公开(公告)号：US20040094696A1

公开(公告)日：2004-05-20

申请号：US10363755

申请日：2003-07-22

Inventor： Roberto Ramirez-Iniguez ,  Roger Green

IPC: H01J003/14 ,  G01J001/42

CPC classification number: G02B5/288 ,  G02B6/241 ,  G02B19/0028 ,  G02B19/008 ,  G02B19/009 ,  H04B10/11 ,  H04B10/1121

Abstract: An optical wireless communication receiver comprises a dielectric totally internally reflecting concentrator (DTIRC) (1) having a convexly curved receiving surface (2) for receiving incident radiation over a wide field-of-view and a concavely curved side surface (3) from which radiation passing through the receiving surface is totally internally reflected towards a detection surface (4). A narrowband optical filter (6) is provided for filtering the radiation before it reaches the detection surface (4), and a photodetector serves to detect the radiation reaching the detection surface (4) and to provide an electrical output signal indicative of the radiation detected. Such an arrangement offer higher concentration and allows the use of small photodetectors which reduces the capacitance and the cost and improves receiver sensitivity.

Abstract translation: 光学无线通信接收机包括具有凸形弯曲的接收表面（2）的电介质全内反射集中器（DTIRC）（1），用于在宽视场和凹曲面侧表面（3）上接收入射辐射， 通过接收表面的辐射被全部内部反射到检测表面（4）。 提供窄带滤光器（6），用于在辐射到达检测表面（4）之前对辐射进行滤波，并且光电检测器用于检测到达检测表面（4）的辐射，并提供指示检测到的辐射的电输出信号 。 这种布置提供更高的浓度并且允许使用小的光电探测器，这降低了电容和成本并提高了接收器的灵敏度。

公开(公告)号：US20040061849A1

公开(公告)日：2004-04-01

申请号：US10671311

申请日：2003-09-25

Inventor： Hiroshi Kubota

IPC: G01J001/42

CPC classification number: G01J1/02 ,  G01J1/0266 ,  G01J1/4257

Abstract: An optical power measuring apparatus for successively measuring optical power in a time series and displaying a time axis change of the measurement values as a measurement screen fixedly displays the latest measurement value of optical power on the measurement screen, and improves a working factor of an optical axis adjustment.

Abstract translation: 用于连续测量时间序列中的光功率并显示作为测量屏幕的测量值的时间轴变化的光功率测量装置在测量屏幕上固定地显示光功率的最新测量值，并提高光学功率的工作系数 轴调整。

公开(公告)号：US20040042000A1

公开(公告)日：2004-03-04

申请号：US10230756

申请日：2002-08-29

Applicant: Texas Instruments Incorporated

Inventor： David Joseph Mehrl ,  Kun Cindy Pan ,  Mark Henry Strumpell ,  Rand Derek Carr

IPC: G01J001/42

CPC classification number: G02B26/0833 ,  G01M11/005

Abstract: A method and system for measuring the temporal response of a micromirror array to a variety of driving signals. A micromirror array is illuminated with a coherent light source so that a diffraction pattern is reflected from the micromirror array. One or more photodetectors are aligned with spots of light in the diffraction pattern that correspond to orders of the diffraction pattern. Diffraction pattern theory predicts that the intensity of these spots of light will vary as the tilt angle of the micromirrors is changed. Thus, by measuring the relative intensity of the spots of light as the micromirror array is provided with a variety of driving signals, many performance characteristics of the micromirror array can be measured. Some of these characteristics include the impulse response, the forced resonant frequency (i.e. the natural frequency), the damped resonant frequency, the quality factor of the micromirror response, the damping factor of the micromirror response, and the frequency transfer function. According to another aspect of the invention, the electromechanical compliance of the micromirrors in the micromirror array can also be measured. It is further contemplated that all of these measurements can be localized to specific regions on the surface of the micromirror array so that the variance of different characteristics across its surface can be analyzed. Another aspect of the disclosed invention is the measurement of the tilt angle of the micromirror array at a non-biased state.

Abstract translation: 一种用于测量微镜阵列对各种驱动信号的时间响应的方法和系统。 用相干光源照射微镜阵列，使得衍射图案从微镜阵列反射。 将一个或多个光电检测器与衍射图中的光点对准，其对应于衍射图案的顺序。 衍射图案理论预测，这些光点的强度将随着微镜的倾斜角度的变化而变化。 因此，通过在微镜阵列具有各种驱动信号的情况下测量光斑的相对强度，可以测量微镜阵列的许多性能特性。 这些特性中的一些包括脉冲响应，强制谐振频率（即固有频率），阻尼谐振频率，微镜响应的质量因子，微镜响应的阻尼因子和频率传递函数。 根据本发明的另一方面，还可以测量微镜阵列中的微反射镜的机电顺应性。 进一步预期，所有这些测量可以被定位到微镜阵列的表面上的特定区域，使得可以分析其表面上的不同特征的变化。 所公开的发明的另一方面是在非偏置状态下测量微镜阵列的倾斜角度。

公开(公告)号：US20030057363A1

公开(公告)日：2003-03-27

申请号：US09749286

申请日：2000-12-26

Inventor： Gene R. Anderson ,  Marcelino G. Armendariz ,  Robert P. Bryan ,  Richard F. Carson ,  Edwin B. Duckett III ,  Shanalyn Adair Kemme ,  Frederick B. McCormick ,  John A. Nevers ,  David W. Peterson

IPC: G02F001/01 ,  G01J001/42

CPC classification number: G02B6/4277 ,  G02B6/4201 ,  G02B6/421 ,  G02B6/4221 ,  G02B6/4239 ,  G02B6/4249 ,  G02B6/4292 ,  H05K1/189

Abstract: An optical power control system is provided that may be used in connection with an optical transmitter, receiver or transceiver module. The optical power control system comprises: (1) an array of optoelectronic devices; (2) an array of optical elements; (3) the array of optical elements optically aligned to the array of optoelectronic devices in such a manner that one or more optical elements is optically aligned to one or more optoelectronic devices; (4) a light-receiving device; and (5) a reflector proximate to the array of optical elements, the reflector optically orientated with the array of optoelectronic devices and the light-receiving device such that some emission from at least one optoelectronic device is reflected on at least a portion of the light-receiving device. The optical elements may be optical fibers and may be packaged in a ferrule. The light-receiving device may be a photo-detector or a light pipe. A feedback loop connects the light-receiving device to the array of optoelectronic devices so as to adjust the output of the array of optoelectronic devices in response to the emission detected by the light-receiving device. The reflector scatters the emission from the optoelectronic device, and it may be adapted to a bottom surface of a ferrule. In another embodiment, optical resin is dispensed proximate to the array of optoelectronic devices and light-receiving device. Emission from at least one optoelectronic device is reflected onto the light-receiving device by the optical resin.

Abstract translation: 提供了可以与光发射器，接收器或收发器模块结合使用的光功率控制系统。 光功率控制系统包括：（1）一组光电器件; （2）光学元件阵列; （3）以与一个或多个光电子器件光学对准的方式使光学元件光学对准的光学元件阵列; （4）光接收装置; 和（5）靠近所述光学元件阵列的反射器，所述反射器利用所述光电子器件阵列和所述光接收装置光学取向，使得来自至少一个光电子器件的某些发射在所述光的至少一部分上被反射 接收装置 光学元件可以是光纤，并且可以封装在套圈中。 光接收装置可以是光检测器或光管。 反馈环路将光接收装置连接到光电子器件阵列，以响应于光接收装置检测到的发射来调节光电子器件阵列的输出。 反射器散射来自光电子器件的发射，并且其可以适应于套圈的底表面。 在另一个实施例中，将光学树脂分配到靠近光电子器件阵列和光接收装置的位置。 来自至少一个光电子器件的发射通过光学树脂反射到光接收装置上。

公开(公告)号：US20030025903A1

公开(公告)日：2003-02-06

申请号：US10208265

申请日：2002-07-30

Inventor： Johann Mitterreiter

IPC: G01J001/42

CPC classification number: G01D5/34738

Abstract: A position measuring system that includes a graduation support having a first detent and a detector arrangement on a holder for scanning the graduation support at a preset scanning distance. An adjusting device that sets the preset scanning distance, the adjusting device is displaceable relative to the holder along a first direction from a mounting position to an operating position. The adjusting device includes a second detent which, in the mounting position, acts together with the first detent of said graduation support acting in the first direction, and the first and second detents are out of engagement at the operating position and a receiver which, at the mounting position, maintains the graduation support oriented perpendicularly with respect to the first direction, and the receiver is removed from the graduation support by being displaced in the first direction. A coupling element that couples the adjusting device free of play with the holder at least in a second direction perpendicular with respect to the first direction.

Abstract translation: 一种位置测量系统，其包括具有第一制动器和在保持器上的检测器装置的刻度支撑件，用于以预设扫描距离扫描刻度支撑件。 一种调节装置，其设定预设的扫描距离，所述调节装置可相对于所述保持器沿着从安装位置到操作位置的第一方向移位。 所述调节装置包括第二制动器，所述第二制动器在所述安装位置与所述分度支架的沿所述第一方向作用的所述第一制动器一起作用，并且所述第一和第二制动器在所述操作位置脱离接合， 安装位置保持相对于第一方向垂直定向的刻度支撑，并且通过沿第一方向移位接收器从刻度支撑件移除。 至少在相对于所述第一方向垂直的第二方向上将所述调节装置与所述保持器无接触的联接元件。

公开(公告)号：US20030025068A1

公开(公告)日：2003-02-06

申请号：US10207855

申请日：2002-07-31

Applicant: National Research Council of Canada

Inventor： Lorenzo Gonzo ,  Andrea Simoni ,  Massimo Gottardi ,  J. Angelo Beraldin

IPC: G01J001/42

CPC classification number: G01J1/02 ,  G01C3/08 ,  G01C15/006 ,  G01J1/0228 ,  G01J1/4228 ,  G01J3/51 ,  G01J3/513

Abstract: A position and color detection sensor (for detecting a position of a light spot in a light distribution that can include stray light components, e.g. from other lasers, ambient lighting etc.) includes two discrete response position sensitive detectors (DRPSDs). The first DRPSD is used to calculate a raw estimate of the spot position and the second DRPSD is used to calculate the actual spot position based on information from the first DRPSD. Color is supported by further dividing each pixel of the first DRPSD into elementary photocells, each one covered with an appropriate optical filter. The use of two DRPSDs differing in pixel geometries makes them suitable for integration on the same chip using the same process. This reduces production and alignment costs. Further, analogue microelectronic processes can be used for color filter deposition and simple optics can be used for beam splitting and shaping.

Abstract translation: 位置和颜色检测传感器（用于检测光分布中的光斑的位置，其可以包括诸如来自其他激光器的杂散光分量，环境照明等）包括两个离散的响应位置敏感检测器（DRPSD）。 第一个DRPSD用于计算点位置的原始估计，第二个DRPSD用于基于来自第一个DRPSD的信息计算实际点位置。 通过将第一DRPSD的每个像素进一步划分为基本光电池来支持颜色，每个像素覆盖有适当的滤光器。 使用两个像素几何不同的DRPSD，使得它们适用于使用相同工艺在同一芯片上进行集成。 这降低了生产和校准成本。 此外，模拟微电子工艺可以用于滤色器沉积，并且简单的光学器件可以用于分束和成形。

公开(公告)号：US20020148969A1

公开(公告)日：2002-10-17

申请号：US09992321

申请日：2001-11-19

Inventor： Angelo Karavolos

IPC: G01T001/00 ,  G01J001/42

CPC classification number: G01T3/08

Abstract: Described are preferred devices and systems useful in the non-destructive detection of predetermined substances, such as plastique explosives, in objects under interrogation. The devices and systems are readily constructed and can be manufactured as self-contained, portable detection devices.

Abstract translation: 描述的是用于在询问对象中的非破坏性检测诸如塑性炸药之类的预定物质的优选装置和系统。 设备和系统容易构造，并且可以被制造为独立的便携式检测装置。

公开(公告)号：US20020125439A1

公开(公告)日：2002-09-12

申请号：US10086759

申请日：2002-02-28

Applicant: British Nuclear Fuels PLC

Inventor： John Thomas Caldwell ,  Stephanie Ann Jones ,  Matthew Robert Newell

IPC: G01T001/00 ,  G01J001/42

CPC classification number: G01T1/167 ,  G01T3/00 ,  G01T7/00

Abstract: The invention provides a technique for correcting gamma ray intensities detected to account for variation in attenuation effects with energy. The corrected intensity values enable more accurate isotopic analysis to be conducted and render such techniques applicable to low level emission cases. The technique is particularly useful in investigate waste materials with a gamma emitting content which needs to be determined. The attenuation is corrected for using a bi- modal function to account for the attenuation effects arising from low and high atomic mass components of the material in which the emitters are present.

Abstract translation: 本发明提供一种用于校正被检测的伽马射线强度以解决能量衰减效应变化的技术。 校正的强度值使得能够进行更精确的同位素分析，并使此类技术适用于低水平排放情况。 该技术在研究需要确定的具有γ发射含量的废料方面特别有用。 校正衰减以使用双模函数来解释由发射体存在的材料的低原子质量分量和高原子质量分量引起的衰减效应。

公开(公告)号：US20020121608A1

公开(公告)日：2002-09-05

申请号：US10098975

申请日：2002-03-15

Inventor： Richard L. Sandstrom ,  Alexander I. Ershov ,  William N. Partlo ,  Igor V. Fomenkov ,  Scott T. Smith ,  Daniel J. W. Brown

IPC: G01J001/42

CPC classification number: G01J3/26 ,  G01J1/4257 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/12 ,  G01J3/1804 ,  G01J3/22 ,  G01J9/02

Abstract: A high resolution spectral measurement device. A preferred embodiment presents an extremely narrow slit function in the ultraviolet range and is very useful for measuring bandwidth of narrow-band excimer lasers used for integrated circuit lithography. Light from the laser is focused into a diffuser and the diffused light exiting the diffuser illuminates an etalon. A portion of its light exiting the etalon is collected and directed into a slit positioned at a fringe pattern of the etalon. Light passing through the slit is collimated and the collimated light illuminates a grating positioned in an approximately Littrow configuration which disburses the light according to wavelength. A portion of the dispursed light representing the wavelength corresponding to the selected etalon fringe is passed through a second slit and monitored by a light detector. When the etalon and the grating are tuned to the same precise wavelength a slit function is defined which is extremely narrow such as about 0.034 pm (FWHM) and about 0.091 pm (95 percent integral). The bandwidth of a laser beam can be measured very accurately by a directing portion of the laser beam into the insulator and scanning the laser wavelength over a range which includes the monochromator slit wavelength. In a second embodiment the second slit and the light detector is replaced by a photodiod array and the bandwidth of a laser beam is determined by analyzing a set of scan data from the photodiode array. Alternately, the laser wavelength can be fixed near the middle of the spectrum range of the grating spectrometer, and the etalon can be scanned.

Abstract translation: 高分辨率光谱测量装置。 优选的实施例在紫外线范围内呈现非常窄的狭缝功能，并且对于测量用于集成电路光刻的窄带准分子激光器的带宽是非常有用的。 来自激光的光被聚焦成漫射器，并且离开扩散器的漫射光照射标准具。 将其从标准具出射的光的一部分收集并引导到位于标准具的边缘图案处的狭缝中。 通过狭缝的光线被准直，并且准直光照射位于大约Littrow配置中的光栅，其根据波长散发光。 表示对应于所选择的标准具条纹的波长的调度光​​的一部分通过第二狭缝并由光检测器监视。 当标准具和光栅调谐到相同的精确波长时，定义狭缝功能，其极窄，例如约0.034μm（FWHM）和约0.091μm（95％积分）。 通过激光束的引导部分进入绝缘体并且在包括单色器狭缝波长的范围内扫描激光波长，可以非常精确地测量激光束的带宽。 在第二实施例中，第二狭缝和光检测器由光电二极管阵列替代，并且通过分析来自光电二极管阵列的一组扫描数据来确定激光束的带宽。 或者，激光波长可以固定在光栅光谱仪的光谱范围附近，可以扫描标准具。

公开(公告)号：US20020117608A1

公开(公告)日：2002-08-29

申请号：US10035163

申请日：2002-01-04

Inventor： Shigeki Ogura

IPC: G01J001/04 ,  G01J001/42

CPC classification number: G01D5/35303 ,  G01L1/246

Abstract: A strain sensor has a fiber Bragg grating fastened in a one-quarter circular arc to the strain sensing section of a strain sensor member. One end of the fiber Bragg grating is aligned in the longitudinal direction of the strain sensing section, while the other end is aligned at a right angle to the longitudinal direction. When longitudinal stress is applied, the fiber Bragg grating is elongated at one end and compressed at the other end, creating a high degree of chirp, thereby enabling strain to be measured with high sensitivity. The sensitivity is determined partly by Poisson's ratio, and thus is not limited by geometrical constraints on the strain sensing section.

Abstract translation: 应变传感器具有光纤布拉格光栅，其以四分之一圆弧形状紧固到应变传感器部件的应变感测部分。 纤维布拉格光栅的一端在应变检测部的长度方向上排列，而另一端与长度方向成直角对准。 当施加纵向应力时，光纤布拉格光栅在一端伸长并在另一端被压缩，产生高度的啁啾声，从而使应变以高灵敏度被测量。 灵敏度部分由泊松比确定，因此不受应变感测部分的几何约束的限制。