SPECTROMETRY DEVICE
    21.
    发明申请

    公开(公告)号:US20220316945A1

    公开(公告)日:2022-10-06

    申请号:US17640225

    申请日:2020-08-28

    Inventor: Ichiro ISHIMARU

    Abstract: A spectrometry device wherein light rays emitted from an object face measurement point combine into one parallel light beam by an objective lens, this is divided into a first and second light beam by a phase shifter, and the first and second light beam emit toward a light-receiving face of a photodetector while providing an optical path length difference. A light-shielding plate is arranged on a face optically conjugate the object face respective to the objective lens, and only light passed through translucent portions of the light-shielding plate is directed to the objective lens. A lateral length of each light-shielding plate translucent portion and the interval between two adjacent translucent portions are based on the objective lens focal length, the distance from the phase shifter to the photodetector light-receiving face, a photodetector pixel pitch, a pixel length, and a predetermined wavelength range of the light emitted from the measurement point.

    Method for imaging or spectroscopy with a non-linear interferometer

    公开(公告)号:US11454541B2

    公开(公告)日:2022-09-27

    申请号:US17181411

    申请日:2021-02-22

    Abstract: A system and method is provided for imaging and/or spectroscopy involving generation of a first signal field and a first idler field, illumination of the object with the first idler field, generation of second signal field and a second idler field, combination of the first and second idler fields, such that the two fields are indistinguishable, combination of the first and second signal fields, such that the two fields interfere, first measurement of the interfered signal field by a detection means, one or more additional measurements of the interfered signal field, wherein for each additional measurement a different phase shift is generated in the setup, and wherein all measurements are carried out within the stability time of the setup, and calculation of a phase function.

    Fabry-Perot Fourier transform spectrometer

    公开(公告)号:US11415460B2

    公开(公告)日:2022-08-16

    申请号:US16989741

    申请日:2020-08-10

    Inventor: Paul Lucey

    Abstract: A spatial Fourier transform spectrometer is disclosed. The Fourier transform spectrometer includes a Fabry-Perot interferometer with first and second optical surfaces. The gap between the first and second optical surfaces spatially varies in a direction that is orthogonal to the optical axis of the Fourier transform spectrometer. The Fabry-Perot interferometer creates an interference pattern from input light. An image of the interference pattern is captured by a detector, which is communicatively coupled to a processor. The processor is configured to process the interference pattern image to determine information about the spectral content of the input light.

    Spectral measurement method, spectral measurement system, and broadband pulsed light source unit

    公开(公告)号:US11300452B2

    公开(公告)日:2022-04-12

    申请号:US16619893

    申请日:2018-06-06

    Abstract: A new spectral measurement technique is provided which enables measurement even if the light to be measured exists for a very short period. In one embodiment, a broadband pulsed light wave whose wavelength shifts temporally and continuously in a pulse interferes with a light wave to be measured. The intensity at each wavelength of the light wave to be measured is obtained using a Fourier transform of the output signal from a detector that has detected the intensity of the wave resulting from the interference. A laser beam from a laser source is converted to a supercontinuum wave by a nonlinear optical element, and a pulse extension element extends pulses of the supercontinuum wave, thus generating the broadband pulsed light wave.

    High-throughput compact static-Fourier-transform spectrometer

    公开(公告)号:US11215504B2

    公开(公告)日:2022-01-04

    申请号:US17089518

    申请日:2020-11-04

    Inventor: Jiangquan Mai

    Abstract: Systems and methods which provide a high-throughput point source light coupling structure implementing a condenser configured according to one or more condenser configuration rules are described. Embodiments of a high-throughput point source light coupling structure utilize a birefringent plate configuration in combination with a condenser and point source to provide a light coupler structure for a birefringent-static-Fourier transform interferometer implementation. According to some examples, the optical axis of a first and second birefringent plate of a birefringent plate configuration are not in the same plane. A condenser of a high-throughput point source light coupling structure of embodiments is provided in a defined (e.g., spaced, relational, etc.) relationship with respect to the point source and/or a camera lens used in capturing an interference pattern generated by the light coupling structure. High-throughput point source light coupling structures herein may be provided as external accessories for processor-based mobile devices having image capturing capabilities.

    Diffuse reflectance infrared fourier transform spectroscopy

    公开(公告)号:US11156549B2

    公开(公告)日:2021-10-26

    申请号:US16597533

    申请日:2019-10-09

    Abstract: Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location 2 for receiving a sample 3 for analysis; an illumination arrangement 4 for directing light towards a received sample; a detector 6 for detecting light reflected by a received sample; and collection optics 5 for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer 42 and a half beam block 45a, 45b which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam block 45a may be disposed in the optical path between the interferometer and the light source 41 for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block 45b may be disposed in the optical path on the opposite side of the interferometer than the light source.

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