Abstract:
A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
Abstract:
In a time of flight mass spectrometer (TOFMS) having a flight space in which ions fly in a loop orbit formed by a plurality of electric sector fields, the present invention provides a simple structure that creates a spiral path by deflecting the ions in the axial direction of the electric fields at every turn of the ions. In a mode of the present invention, the TOFMS has cylindrical electrodes 11 and 12 for creating electric sector fields E1 and E2, between which a parallel pair of planer magnetic poles 15a and 15b are provided. The planer magnetic poles 15a and 15b create a deflecting magnetic field B1 for shifting the ions in the axial direction (Y-direction) of the electric sector fields. The ions experience a Lorenz force once every turn when they pass through the deflecting magnetic field B1. This construction uses only one pair of magnetic poles facing each other across the ion path P to deflect every ion irrespective of its number of turns. There is no need to provide one deflector for each turn of the ions, as in the case of conventional TOFMSs.
Abstract:
The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.
Abstract:
The present invention provides a time of flight mass spectrometer having an ion optics forming a multi-turn track, which is capable of time-focusing the ions while allowing the multi-turn track to be configured in an unlimited and highly variable manner. In a specific form of the invention, a reflector 9 is provided on the flight path between the position where the ions leave the loop orbit P and the ion detector 10 located outside the loop orbit P, and the condition of the electric field generated by the reflector 9 is appropriately determined. Thus, even if the ions cannot be well time-focused by the ion optics 2 creating the sector-shaped electric fields 4 and 7, it is possible to compensate the time-focusing performance with the reflector 9 to achieve a good performance of time-focusing of the ion throughout the overall system wherein the ions leave the ion source 1 and finally reach the ion detector 10. Thereby, the ions can reach the ion detector 10 at approximately the same time even if the ions having the same mass number have different levels of energy at the moment they leave the ion source 1.
Abstract:
The present invention relates generally to a multi-reflecting time-of-flight mass spectrometer (MR TOF MS). To improve mass resolving power of a planar MR TOF MS, a spatially isochronous and curved interface may be used for ion transfer in and out of the MR TOF analyzer. One embodiment comprises a planar grid-free MR TOF MS with periodic lenses in the field-free space, a linear ion trap for converting ion flow into pulses and a C-shaped isochronous interface made of electrostatic sectors. The interface allows transferring ions around the edges and fringing fields of the ion mirrors without introducing significant time spread. The interface may also provide energy filtering of ion packets. The non-correlated turn-around time of ion trap converter may be reduced by using a delayed ion extraction from the ion trap and excessive ion energy is filtered in the curved interface.
Abstract:
A method of mass analysis using a multi-turn time-of-flight mass spectrometer starts with recording plural heterogeneous turn number spectra F1(t), F2(t), . . . , Fq(t) containing plural ion peaks that might be different in number of turns, the spectra being obtained with different ion residence times taken from entry to departure using a multi-correlation function for reconstructing a single turn number spectrum.
Abstract:
In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly. Even if the difference in the mass to charge ratio is small, the separation becomes large when the number of turns of the flight becomes large. After such a separation is adequately achieved, the ion selecting electrodes can select the object ions with high selectivity, or at high mass resolution. By adding dissociating means, fragment ions originated only from the selected object ions can be analyzed, which enables the identification and structural analysis of the sample at high accuracy.
Abstract:
In an analysis using a mass spectrometer having a loop orbit along which ions are made to fly a plurality of times, the present invention provides a method of determining the mass-to-charge ratio of an ion without limiting the range of the mass-to-charge ratio of the ions to be brought into the loop orbit while allowing the lapping of the orbiting ions. The measurement is carried out two or more times under different conditions (Tg=500[μs], 400[μs]) under which the number of turns of the ion concerned is different. Flight times are determined from the flight time spectrums obtained by at least two measurements. Though the numbers of turns themselves are unknown, it is possible to calculate possible mass-to-charge ratios for each flight time by incrementally setting the number of turns at plural values. The two sets of possible mass-to-charge ratios derived from the two flight time values (525[μs], 441[μs]) determined by the two measurements are compared with each other, and a value that is found in both measurement results is selected as the mass-to-charge ratio of the ion concerned. Thus, it is possible to determine the mass-to-charge ratio without limiting the range of the mass-to-charge ratio before the ions are brought into the loop orbit.
Abstract:
A mass spectrometer includes a flight control device for allowing ions from an ion source to repeatedly fly along an orbit in a flight space for predetermined times; a detecting device for detecting the ions after the ions repeatedly fly along the orbit for the predetermined times; and a data processing device for starting collection of ion strength data detected by the detecting device. The ion strength data is obtained during the flight of the ions along the orbit, or when the ions are headed toward the detecting device after departing from the orbit, or when one of the above situations is estimated.
Abstract:
The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.