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    Spectroscope
    241.
    发明授权
    Spectroscope 有权

    公开(公告)号：US11262240B2

    公开(公告)日：2022-03-01

    申请号：US17036329

    申请日：2020-09-29

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Takafumi Yokino ,  Katsumi Shibayama ,  Katsuhiko Kato

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/18

    Abstract: A spectrometer 1A includes a package 2 having a stem 4 and a cap 5, an optical unit 10A disposed on the stem 4, and a lead pin 3 for securing the optical unit 10A to the stem 4. The optical unit 10A includes a dispersive part 21 for dispersing and reflecting light entering from a light entrance part 6 of the cap 5, a light detection element 30 having a light detection part 31 for detecting the light dispersed and reflected by the dispersive part 21, a support 40 for supporting the light detection element 30 such that a space is formed between the dispersive part 21 and the light detection element 30, and a projection 11 protruding from the support 40, the lead pin 3 being secured to the projection 11. The optical unit 10A is movable with respect to the stem 4 in a contact part of the optical unit 10A and the stem 4.

    Optical Imaging or Spectroscopy Systems and Methods
    242.
    发明申请
    Optical Imaging or Spectroscopy Systems and Methods 有权

    公开(公告)号：US20220054012A1

    公开(公告)日：2022-02-24

    申请号：US17462824

    申请日：2021-08-31

    Applicant: The Trustees of Columbia University in the City of New York

    Inventor： Elizabeth Marjorie Clare Hillman ,  Sean A. BURGESS

    IPC: A61B5/00 ,  G01J3/28 ,  G01J3/42 ,  G01J3/457 ,  G02B23/24 ,  G02B26/10

    Abstract: Optical imaging or spectroscopy described can use laminar optical tomography (LOT), diffuse correlation spectroscopy (DCS), or the like. An incident beam is scanned across a target. An orthogonal or oblique optical response can be obtained, such as concurrently at different distances from the incident beam. The optical response from multiple incident wavelengths can be concurrently obtained by dispersing the response wavelengths in a direction orthogonal to the response distances from the incident beam. Temporal correlation can be measured, from which flow and other parameters can be computed. An optical conduit can enable endoscopic or laparoscopic imaging or spectroscopy of internal target locations. An articulating arm can communicate the light for performing the LOT, DCS, or the like. The imaging can find use for skin cancer diagnosis, such as distinguishing lentigo maligna (LM) from lentigo maligna melanoma (LMM).

    Systems and methods for efficient multi-return light detectors
    243.
    发明授权
    Systems and methods for efficient multi-return light detectors 有权

    公开(公告)号：US11255728B2

    公开(公告)日：2022-02-22

    申请号：US16909926

    申请日：2020-06-23

    Applicant: VELODYNE LIDAR USA, INC.

    Inventor： Kiran Kumar Gunnam ,  Kanke Gao ,  Nitinkumar Sagarbhai Barot ,  Anand Gopalan ,  David S. Hall

    IPC: G01S17/00 ,  G01J3/00 ,  G01J3/28 ,  G01S17/42 ,  G01S17/89 ,  G01S17/50 ,  G01S7/4865 ,  G01S17/86

    Abstract: Described herein are systems and methods that may efficiently detect multi-return light signals. A light detection and ranging system, such as a LiDAR system, may fire a laser beam that may hit multiple objects with a different distance in one line, causing multi-return light signals to be received by the system. Multi-return detectors may be able to analyze the peak magnitude of a plurality of peaks in the return signals and determine a multitude of peaks, such as the first peak, the last peak and the maximum peak. One embodiment to detect the multi-return light signals may be a multi-return recursive matched filter detector. This detector comprises a matched filter, peak detector, centroid calculation and a zeroing out function. Other embodiments may be based on a maximum finder that algorithmically selects the highest magnitude peaks from samples of the return signal and buffers for regions of interests peaks.

    Product inspection and characterization device
    245.
    发明授权
    Product inspection and characterization device 有权

    公开(公告)号：US11249030B2

    公开(公告)日：2022-02-15

    申请号：US16756969

    申请日：2017-11-03

    Applicant: Multiscan Technologies, S.L.

    Inventor： Simon Hendrik E. Van Olmen ,  Álvaro Soler Esteban

    IPC: G01J3/28 ,  G01N21/89 ,  G01N21/25 ,  G01N33/02

    Abstract: The invention relates to a product inspection and characterization device, including conveyance means, a two-dimensional inspection region, a radiation source generating a spot light beam for partially illuminating the surface of the product, optical means for directing the light beam provided with at least one mirror to aim the spot light beam in the inspection region, optical means for directing the reflected and/or scattered light to detection means, detection means for analyzing the light scattered and/or reflected by the product and a processing unit for characterizing the product. The radiation source emitting the light beam is therefore pointed at the product by optical means directing the light beam to the two-dimensional inspection region. Another object of the present invention relates to the method for product inspection and characterization.

    Athermal wavelength stability monitor using a detraction grating
    249.
    发明授权
    Athermal wavelength stability monitor using a detraction grating 有权

    公开(公告)号：US11231319B1

    公开(公告)日：2022-01-25

    申请号：US17014015

    申请日：2020-09-08

    Applicant: Apple Inc.

    Inventor： Yongming Tu ,  Alfredo Bismuto

    IPC: G01J3/28 ,  G01J3/18 ,  G02B5/18 ,  H05B47/105 ,  G01J3/02 ,  G02B6/42

    Abstract: Configurations for a diffraction grating design that mitigates thermal wavelength shifts and corresponding methods thereof are disclosed. The wavelength stability monitoring system may include a planar waveguide that receives input light directed toward a diffraction grating. The diffraction grating may reflect the light back through the planar waveguide and to one or more detectors. The planar waveguide may include multiple materials, such as a first material and a second athermal material that is adjacent to the first material. The athermal material may mitigate thermal wavelength shifts of the light. The design of the athermal material may include targeting a ratio of the input and output path lengths across sets of input and output angles of light that pass through the first material and the second athermal material. In some examples, the output waveguides may be positioned to receive leakage modes of light.

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