公开(公告)号：US20090314749A1

公开(公告)日：2009-12-24

申请号：US12453920

申请日：2009-05-27

Applicant: Hidemitsu Asano ,  Makoto Uwada ,  Makoto Kaieda

Inventor： Hidemitsu Asano ,  Makoto Uwada ,  Makoto Kaieda

IPC: B23K26/00 ,  G01J1/20

CPC classification number: B23K26/032 ,  B23K26/04 ,  B23K26/066 ,  B23K26/067 ,  G01J1/0448 ,  G01J1/0462 ,  G02B5/005 ,  G03F1/72

Abstract: Disclosed is a slit width adjusting device comprising: a pair of slit members parallel to each other, which is moved to approach each other or to be separated from each other to adjust a slit width; a driving section to move the pair of slit members; an absolute position original point detection section to detect an arbitrary absolute position of the slit members as an original point; and an adjustment section to adjust the slit width, wherein the adjustment section comprises: a storage unit to store a slit width table in which a displacement amount of the slit width from the original point, and a drive instruction value corresponding to the displacement amount, are corresponding to each other; and a drive control unit to extract the drive instruction value corresponding to a specified slit width, to drive the driving section according to the extracted drive instruction value.

Abstract translation: 本发明公开了一种狭缝宽度调节装置，包括：一对彼此平行的狭缝部件，彼此接近移动或彼此分离以调节狭缝宽度; 用于移动所述一对狭缝部件的驱动部; 绝对位置原点检测部，检测狭缝部件的任意绝对位置为原点; 以及调节部，调整狭缝宽度，其中，所述调整部包括：存储单元，存储狭缝宽度表，所述狭缝宽度表与所述原点相对应的所述狭缝宽度的位移量和与所述位移量对应的驱动指示值， 相互对应; 以及驱动控制单元，用于提取与指定的狭缝宽度相对应的驱动指令值，以根据提取的驱动指令值来驱动驱动部。

公开(公告)号：US20050253046A1

公开(公告)日：2005-11-17

申请号：US10848707

申请日：2004-05-14

Applicant: Thomas Bulpitt

Inventor： Thomas Bulpitt

IPC: G01J1/06 ,  G01J1/42 ,  H01J3/14

CPC classification number: G01J1/06 ,  G01J1/0444 ,  G01J1/0462 ,  G01J1/42 ,  G01J2001/4252

Abstract: A device for measuring the output of an LED with a detector under different distance conditions without requiring the movement of either the LED or the detector. An exemplary embodiment of the present invention implements the testing conditions specified in CIE 127 allowing the determination of Averaged LED Intensity at the specified distances of 100 mm and 316 mm while keeping the physical distance between the LED and the detector fixed at the shorter distance of 100 mm. The exemplary embodiment comprises an optical element that can be selectively inserted into the optical path between the LED and the detector to make the separation appear to be the longer of the two distances. The optical element comprises a lens assembly and a detector aperture that creates a virtual image of the detector aperture at the longer of the two distances. The detector aperture is dimensioned so that the virtual image of the detector aperture has the area required by the standard.

Abstract translation: 用于在不同距离条件下用检测器测量LED的输出的装置，而不需要LED或检测器的移动。 本发明的示例性实施例实现CIE 127中规定的测试条件，允许在100mm和316mm的指定距离处确定平均LED强度，同时保持LED和检测器之间的物理距离固定在较短距离100 mm。 该示例性实施例包括可以选择性地插入到LED和检测器之间的光路中的光学元件，以使分离看起来是两个距离中的更长的距离。 光学元件包括透镜组件和检测器孔径，其在两个距离的较长时间产生检测器孔径的虚拟图像。 检测器孔径的尺寸使得检测器孔的虚像具有标准要求的面积。

公开(公告)号：US4859847A

公开(公告)日：1989-08-22

申请号：US184986

申请日：1988-04-22

Applicant: Takeshi Matsuno ,  Kazuo Iwata

Inventor： Takeshi Matsuno ,  Kazuo Iwata

IPC: G02B7/00 ,  G11B7/08 ,  G11B7/09 ,  G11B7/13 ,  G11B7/22

CPC classification number: G11B7/0908 ,  G01J1/0462 ,  G11B7/08 ,  G11B7/22 ,  G11B7/13

Abstract: A device for the adjustment of photo detectors mounted on an optical head base for adjusting the position of a photo detector in a direction of an optic axis of a light beam and in a plane perpendicular to said optic axis, comprises a movable plate able to move relative to the optical head base in a plane perpendicular to the optic axis of a light beam, a base plate able on which the photo detector is fixed, the base plate having a first end fixed to the movable plate, being able to bend to the direction of the optic axis and being fixed to the movable plate, and an adjusting screw extending through the base plate and threaded into the movable plate for bending the base plate toward the movable plate.

Abstract translation: 一种用于调整安装在光学头基座上用于调节光检测器在光束的光轴方向上并且与垂直于所述光轴垂直的平面中的位置的光检测器的装置包括能够移动 相对于在与光束的光轴垂直的平面中的光头基座，能够固定光电检测器的基板，所述基板具有固定到可动板的第一端，能够弯曲到 光轴的方向并被固定到可动板上，以及调节螺钉，其延伸穿过基板并被拧入可动板中，用于将基板朝向可动板弯曲。

公开(公告)号：US20240201010A1

公开(公告)日：2024-06-20

申请号：US18529692

申请日：2023-12-05

Applicant: Life Safety Distribution GmbH

Inventor： Janmejaya Tripathy ,  Sumit Suresh Kulkarni ,  Ranjith Narayanan R

IPC: G01J1/02 ,  G01J1/04 ,  G01J1/44 ,  G08B17/12

CPC classification number: G01J1/0295 ,  G01J1/0414 ,  G01J1/0433 ,  G01J1/0451 ,  G01J1/0462 ,  G01J1/44 ,  G08B17/125

Abstract: Methods, apparatuses and systems for sensing are disclosed herein. An example sensor may include an omnidirectional reflector, a calibration source located inside the omnidirectional reflector and configured to generate one or more calibration beams, a first filter configured to filter one or more first beams including any of a first portion of the incoming beams collected and concentrated by the omnidirectional reflector, and a first detector configured to detect the filtered one or more first beams.

公开(公告)号：US09500516B2

公开(公告)日：2016-11-22

申请号：US14658376

申请日：2015-03-16

Applicant: Masdar Institute of Science and Technology

Inventor： Peter Ross Armstrong ,  Ragini Kalapatapu ,  Matteo Chiesa

IPC: G01J1/02 ,  G01J1/04 ,  G01J1/42 ,  G01J1/06 ,  G01W1/10

CPC classification number: G01J1/0271 ,  G01J1/0214 ,  G01J1/0252 ,  G01J1/0266 ,  G01J1/0403 ,  G01J1/0437 ,  G01J1/0462 ,  G01J1/06 ,  G01J1/42 ,  G01J2001/4266 ,  G01W1/10

Abstract: The invention in some aspects relates to radiometers and related methods of use. In some aspects of the invention, methods are provided for determining a circumsolar profiles at external locations of interest, e.g., at a solar power generation system installation site.

Abstract translation: 本发明在某些方面涉及辐射计和相关的使用方法。 在本发明的一些方面，提供了用于确定例如在太阳能发电系统安装地点的感兴趣的外部位置处的环形轮廓的方法。

公开(公告)号：US20160146664A1

公开(公告)日：2016-05-26

申请号：US14945507

申请日：2015-11-19

Applicant: Heraeus Noblelight America LLC

Inventor： Keith Andrew Helms ,  Timothy Allan Dombkowski ,  James Robert Elliott

IPC: G01J1/42 ,  B05D3/06 ,  G01J1/02

CPC classification number: G01J1/429 ,  B05D3/061 ,  G01J1/0271 ,  G01J1/0403 ,  G01J1/0414 ,  G01J1/0437 ,  G01J1/0448 ,  G01J1/0462

Abstract: A photo-detector device may include a substrate having a bottom surface. The photo-detector device may further include a photocell secured to the bottom surface of the substrate. The photo-detector device may further include a metallic block having a top portion secured to a bottom surface of the substrate to enclose the photocell, wherein an opening is formed within the metallic block that extends from the top portion of the metallic block to a bottom portion of the metallic block to form an aperture for light to travel through the metallic block to the photocell. The photo-detector device may further include a member insertable into the metallic block to vary an open area of the aperture.

Abstract translation: 光检测器装置可以包括具有底表面的基底。 光检测器装置还可以包括固定到基底的底表面的光电池。 光检测器装置还可以包括金属块，其具有固定到基板的底表面以封闭光电池的顶部部分，其中在金属块内形成有从金属块的顶部延伸到底部的开口 金属块的一部分以形成用于光穿过金属块到光电池的孔。 光检测器装置还可以包括可插入到金属块中以改变开口面积的构件。

公开(公告)号：US09347823B2

公开(公告)日：2016-05-24

申请号：US14166796

申请日：2014-01-28

Applicant: National Institute of Metrology, P.R.China

Inventor： Ruoduan Sun

IPC: G01J1/10 ,  G01J1/02 ,  G01J3/02 ,  G01J1/04

CPC classification number: G01J1/0295 ,  G01J1/0437 ,  G01J1/0462 ,  G01J3/0229 ,  G01J3/0254 ,  G01J3/0297

Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.

公开(公告)号：US20150009501A1

公开(公告)日：2015-01-08

申请号：US14166796

申请日：2014-01-28

Applicant: NATIONAL INSTITUTE OF METROLOGY, P.R.CHINA

Inventor： Ruoduan Sun

IPC: G01J1/02 ,  G01J3/02

CPC classification number: G01J1/0295 ,  G01J1/0437 ,  G01J1/0462 ,  G01J3/0229 ,  G01J3/0254 ,  G01J3/0297

Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.

Abstract translation: 本发明公开了一种用于测量非线性误差绝对值的方法及其装置。 该方法包括：同时将N个反射板连接在光学测量仪器的采样端口处，其中每个反射板在采样端口具有相同的覆盖区域; 沿着光学测量仪器的光路放置孔; 根据需要测量非线性误差的光学测量仪器的测量范围中的位置调整使用的反射板数量; 在调整好的反射板被放置在采样端口之后，进行每次调整后获得输出结果; 对输出结果执行非线性误差的计算处理; 并获取光学测量仪器的输出结果的非线性误差。

公开(公告)号：US08759777B2

公开(公告)日：2014-06-24

申请号：US13342696

申请日：2012-01-03

Applicant: Koon-Wing Tsang ,  Cheng-Chieh Huang ,  Sheng-Wen Huang ,  Jinn-Ann Kuo

Inventor： Koon-Wing Tsang ,  Cheng-Chieh Huang ,  Sheng-Wen Huang ,  Jinn-Ann Kuo

IPC: G01J5/02

CPC classification number: G01J1/0462 ,  G01J1/0204 ,  G01J1/0437 ,  G01J1/06 ,  G01J1/4204 ,  G01J1/4228 ,  G01J2001/4247 ,  G01J2001/4266

Abstract: An infrared light detecting device and the infrared detecting method thereof. The device comprises a shield, a first photo detector and a second photo detector. The shield for blocking light is located above the first photo detector and the second photo detector. An opening is disposed on the shield above the first photo detector. In addition, there is a gap arranged between the first photo detector and the second photo detector. The first photo detector can detect the light passing through the opening to generate a photo sensing signal and couple an infrared light signal in the photo sensing signal to the second photo detector in order to output the infrared light signal.

Abstract translation: 一种红外光检测装置及其红外线检测方法。 该装置包括屏蔽件，第一光电检测器和第二光电检测器。 用于阻挡光的屏蔽位于第一光电检测器和第二光电检测器的上方。 一个开口设置在第一光电检测器上方的屏蔽上。 此外，在第一光电检测器和第二光电检测器之间存在间隙。 第一光检测器可以检测通过开口的光以产生光感测信号，并将感光信号中的红外光信号耦合到第二光检测器，以输出红外光信号。

公开(公告)号：US20110222041A1

公开(公告)日：2011-09-15

申请号：US12723401

申请日：2010-03-12

Applicant: Yasuyuki Unno

Inventor： Yasuyuki Unno

IPC: G03B27/72 ,  G01J1/20

CPC classification number: G03B27/72 ,  G01J1/0462 ,  G03F7/70666 ,  G03F7/7085

Abstract: An apparatus which can measure an aerial image is provided. The apparatus includes an aperture configured to transmit light of the aerial image, a detector configured to detect the transmitted light at a plurality of first relative positions to the aperture, a controller configured to control a second relative position of the aperture to the aerial image, and a processor configured to generate information about the aerial image based on data obtained from the detector at each first relative position by controlling the second relative position of the aperture and position data about the first relative positions.

Abstract translation: 提供了可以测量空中图像的装置。 该装置包括被配置为透射空中图像的光的孔，被配置为检测与孔的多个第一相对位置处的透射光的检测器，被配置为控制孔与空间图像的第二相对位置的控制器， 以及处理器，被配置为基于通过控制孔的第二相对位置和关于第一相对位置的位置数据，在每个第一相对位置处基于从检测器获得的数据来生成关于空中图像的信息。