荧光数据。 结构光成像和荧光成像的结合使得能够进行荧光探针位置和浓度的3D漫射层析成像重建。

    Light delivery control system and method
    249.
    发明授权
    Light delivery control system and method 有权
    光输送控制系统及方法

    公开(公告)号：US07307704B2

    公开(公告)日：2007-12-11

    申请号：US10827655

    申请日：2004-04-19

    Applicant: Jeffrey T. Benoit ,  Wayde R. Schmidt ,  Thomas H. Vanderspurt

    Inventor： Jeffrey T. Benoit ,  Wayde R. Schmidt ,  Thomas H. Vanderspurt

    IPC: G01N21/00 ,  G01J1/20 ,  G02B6/34

    CPC classification number: G06F17/5045 ,  G01N2201/0826 ,  G02B6/001 ,  G02B6/14

    Abstract: A system and method that redistributes light from a light source. The controller can redistribute light to make an irradiance profile of the light source more uniform or make the irradiance profile match a fluid flow profile. The irradiance profile may be controlled by modifying light leakage from a plurality of waveguides or changing the light-directing properties of reflectors and/or lenses.

    Abstract translation: 从光源重新分配光的系统和方法。 控制器可以重新分配光，使光源的辐照度分布更均匀，或使辐照度轮廓匹配流体流动分布。 可以通过修改来自多个波导的光泄漏或改变反射器和/或透镜的导光性能来控制辐照度分布。

    Sample analyzer
    250.
    发明申请
    Sample analyzer 有权
    样品分析仪

    公开(公告)号：US20070222973A1

    公开(公告)日：2007-09-27

    申请号：US11724934

    申请日：2007-03-16

    Applicant: Susumu Hoshiko ,  Naohiko Matsuo ,  Katsushi Kobayashi ,  Norimasa Yamamoto

    Inventor： Susumu Hoshiko ,  Naohiko Matsuo ,  Katsushi Kobayashi ,  Norimasa Yamamoto

    IPC: G01N21/00

    CPC classification number: G01N21/314 ,  G01J2003/123 ,  G01N21/0332 ,  G01N21/253 ,  G01N21/272 ,  G01N21/274 ,  G01N21/82 ,  G01N33/49 ,  G01N35/00603 ,  G01N2021/3148 ,  G01N2021/3155 ,  G01N2021/3174 ,  G01N2021/825 ,  G01N2035/00356 ,  G01N2035/0455 ,  G01N2201/0618 ,  G01N2201/0826

    Abstract: A sample analyzer comprising: a measuring part for measuring optical information of a sample at first wavelength, second wavelength, and third wavelength, first light of the first wavelength and second light of the second wavelength being absorbed by a second substance but substantially not absorbed by a first substance, and third light of the third wavelength being absorbed by the first substance; and an obtaining means for obtaining content of the first substance in the sample, and content of the second substance in the sample, influence by the second substance being excluded from the content of the first substance, based on the optical information at the first wavelength, second wavelength, and third wavelength measured by the measuring part.

    Abstract translation: 一种样本分析器，包括：测量部分，用于测量第一波长，第二波长和第三波长处的样品的光学信息，第一波长的第一光和第二波长的第二光被第二物质吸收，但基本上不被 第一物质和第三波长的第三光被第一物质吸收; 以及获取装置，用于根据第一波长的光学信息获得样品中第一物质的含量和样品中第二物质的含量，被第二物质排除在第一物质的含量之外的影响， 第二波长和由测量部分测量的第三波长。

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