Lattice array-structured piezoelectric actuator and method for producing the same
    246.
    发明授权
    Lattice array-structured piezoelectric actuator and method for producing the same 有权
    晶格阵列结构的压电致动器及其制造方法

    公开(公告)号:US06891314B2

    公开(公告)日:2005-05-10

    申请号:US10224577

    申请日:2002-08-21

    Abstract: A common electrode and a signal electrode are separately formed on two major faces of each of tabular piezoelectric actuator elements arrayed on a substrate. On a flexible printed circuit board, formed are electric bonding pads, which are to be electrically connected with the substrate of the actuator elements. A semi-spherical bump including a conductive core and a conductive sealant is formed on each of pads. The actuator elements having substrate is made to face the flexible printed circuit board, and heated under pressure to thereby electrically bond the signal electrodes (at their electric bonding area) to the corresponding bumps. Thus bonded, there exists a gap around the core, and it allows the actuator area of the signal electrode to act completely free, not interfered with any other.

    Abstract translation: 公共电极和信号电极分别形成在排列在基板上的每个平板状压电致动器元件的两个主表面上。 在柔性印刷电路板上形成有电连接焊盘,其将与致动器元件的基板电连接。 在每个焊盘上形成包括导电芯和导电密封剂的半球形凸块。 将具有基板的致动器元件制成面对柔性印刷电路板,并在加压下加热,从而将信号电极(在其电接合区域)电连接到相应的凸块。 因此,在芯部周围存在间隙,并且使信号电极的致动器区域能够完全自由地起作用,而不会干扰任何其它的。

    PROBE CARD FOR USE WITH MICROELECTRONIC COMPONENTS,AND METHODS FOR MAKING SAME
    250.
    发明申请
    PROBE CARD FOR USE WITH MICROELECTRONIC COMPONENTS,AND METHODS FOR MAKING SAME 失效
    用微电子元件使用的探针卡及其制造方法

    公开(公告)号:US20050046431A1

    公开(公告)日:2005-03-03

    申请号:US10653766

    申请日:2003-09-03

    Applicant: Kyle Kirby

    Inventor: Kyle Kirby

    Abstract: The present disclosure provides probe cards which may be used for testing microelectronic components, including methods of making and using such probe cards. One exemplary implementation provides a probe card that employs a substrate with a plurality of openings. A first probe, which may be used to contact a microelectronic component, includes a first conductor slidably received in one of the openings and a first electrical trace. The electrical trace may be patterned from a metal layer on the back of the substrate and include a resilient free length adapted to urge the first conductor to extend outwardly beyond the front of the substrate. A second probe includes a second conductor slidably received in another one of the openings and a second electrical trace. The second electrical trace may be patterned from a metal layer on the front of the substrate and include a resilient free length adapted to urge the second conductor to extend outwardly beyond the back of the substrate. An electrical pathway through the substrate may electrically couple and first and second electrical traces.

    Abstract translation: 本公开提供了可用于测试微电子部件的探针卡,包括制造和使用这种探针卡的方法。 一个示例性实施例提供了采用具有多个开口的基板的探针卡。 可用于接触微电子部件的第一探针包括可滑动地容纳在一个开口中的第一导体和第一电迹线。 电迹线可以从衬底的背面上的金属层图案化,并且包括适于促使第一导体向外延伸超出衬底前部的弹性自由长度。 第二探针包括可滑动地容纳在另一个开口中的第二导体和第二电迹线。 第二电迹线可以从衬底前面的金属层图案化,并且包括适于促使第二导体向外延伸超过衬底背面的弹性自由长度。 穿过衬底的电路可以电耦合和第一和第二电迹线。

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