公开(公告)号：US20190221991A1

公开(公告)日：2019-07-18

申请号：US16161902

申请日：2018-10-16

Applicant: Lumentum Operations LLC

Inventor： Tobyn VANVEGHTEN ,  Joseph J. ALONIS ,  James J. MOREHEAD ,  Loren A. EYRES

IPC: H01S3/11 ,  H01S3/094 ,  H01L25/16 ,  H01L27/146 ,  G01J11/00

CPC classification number: H01S3/1127 ,  G01J11/00 ,  H01L25/167 ,  H01L27/14643 ,  H01S3/094076

Abstract: A device may determine at least one metric related to a plurality of laser pulses associated with a Q-switched laser. The device may determine a statistical metric for the at least one metric related to the plurality of laser pulses. The device may determine that the statistical metric satisfies a threshold level of deviation of the at least one metric related to the plurality of laser pulses from a baseline value for the at least one metric. The device may indicate laser degradation of the Q-switched laser based on determining that the statistical metric satisfies the threshold.

公开(公告)号：US10107692B2

公开(公告)日：2018-10-23

申请号：US15319267

申请日：2015-06-15

Applicant: COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES

Inventor： Fabien Quere ,  Valentin Gallet ,  Gustave Pariente

IPC: G01J11/00 ,  G01J3/453

Abstract: A characterization method of a light beam includes separating the light beam into first and second sub-beams; propagating the first and second sub-beams over first and second optics respectively; the first sub-beam, which forms a reference beam, and the second sub-beam, which forms a characterized beam, being separated by a time delay τ; recombining the reference and characterized beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the pattern to obtain a temporal interferogram; calculating the Fourier transform in the frequency domain of a spatial point of the interferogram, the Fourier transform having a frequency central peak and first and second frequency side peaks; calculating the Fourier transform in the frequency domain for the first or second time side peaks calculating the spectral amplitude and the spatial-spectral phase for the first or second frequency side peak of the Fourier transform in the frequency domain.

公开(公告)号：US20180266891A1

公开(公告)日：2018-09-20

申请号：US15982303

申请日：2018-05-17

Applicant: Institute for Basic Science ,  Gwangju Institute of Science and Technology

Inventor： Kyung-Taec KIM ,  Chang-Hee Nam ,  Seung-Beom Park ,  Wo-Sik Cho ,  Kyung-Seung Kim

IPC: G01J11/00 ,  G01J9/02 ,  G02B27/14

Abstract: The present invention relates to a apparatus and method for measuring a waveform of a light wave. A light wave measurement apparatus according to an embodiment of the present invention includes a pulse separation unit to separate an input light wave into a fundamental pulse and a signal pulse, a time delay adjustment unit to adjust a time delay between the fundamental pulse and the signal pulse, a focusing unit to focus the fundamental pulse and the signal pulse whose time delay is adjusted on an ionization material, and an ionization yield measurement unit to measure an ionization yield from electrons and/or ions generated by the focused fundamental pulse and signal pulse. The waveform of the input light wave is obtained by obtaining an ionization yield modulation changed by the signal pulse as a function of the time delay.

公开(公告)号：US09909927B1

公开(公告)日：2018-03-06

申请号：US15189038

申请日：2016-06-22

Applicant: Lee E Estes ,  Stephen B Doyle

Inventor： Lee E Estes ,  Stephen B Doyle

IPC: G01N21/47 ,  G01J11/00

CPC classification number: G01N21/474 ,  G01J1/0214 ,  G01J1/06 ,  G01J3/0229 ,  G01J3/0262

Abstract: An attenuation meter is provided for use in a water environment. In operation, a transmitter of the meter transmits a laser pulse focused to a size at a predetermined range. A receiver of the meter images a focused spot to minimize unwanted light back scattering and avoid diffractive spreading within the back scattering region. Filtering the angular region can further reject scattered light. The filtered light is received, measured and processed by a oscilloscope as pulse averages. The meter also includes a photodetector to measure a diffuse attenuation coefficient. The output voltage of the photodetector is measured and processed by the oscilloscope that produces an average voltage over a preset number of pulses. A controller best fits voltage to time dependence to produce the diffuse attenuation coefficient. Only the shape of the receiver time dependence is required to provide the diffuse attenuation coefficient measurement.

公开(公告)号：US09816861B2

公开(公告)日：2017-11-14

申请号：US14920260

申请日：2015-10-22

Applicant: Deutsches Elektronen-Synchrotron DESY

Inventor： Matthew Streeter ,  Jens Osterhoff

IPC: G01J3/00 ,  G01J3/457 ,  G01J11/00 ,  H01S3/00 ,  G01J3/02

CPC classification number: G01J3/457 ,  G01J3/0205 ,  G01J11/00 ,  H01S3/0014 ,  H01S3/005 ,  H01S3/0092

Abstract: The invention relates to a device (2) and to a method for characterizing an ultrashort laser pulse. Furthermore, the invention relates to use of a self-contained optical assembly in a device (2) for characterizing an ultrashort laser pulse. The device (2) comprises an imaging optical element (4) configured to image the incident laser pulse (6) in a direction of a straight line (L). A first optical element (10) is configured to apply predetermined varying group delay dispersion on the line focused laser pulse. A non-linear optical element (14) is configured to generate a second harmonic laser pulse (30). An optical grating (20) generates a diffraction of the second harmonic laser pulse, which is imaged on a flat sensor (24). A processing unit (36) determines a best fit for the captured image thereby calculating a frequency spectrum and a spectral phase of the laser pulse.

公开(公告)号：US09755393B2

公开(公告)日：2017-09-05

申请号：US14369824

申请日：2012-11-14

Applicant: WAVELIGHT GMBH

Inventor： Klaus Vogler ,  Olaf Kittelmann ,  Matthias Foesel ,  Christof Donitzky

IPC: H01S3/00 ,  A61F9/008 ,  G01J11/00 ,  H01S3/106

CPC classification number: H01S3/0057 ,  A61F9/008 ,  A61F9/0084 ,  G01J11/00 ,  H01S3/106

Abstract: In certain embodiments, a system (10) comprises a laser source (20), one or more optical elements (24), a monitoring device (28), and a control computer (30). The laser source (20) emits one or more laser pulses. The optical elements (24) change a pulse length of the laser pulses, and the monitoring device (28) measures the pulse length of the laser pulses to detect the change in the pulse length. The control computer (30) receives the measured pulse length from the monitoring device (28), determines one or more laser parameters that compensate for the change in the pulse length, and controls the laser source (20) according to the laser parameters.

公开(公告)号：US09335213B2

公开(公告)日：2016-05-10

申请号：US14417968

申请日：2013-08-01

Applicant: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE

Inventor： Gargi Sharma ,  Kanwarpal Singh ,  Roberto Morandotti ,  Tsuneyuki Ozaki

IPC: G01J3/45 ,  G01J11/00 ,  G01J3/10 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/108 ,  G01J3/453 ,  G01J11/00

Abstract: A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898π can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (π/2).

Abstract translation: 一种基于频域干涉测量的方法和系统，用于检测强烈的THz电场，允许使用厚晶体进行光谱目的，以便对增加的光谱分辨率进行长时间扫描，并克服当前可用高度的过度旋转的限制 功率太赫兹源。 使用这种方法和系统，相位差约为8898＆pgr; 可以测量，比通过电光采样（＆pgr / 2）测量的相位差高18000倍。

公开(公告)号：US09323284B2

公开(公告)日：2016-04-26

申请号：US13124305

申请日：2009-10-14

Applicant: Mark Foster ,  Alexander Gaeta ,  David Geraghty ,  Michal Lipson ,  Reza Salem ,  Amy Foster

Inventor： Mark Foster ,  Alexander Gaeta ,  David Geraghty ,  Michal Lipson ,  Reza Salem ,  Amy Foster

IPC: G01J9/00 ,  G06E3/00 ,  G01J11/00 ,  G01J9/02 ,  G02B27/46

CPC classification number: G06E3/003 ,  G01J9/00 ,  G01J11/00 ,  G01J2009/0226 ,  G02B27/46

Abstract: There is set forth in one embodiment an apparatus and method for imparting a phase shift to an input waveform for output of a converted waveform. In one embodiment, a phase shift can be provided by four wave mixing of an input waveform and a pump pulse. In one embodiment, there is set forth an apparatus and method for generating a high resolution time domain representation of an input waveform comprising: dispersing the input waveform to generate a dispersed input waveform; subjecting the dispersed input waveform to four wave mixing by combining the dispersed input waveform with a dispersed pump pulse to generate a converted waveform; and presenting the converted waveform to a detector unit. In one embodiment a detector unit can include a spectrometer (spectrum analyzer) for recording of the converted waveform and output of a record representing the input waveform.

Abstract translation: 在一个实施例中提出了一种用于向输入波形施加相移以输出转换波形的装置和方法。 在一个实施例中，可以通过输入波形和泵浦脉冲的四次波混合来提供相移。 在一个实施例中，提出了一种用于产生输入波形的高分辨率时域表示的装置和方法，包括：分散输入波形以产生分散的输入波形; 通过将分散的输入波形与分散的泵浦脉冲组合来对分散的输入波形进行四波混频以产生转换的波形; 并将转换的波形呈现给检测器单元。 在一个实施例中，检测器单元可以包括用于记录转换的波形的光谱仪（频谱分析仪）和表示输入波形的记录的输出。

公开(公告)号：US09304036B2

公开(公告)日：2016-04-05

申请号：US14666501

申请日：2015-03-24

Applicant: FANUC CORPORATION

Inventor： Takashi Izumi

IPC: G01J1/42 ,  G01J11/00 ,  H01S3/13

CPC classification number: G01J1/4257 ,  G01J11/00 ,  H01S3/08045 ,  H01S3/097 ,  H01S3/101 ,  H01S3/13 ,  H01S3/139

Abstract: A beam profiler which can determine whether or not a laser beam can be suitably output at a lower cost. The beam profiler is provided with a partial reflecting mirror, light receiving parts, and laser intensity sensors which are individually attached to the light receiving parts. The light receiving parts include a first light receiving part which receives a first region which includes an optical axis of the laser beam in a laser irradiation region of the laser beam and a second light receiving part which is insulated heat-wise from the first light receiving part and which receives a second region of a laser irradiation region which is different from the first region.

Abstract translation: 能够确定能够以较低的成本适当地输出激光束的光束轮廓仪。 光束轮廓仪设置有分别附接到光接收部分的部分反射镜，光接收部分和激光强度传感器。 光接收部分包括：第一光接收部分，其接收在激光束的激光照射区域中包括激光束的光轴的第一区域;以及第二光接收部分，其与第一光接收 并且其接收与第一区域不同的激光照射区域的第二区域。

公开(公告)号：US09194753B2

公开(公告)日：2015-11-24

申请号：US14009341

申请日：2012-03-30

Applicant: Gerhard Georg Paulus ,  Arthur Maxwell Sayler ,  Tim Rathje ,  Max Möller ,  Dominik Hoff

Inventor： Gerhard Georg Paulus ,  Arthur Maxwell Sayler ,  Tim Rathje ,  Max Möller ,  Dominik Hoff

IPC: G01J4/00 ,  G01J11/00

CPC classification number: G01J11/00

Abstract: The aim of the present disclosure is to enable a fast CE phase evaluation of the laser pulses, in particular in real time, including for multi-cycle pulses. Said aim is achieved by providing a polarization gating stage (8) for changing the laser pulses (7) to be evaluated in the phase and subsequent phase evaluation stage (15) for measuring the phase position of the changed laser pulses. The descriptions in the present disclosure can be used for example in laser technology for producing and monitoring single-cycle pulses.

Abstract translation: 本公开的目的是使得能够对激光脉冲进行快速的CE相位评估，特别是实时的，包括用于多周期脉冲。 所述目的通过提供用于改变在相位和随后的相位评估阶段（15）中评估的激光脉冲（7）的偏振门控级（8），用于测量改变的激光脉冲的相位位置。 本公开中的描述可以用于例如用于生成和监视单周期脉冲的激光技术。