公开(公告)号：US10281262B2

公开(公告)日：2019-05-07

申请号：US15756290

申请日：2016-08-19

Applicant: Arizona Board of Regents on Behalf of the University of Arizona

Inventor： Yuzuru Takashima

IPC: G01J3/00 ,  G01B11/14 ,  G01S17/89 ,  G01B11/22 ,  G01S17/42 ,  G01S17/93 ,  G01S7/481 ,  G01C3/02

Abstract: An imaging laser range finder including an objective lens having an optical axis, an object side, and an image side, a controllable pixelated light modulator disposed along the optical axis on the image side of the lens, and a detector disposed optically downstream from the pixelated light modulator on the image side of the lens. The controllable pixelated light modulator is advantageously a MEMS-based system such as a digital mirror device (DMD). An increased field of view may be obtained by incorporating a pair of opposing surface reflectors between an imaging lens and the controllable pixelated light modulator. Associated methods are disclosed.

公开(公告)号：US10254165B2

公开(公告)日：2019-04-09

申请号：US15523110

申请日：2014-11-14

Applicant: Korea Advanced Institute of Science and Technology

Inventor： Hyeon Min Bae ,  Jong Kwan Choi ,  Min Gyu Choi ,  Jae Myoung Kim ,  Gun Pil Hwang

IPC: G01J3/00 ,  G01J3/28 ,  G01N21/35 ,  A61B5/1455 ,  G01J3/42 ,  A61B5/00

Abstract: Disclosed are a time division spread spectrum code-based optical spectroscopy system capable of controlling irradiation power and a method for controlling the optical spectroscopy system. The optical spectroscopy system may comprise: a light transmission unit for irradiating light to a particular region of a subject by means of a light source, wherein the light is irradiated so that the overall energy is consistently maintained by reducing the light irradiation time and increasing the strength of the light; and a light receiving unit for collecting emergent light which has passed through the particular region.

公开(公告)号：US10208742B2

公开(公告)日：2019-02-19

申请号：US14432607

申请日：2013-10-01

Applicant: LIFE SCIENCE INKUBATOR SACHSEN GMBH & CO. KG

Inventor： Dietrich Roscher

IPC: F04B39/00 ,  F25D19/00 ,  F25B9/00 ,  H01J1/18 ,  H01J19/12 ,  F04B3/00 ,  F16M7/00 ,  F16F9/02 ,  G01J1/02 ,  G01J3/00 ,  G01M7/00 ,  B01D8/00 ,  F04B37/08 ,  F16F15/04

Abstract: An arrangement for damping vibrations during microscopic examinations of inorganic and organic material specimens in an evacuated measuring at low temperatures that are cooled by an electromechanical cryocooler suppresses transfer of vibrations from the cryocooler onto the specimen, the microscope table and the instrument table. The arrangement includes a cryocooler unit and a microscopy unit combined with a damping unit preferably located on a common longitudinal axis. The damping unit has a series arrangement of inter-coupled evacuable compensation chambers arranged along the longitudinal axis, the series arrangement being combined with damper groups, two of which act at least diametrically. A clamping unit is operationally connected to the damping unit at at least two points on the series arrangement. A tension force of the damping unit is adjustable.

公开(公告)号：US10113861B2

公开(公告)日：2018-10-30

申请号：US15313897

申请日：2015-05-28

Applicant: BROWN UNIVERSITY

Inventor： Humphrey J. Maris

IPC: G01J3/00 ,  G01B11/16 ,  G01L1/24 ,  H01L21/66

Abstract: Methods and systems are disclosed for measuring multidimensional stress characteristics in a substrate. Generally, the methods include applying a sequence of optical pump pulses to the substrate. The optical pump pulses induce a propagating strain pulse in the substrate. Optical probe pulses are also applied. By analyzing transient optical responses caused by the propagating strain pulse, multidimensional stress components characterizing the stress in the substrate can be determined. Multidimensional stress components may also be determined at a depth of a substrate. Multidimensional stress components may also be determined at areas adjacent a through-silicon via.

公开(公告)号：US10078050B2

公开(公告)日：2018-09-18

申请号：US15227253

申请日：2016-08-03

Applicant: Woods Hole Oceanographic Institution

Inventor： Jason A. Kapit ,  Raymond W. Schmitt ,  Norman E. Farr

IPC: G01J3/00 ,  G01N21/45 ,  G01N21/25 ,  G01B9/02 ,  G01D5/26

CPC classification number: G01N21/45 ,  G01B9/02041 ,  G01B9/02044 ,  G01B9/02065 ,  G01B9/0209 ,  G01B2290/60 ,  G01D5/266 ,  G01N21/25

Abstract: In an in situ interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path length difference. An environmental condition corresponding to the absolute optical path length difference can be measured using the measurement of the absolute optical path length difference including salinity, pressure, density, and refractive index of a medium.

公开(公告)号：US10054550B2

公开(公告)日：2018-08-21

申请号：US15502239

申请日：2014-08-08

Applicant: EMPIRE TECHNOLOGY DEVELOPMENT LLC

Inventor： Yansong Gu

IPC: G01J3/00 ,  G01N21/87 ,  G01N21/27 ,  G01B11/24

CPC classification number: G01N21/87 ,  G01B11/24 ,  G01J2003/104 ,  G01N21/27 ,  G01N2201/0612 ,  G01N2201/0627

Abstract: Technologies are generally described for spectroscopic determination of one or more optical properties of a gemstone. An imaging device may include one or more light sources configured to illuminate one or more portions of the gemstone, and one or more photo detectors configured to detect reflected light from the portions of the gemstone in response to the illumination. An analysis module may be communicatively coupled to the imaging device, and configured to analyze the reflected light to determine the optical properties of the portions of the gemstone. The optical properties may include at least one of a clarity, color, fluorescence, birefringence, dichroism, and brilliance of the portions of the gemstone. In some examples, an optical fingerprint of the gemstone may be created based on one or more determined optical characteristics of the portions of the gemstone, where the optical fingerprint may uniquely identify the gemstone.

公开(公告)号：US10004399B2

公开(公告)日：2018-06-26

申请号：US15793482

申请日：2017-10-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Alexey Grigor'evich Anikanov ,  Sergey Vasil'evich Afanasyev ,  Vladislav Vladimirovich Druzhin ,  Alexander Victorovich Morozov

IPC: G01J3/00 ,  A61B5/00

CPC classification number: A61B5/0028 ,  A61B5/0059 ,  A61B5/0075 ,  A61B5/6801 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01J2003/1221 ,  G01J2003/123 ,  G01J2003/1282

Abstract: A spectrometer includes an illuminating section; a receiving section configured to detect radiation reflected from an object including an optically inhomogeneous scattering medium; a hardware section configured to obtain a solution of an inverse problem to reconstruct an absorption spectrum of the optically inhomogeneous scattering medium, wherein the illuminating section includes at least one light-emitting diode source, a radiation spectral curve of which is divided, by at least two spectral filters having different spectral transmission curves, into at least two spectral regions, to form an equivalent radiation spectrum from at least two spectral sources, and wherein the hardware section applies the solution of the inverse problem based on information about a spectral content of the radiation of the illuminating section, a signal obtained in a form of a response from the optically inhomogeneous scattering medium, and a spectral sensitivity curve of the receiving section.

公开(公告)号：US20180159034A1

公开(公告)日：2018-06-07

申请号：US15888515

申请日：2018-02-05

Applicant: Infineon Technologies Dresden GmbH

Inventor： Steffen BIESELT ,  Heiko Froehlich ,  Thoralf Kautzsch ,  Maik Stegemann ,  Mirko Vogt

IPC: H01L49/00 ,  G01J3/00

CPC classification number: H01L49/00 ,  G01J3/00 ,  G01J3/108 ,  G01J3/42

Abstract: A method for manufacturing an emitter comprises providing a semiconductor substrate having a main surface, the semiconductor substrate comprising a cavity adjacent to the main surface. A portion of the semiconductor substrate arranged between the cavity and the main surface of the semiconductor substrate forms a support structure. The method comprises arranging an emitting element at the support structure, the emitting element being configured to emit a thermal radiation of the emitter, wherein the cavity provides a reduction of a thermal coupling between the emitting element and the semiconductor substrate.

公开(公告)号：US09939318B2

公开(公告)日：2018-04-10

申请号：US15493006

申请日：2017-04-20

Applicant: Verifood, Ltd.

Inventor： Damian Goldring ,  Dror Sharon ,  Guy Brodetzki ,  Sagee Rosen ,  Omer Keilaf ,  Uri Kinrot ,  Ittai Nir ,  Nitzan Waisberg ,  Ofer Rachman ,  Assaf Carmi

IPC: G01J3/00 ,  G01J3/02 ,  G01J3/36 ,  G01J3/06 ,  G01J3/32

CPC classification number: G01J3/0291 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0256 ,  G01J3/0262 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/0286 ,  G01J3/0297 ,  G01J3/06 ,  G01J3/10 ,  G01J3/26 ,  G01J3/2823 ,  G01J3/32 ,  G01J3/36 ,  G01J2003/2826

Abstract: A protective sheath having a closed end and an open end is sized to receive a hand held spectrometer. The spectrometer can be placed in the sheath to calibrate the spectrometer and to measure samples. In a calibration orientation, an optical head of the spectrometer can be oriented toward the closed end of the sheath where a calibration material is located. In a measurement orientation, the optical head of the spectrometer can be oriented toward the open end of the sheath in order to measure a sample. To change the orientation, the spectrometer can be removed from the sheath container and placed in the sheath container with the calibration orientation or the measurement orientation. Accessory container covers can be provided and placed on the open end of the sheath with samples placed therein in order to provide improved measurements.

公开(公告)号：US09909989B2

公开(公告)日：2018-03-06

申请号：US14871678

申请日：2015-09-30

Applicant: The Trustees of Princeton University

Inventor： Stephen Y. Chou ,  Wendi Li

IPC: G01J3/00 ,  G01N21/64 ,  G01N21/65 ,  B82Y15/00 ,  G01N21/552 ,  G01N21/59 ,  B82Y30/00 ,  G01N21/03

CPC classification number: G01N21/64 ,  B82Y15/00 ,  B82Y30/00 ,  G01N21/03 ,  G01N21/554 ,  G01N21/59 ,  G01N21/6452 ,  G01N21/648 ,  G01N21/658 ,  G01N2021/0378 ,  G01N2021/6482 ,  Y10T428/24174

Abstract: Microstructures and nanostructures (100) consisting of a substrate (110), an array of pillars (120) capped by metallic disc (130), metallic dots (clusters or granules) (140) disposed on the sidewalls of the pillars, and a metallic backplane (150) that can interact to enhance a local electric field, the absorption of the light, and the radiation of the light are disclosed. Methods to fabricate the structures (100) are also disclosed. Applications of the structures to enhance the optical signals in the detection of molecules and other materials on a structure surface, such as fluorescence, photoluminescence and surface enhanced Raman Scattering (SERS) are also disclosed.