公开(公告)号：US12125662B2

公开(公告)日：2024-10-22

申请号：US17657692

申请日：2022-04-01

Applicant: GE Precision Healthcare LLC

Inventor： John M Boudry ,  Ryan J Lemminger ,  Adam Israel Cohen ,  Jean-Francois Larroux

IPC: H01J35/14 ,  A61B6/03 ,  A61B6/40 ,  G01N23/046

CPC classification number: H01J35/153 ,  A61B6/032 ,  A61B6/4028 ,  G01N23/046 ,  H01J35/147 ,  H01J2235/086

Abstract: Systems/techniques that facilitate correction of intra-scan focal-spot displacement are provided. In various embodiments, a system can access a first gantry angle of a medical scanner. In various aspects, the system can determine a first displacement of a focal-spot of the medical scanner based on the first gantry angle, by referencing a mapping that correlates gantry angles to focal-spot displacements. In various instances, the system can compensate, via one or more focal-spot position adjusters of the medical scanner, for the first displacement.

公开(公告)号：US12106927B2

公开(公告)日：2024-10-01

申请号：US18509608

申请日：2023-11-15

Applicant: CANON ANELVA CORPORATION

Inventor： Yoichi Ando

IPC: H01J35/14 ,  H01J35/08 ,  H01J35/16 ,  H01J35/24 ,  G01N23/046

CPC classification number: H01J35/153 ,  H01J35/116 ,  H01J35/16 ,  H01J35/24 ,  G01N23/046 ,  H01J35/112

Abstract: An X-ray imaging apparatus includes an X-ray generation apparatus including an X-ray generation tube having an electron gun and a target configured to receive an electron beam from the electron gun to generate X-rays, a support structure supporting the tube, and a deflector configured to deflect the electron beam, an X-ray detector configured to detect the X-rays from the X-ray generation apparatus, and a control apparatus configured to control the X-ray generation apparatus. The support structure supports the tube to permit at least the target to be pivoted in a state in which the deflector is fixed, and the control apparatus determines, based on use amount of the X-ray generation apparatus and/or change of the X-rays generated by the X-ray generation apparatus, whether it is necessary to pivot the target.

公开(公告)号：US12080508B2

公开(公告)日：2024-09-03

申请号：US17628615

申请日：2020-07-21

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Rolf Karl Otto Behling ,  Steffen Holzapfel

IPC: H01J35/10 ,  H01J35/14 ,  H01J35/30

CPC classification number: H01J35/153 ,  H01J35/10 ,  H01J35/30 ,  H01J2235/088

Abstract: An X-ray source (100) for generating X-ray radiation of first and second energy spectra is proposed, wherein the X-ray intensity imbalance between the first and second energy spectra is reduced as compared to conventional X-ray sources. The reduction of the X-ray intensity imbalance is achieved by configuring a smaller electron impact angle (141) onto the anode (102) when the higher tube voltage is applied as compared to when the lower tube voltage is applied.

公开(公告)号：US20240285976A1

公开(公告)日：2024-08-29

申请号：US18587377

申请日：2024-02-26

Applicant: AcceleRAD Technologies, Inc.

Inventor： Curtis Allen

IPC: A61N5/10 ,  H01J35/14

CPC classification number: A61N5/1077 ,  H01J35/153

Abstract: Vacuum electron devices (VEDs) include an electron accelerator that generates an electron beam from an electron source along a central axis. Targets are arranged on a circular arc and generate photons upon impact by the electron beam. A controllable magnetic field generator generates a magnetic field to change a trajectory of the electron beam, including a first field region that causes the electron beam to diverge from the central axis and a second field region that causes the electron beam to converge toward the central axis to impact a selected target.

公开(公告)号：US20240282545A1

公开(公告)日：2024-08-22

申请号：US18571485

申请日：2022-03-09

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Naonobu SUZUKI ,  Atsushi ISHII ,  Ryosuke YABUSHITA ,  Akimichi SHIMIZU ,  Naofumi KOSUGI ,  Ginji SUGIURA

IPC: H01J35/18 ,  H01J35/14 ,  H01J35/30

CPC classification number: H01J35/18 ,  H01J35/153 ,  H01J35/30

Abstract: An X-ray generation device includes an X-ray tube, and an electron beam adjustment part. The X-ray tube includes a housing, an electron gun, a target, and a window member. When a first defect exists in the target, the electron beam adjustment part adjusts an electron beam such that the first defect is not included in an irradiation region of the electron beam on the target, and when a second defect exists in the window member, the electron beam adjustment part adjusts the electron beam such that the second defect is not included in a projection region of the electron beam on the window member.

公开(公告)号：US11892576B2

公开(公告)日：2024-02-06

申请号：US18155314

申请日：2023-01-17

Applicant: Excillum AB

Inventor： Per Takman ,  Tomi Tuohimaa ,  Ulf Lundström

IPC: H01J35/14 ,  H05G1/52 ,  G01T1/34

CPC classification number: G01T1/34 ,  H01J35/153 ,  H05G1/52 ,  H01J2235/082

Abstract: A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also, a corresponding liquid metal jet X-ray source.

公开(公告)号：US20230317398A1

公开(公告)日：2023-10-05

申请号：US17657692

申请日：2022-04-01

Applicant: GE Precision Healthcare LLC

Inventor： John M Boudry ,  Ryan J Lemminger ,  Adam Israel Cohen ,  Jean-Francois Larroux

IPC: H01J35/14 ,  A61B6/00 ,  A61B6/03 ,  G01N23/046

CPC classification number: H01J35/153 ,  A61B6/4028 ,  A61B6/032 ,  H01J35/147 ,  G01N23/046 ,  H01J2235/086

Abstract: Systems/techniques that facilitate correction of intra-scan focal-spot displacement are provided. In various embodiments, a system can access a first gantry angle of a medical scanner. In various aspects, the system can determine a first displacement of a focal-spot of the medical scanner based on the first gantry angle, by referencing a mapping that correlates gantry angles to focal-spot displacements. In various instances, the system can compensate, via one or more focal-spot position adjusters of the medical scanner, for the first displacement.

公开(公告)号：US11769647B2

公开(公告)日：2023-09-26

申请号：US17453036

申请日：2021-11-01

Applicant: Carl Zeiss X-ray Microscopy, Inc.

Inventor： Claus Flachenecker ,  Bruce Borchers

IPC: H01J35/14 ,  H01J35/18 ,  H01J35/12

CPC classification number: H01J35/13 ,  H01J35/153 ,  H01J35/18

Abstract: During operation of a reflection target x-ray source, heat must be removed from many components. The electron beam must be steered to the target and may interact with structures along this path. There is also heat generated in the target itself. This can be excessive, since only a very small percentage of the electron beam's energy is transformed into x-rays. Finally, the x-rays must exit the vacuum through the window, which can also be heated both by the x-rays, reflected electrons, and radiant heat from the target. A water cooled reflective x-ray source provides for water or other fluid cooling of the centering aperture, x-ray target, and/or exit window.

公开(公告)号：US11715617B2

公开(公告)日：2023-08-01

申请号：US17407748

申请日：2021-08-20

Applicant: Arizona Board of Regents on behalf of Arizona State University

Inventor： William Graves ,  Mark Holl

IPC: H01J35/14 ,  H05G1/02 ,  H05G1/28 ,  H05G1/52 ,  H04N5/32

CPC classification number: H01J35/153 ,  H05G1/02 ,  H05G1/28 ,  H05G1/52 ,  H01J2235/08 ,  H04N5/32

Abstract: Some embodiments of the present disclosure provide a method that includes colliding a laser with an electron beam to produce backscattered x-rays while the electron beam is traversing a circular arc. This backscattering process is inverse Compton scattering (ICS). ICS x-rays are emitted in the same direction as the electrons. Because this ICS direction is changing as a function of time, the position of the x-ray beam on a detector will change depending on the timing of electron/laser collision. This position change is easily detected and converted to a timing measurement sensitive at the femtosecond scale, converting a very difficult timing measurement of laser pulse, electron pulse, and x-ray pulse synchronization into a simple and robust position measurement.

公开(公告)号：US20240339283A1

公开(公告)日：2024-10-10

申请号：US18748076

申请日：2024-06-19

Applicant: VEC Imaging GmbH & Co. KG ,  Varex Imaging Corporation

Inventor： Houman Jafari ,  Bo Gao ,  Vance Scott Robinson

IPC: H01J35/14 ,  H01J35/06 ,  H01J35/08 ,  H01J35/12 ,  H05G1/02

CPC classification number: H01J35/153 ,  H01J35/112 ,  H01J35/12 ,  H01J35/064 ,  H01J2235/068 ,  H01J2235/086 ,  H05G1/02

Abstract: Some embodiments include a system, comprising: at least one x-ray source, each x-ray source including: an electron source configured to generate an electron beam; and a target configured to receive the electron beam and convert the electron beam into an x-ray beam; and a collimator. A first edge of the collimator closest to the electron source is closer to the electron source than a central axis of the x-ray beam before entering the collimator; and a second edge of the collimator opposite to the first edge is at the central axis of the x-ray beam before entering the collimator or closer to the electron source than the central axis of the x-ray beam before entering the collimator.