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21.
公开(公告)号:US20240222111A1
公开(公告)日:2024-07-04
申请号:US18396357
申请日:2023-12-26
Applicant: ASM IP Holding B.V.
Inventor: Viraj Madhiwala , Eva E. Tois , Daniele Chiappe , Marko Tuominen
IPC: H01L21/02
CPC classification number: H01L21/0228 , H01L21/02046 , H01L21/0206 , H01L21/02178 , H01L21/02205 , H01L21/02304 , H01L21/02312
Abstract: Methods for selectively forming a dielectric layer on a metallic surface relative to a dielectric surface are disclosed. The disclosed selective formation methods include selective passivation processes, and selective deposition processes.
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公开(公告)号:US20230386934A1
公开(公告)日:2023-11-30
申请号:US18322286
申请日:2023-05-23
Applicant: ASM IP Holding, B.V.
Inventor: Shaoren Deng , Marko Tuominen , Vincent Vandalon , Eva E. Tois , Viraj Madhiwala , YongGyu Han , Daniele Chiappe , Michael Givens , Ren-Jie Chang , Giuseppe Alessio Verni , Timothee Blanquart , René Henricus Jozef Vervuurt
IPC: H01L21/8238
CPC classification number: H01L21/823807
Abstract: Disclosed are methods and related systems for forming a structure. Embodiments of presently described methods comprise employing a sacrificial gap filling fluid for selectively forming a first layer on one or more first surfaces in a lower part of a gap, and forming a second layer on one or more second surfaces in an upper part of a gap.
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公开(公告)号:US11643720B2
公开(公告)日:2023-05-09
申请号:US17216249
申请日:2021-03-29
Applicant: ASM IP Holding B.V.
Inventor: Andrea Illiberi , Giuseppe Alessio Verni , Shaoren Deng , Daniele Chiappe , Eva Tois , Marko Tuominen , Michael Givens
IPC: C23C16/40 , C23C16/455 , B01J31/12
CPC classification number: C23C16/401 , B01J31/122 , C23C16/45534 , C23C16/45553
Abstract: Methods for selective deposition of silicon oxide films on metal or metallic surfaces relative to dielectric surfaces are provided. A dielectric surface of a substrate may be selectively passivated relative to a metal or metallic surface, such as by exposing the substrate to a silylating agent. Silicon oxide is then selectively deposited on the metal or metallic surface relative to the passivated oxide surface by contacting the metal surface with a metal catalyst and a silicon precursor comprising a silanol.
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公开(公告)号:US20230140812A1
公开(公告)日:2023-05-04
申请号:US18050142
申请日:2022-10-27
Applicant: ASM IP Holding, B.V.
Inventor: Daniele Chiappe , Eva Tois , Viraj Madhiwala , Marko Tuominen , Anirudhan Chandrasekaran , Andrea Illiberi , Shaoren Deng , Charles Dezelah , Vincent Vandalon , YongGyu Han , Michael Givens
IPC: H01L21/02 , C23C16/455 , C23C16/40 , C23C16/02
Abstract: The present disclosure relates to methods and apparatuses for selectively depositing silicon and oxygen-comprising material on a first surface of a substrate relative to a second surface of the substrate by a cyclic deposition process, the method comprising providing a substrate in a reaction chamber; providing a metal or metalloid catalyst to the reaction chamber in a vapor phase; providing a silicon precursor comprising an alkoxy silane compound into the reaction chamber in a vapor phase; and providing an oxygen precursor comprising oxygen and hydrogen into the reaction chamber in vapor phase to form silicon and oxygen-comprising material on the first surface. The disclosure further relates to vapor deposition assemblies.
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公开(公告)号:US20210301392A1
公开(公告)日:2021-09-30
申请号:US17216466
申请日:2021-03-29
Applicant: ASM IP Holding B.V.
Inventor: Andrea Illiberi , Giuseppe Alessio Verni , Shaoren Deng , Daniele Chiappe , Eva Tois , Marko Tuominen , Michael Givens
Abstract: Methods for selective deposition of silicon oxide films on dielectric surfaces relative to metal surfaces are provided. A metal surface of a substrate may be selectively passivated relative to the dielectric surface, such as with a polyimide layer or thiol SAM. Silicon oxide is selectively deposited on the dielectric surface relative to the passivated metal surface by contacting the dielectric surface with a metal catalyst and a silicon precursor comprising a silanol.
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