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公开(公告)号：US09194751B1
公开(公告)日：2015-11-24
申请号：US14030670
申请日：2013-09-18
Applicant: The Boeing Company
Inventor： Daniel Yap , Oleg M. Efimov
CPC classification number: G01J1/00 , F41G7/008 , F41G7/2253 , F41G7/226 , F41G7/2293 , G01J3/36 , G01J5/08 , G01J5/0806 , G01J5/0853 , G01J5/0862 , G01J5/0878 , G01J5/10 , G01J5/602 , G01J2005/0077 , G01S3/781 , G01S3/784 , G02B13/14 , G02B13/146
Abstract: Systems and methods for dual-mode optical sensing are provided. One system includes a focal-plane array (FPA) imaging detector configured to detect light of a first wavelength range and an illuminated-spot locating detector (ISLD) including an array of light-detecting elements configured to detect light of a second wavelength range, wherein the ISLD has a transparency to light of the first wavelength range. The system further includes a wavelength-selective optical diffuser configured to diffuse light of the second wavelength range, wherein the shortest wavelength of the first range is larger than the longest wavelength of the second range, the ISLD is positioned such that the light to be detected by the FPA imaging detector first passes through the ISLD, and the FPA imaging detector, the ISLD and the wavelength-selective diffuser share a common optical axis.
Abstract translation: 提供了双模光学感测的系统和方法。 一个系统包括被配置为检测第一波长范围的光的焦平面阵列（FPA）成像检测器和包括被配置为检测第二波长范围的光的光检测元件阵列的照明点定位检测器（ISLD） 其中所述ISLD具有对所述第一波长范围的光的透明度。 该系统还包括配置成漫射第二波长范围的波长选择性光漫射器，其中第一范围的最短波长大于第二范围的最长波长，ISLD被定位成使得被检测的光 FPA成像检测器首先通过ISLD，并且FPA成像检测器，ISLD和波长选择扩散器共享共同的光轴。
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32.发明授权Networked architecture for system of lighting devices having sensors, for intelligent applications 有权用于智能应用的具有传感器的照明设备系统的网络架构公开(公告)号：US09125255B2
公开(公告)日：2015-09-01
申请号：US13463586
申请日：2012-05-03
Applicant: David P. Ramer , Jack C. Rains, Jr.
Inventor： David P. Ramer , Jack C. Rains, Jr.
CPC classification number: H05B37/0245 , H05B37/0227 , Y02B20/48
Abstract: Intelligent lighting devices, with sensors, programmed processors and communication capabilities and networked with a hierarchy of computers, to form a system to monitor one or more conditions external to the lighting devices not directly related to operational performance of the respective lighting devices, for a variety of applications separate and in addition to the lighting related functions of the networked devices.
Abstract translation: 智能照明设备，具有传感器，编程处理器和通信能力，并与计算机的层次结构联网，以形成一种系统，用于监控与各个照明设备的操作性能无直接关系的照明设备外部的一个或多个条件 的应用程序与网络设备的照明相关功能相互独立。
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33.发明授权Lighting devices with sensors for detecting one or more external conditions and networked system using such devices 有权具有用于检测一个或多个外部条件的传感器的照明装置和使用这种装置的联网系统公开(公告)号：US09001317B2
公开(公告)日：2015-04-07
申请号：US14285881
申请日：2014-05-23
Applicant: ABL IP Holding LLC
Inventor： David P. Ramer , Jack C. Rains, Jr.
CPC classification number: H05B37/0227 , H05B33/0842 , H05B33/0854 , H05B33/0869 , H05B33/0872 , H05B37/0209 , H05B37/0218 , H05B37/0254
Abstract: Exemplary lighting devices have sensors, intelligence in the form of programmed processors and communication capabilities. Such a device is configured to monitor one or more conditions external to a lighting device not directly related to operational performance of the respective lighting device. One or more such devices can work in a networked system, to support a variety of applications separate and in addition to the lighting related functions of the devices(s).
Abstract translation: 示例性照明设备具有传感器，以编程处理器和通信能力的形式的智能。 这种设备被配置为监视与照明设备的操作性能无直接关系的照明设备外部的一个或多个条件。 一个或多个这样的设备可以在网络系统中工作，以支持各种应用，并且除了与设备的照明相关的功能之外。
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公开(公告)号：US20150066438A1
公开(公告)日：2015-03-05
申请号：US14473635
申请日：2014-08-29
Applicant: BROADCOM CORPORATION
Inventor： Todd Lee Brooks , Xicheng Jiang , Iuri Mehr , David Joseph Stoops , Vinod Jayakumar , Min Gyu Kim , Hui Zheng , I-Ning Ku , Vinay Chandrasekhar , Yee Ling Cheung
IPC: H03B5/04 , G01R19/00 , G01K1/00 , G01L7/00 , A61B5/021 , H05B33/08 , A61B5/01 , A61B5/024 , A61B5/08 , G01J1/00 , G01N33/00
CPC classification number: H05B33/089 , A61B5/01 , A61B5/021 , A61B5/024 , A61B5/0816 , A61B2562/06 , G01J1/44 , G01K1/02 , G01R19/0092 , H03K3/0231
Abstract: A sensor interface includes on-chip relaxation oscillator circuit and a PLL that operate cooperatively to generate a highly accurate clock signal on-chip using low-power components. A photodiode generates a current signal based on an optical signal that is representative of a sensor signal. An ADC that operates based on the highly accurate clock signal generates a digital signal based on the current signal generated by the photodiode, and a processor processed the digital signal to estimate sensor data within the sensor signal. Examples of characteristics that may be sensed can include environmental characteristics (e.g., temperature, humidity, barometric pressure, etc.) and/or biomedical characteristics (e.g., body temperature, heart rate, respiratory rate, blood pressure, etc.). In desired, an amplifier processes the photodiode-provided current signal before it is provided to the ADC. Also, one or more CDACs that generate feedback currents may be used to reduce noise sensitivity of the sensor interface.
Abstract translation: 传感器接口包括片上弛豫振荡器电路和PLL，其协作地工作以使用低功率元件在片上产生高精度的时钟信号。 光电二极管基于表示传感器信号的光信号产生电流信号。 基于高度精确的时钟信号操作的ADC基于由光电二极管产生的电流信号产生数字信号，并且处理器处理数字信号以估计传感器信号内的传感器数据。 可以感测的特征的实例可以包括环境特征（例如，温度，湿度，大气压力等）和/或生物医学特征（例如体温，心率，呼吸频率，血压等）。 在期望的情况下，放大器在将其提供给ADC之前处理提供的光电二极管的电流信号。 而且，可以使用产生反馈电流的一个或多个CDAC来降低传感器接口的噪声灵敏度。
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公开(公告)号：US20150015875A1
公开(公告)日：2015-01-15
申请号：US14501220
申请日：2014-09-30
Applicant: Carl Zeiss SMT GmbH
Inventor： Michael Arnz , Markus Deguenther
CPC classification number: G01N21/95 , G01J1/00 , G01J1/4257 , G01J1/429 , G01N21/8806 , G01N21/9501 , G03F1/84
Abstract: A measuring device (40) for measuring an illumination property of an illumination system (12), which is configured for two-dimensional irradiation of a substrate (24) arranged in an illumination plane (21) with illumination radiation (20). Two differing measurement beam paths (52, 54) are formed in the measuring device, each arranged to guide the illumination radiation emitted by the illumination system onto a spatially resolving intensity detector (42) of the measuring device. A first (52) of the measurement beam paths is arranged to measure an intensity distribution in the illumination plane and the second (54) of the measurement beam paths is arranged to measure an intensity distribution in a pupil of the illumination system. The measuring device also includes an imaging optical unit (44) arranged in the first measurement beam path (52) such that the illumination radiation guided in the first measurement beam path passes through the imaging optical unit.
Abstract translation: 一种用于测量照明系统（12）的照明特性的测量装置（40），其被配置为用照射辐射（20）布置在照明平面（21）中的基板（24）的二维照射。 两个不同的测量光束路径（52,54）形成在测量装置中，每个测量光束路径被布置成将照明系统发射的照射辐射引导到测量装置的空间分辨强度检测器（42）上。 测量光束路径的第一（52）布置成测量照明平面中的强度分布，并且第二测量光束路径（54）被布置成测量照明系统的光瞳中的强度分布。 测量装置还包括配置在第一测量光束路径（52）中的成像光学单元（44），使得在第一测量光束路径中引导的照明辐射通过成像光学单元。
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Patent Agency Ranking
36.发明授权Method of measuring uniformity of exposing light and exposure system for performing the same 有权测量曝光光的均匀性和进行曝光系统的方法公开(公告)号：US08902414B2
公开(公告)日：2014-12-02
申请号：US13669751
申请日：2012-11-06
Applicant: Samsung Display Co., Ltd.
Inventor： Jung-In Park , Cha-Dong Kim , Su-Yeon Sim , Sang-Hyun Yun , Hi-Kuk Lee
CPC classification number: G01J1/00 , G03F7/20 , G03F7/70133
Abstract: An exposure system includes an exposure apparatus, a mask, a test pattern portion and a uniformity measuring part. The exposure apparatus includes a first module and a second module. The first and second modules each emit light and are overlapped in an overlapping area. The mask includes a plurality of transmission portions which are spaced apart from each other. Each of the transmission portions has a width less than a width of the overlapping area. The test pattern portion includes a plurality of test patterns which are patterned by using the light transmitted through the transmission portions of the mask. The uniformity measuring part measures a uniformity of the test patterns.
Abstract translation: 曝光系统包括曝光装置，掩模，测试图案部分和均匀度测量部分。 曝光装置包括第一模块和第二模块。 第一和第二模块各自发光并且在重叠区域中重叠。 掩模包括彼此间隔开的多个传输部分。 每个传输部分具有小于重叠区域的宽度的宽度。 测试图形部分包括通过使用透过掩模的透射部分的光而构图的多个测试图案。 均匀度测量部件测量测试图案的均匀性。
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37.发明授权公开(公告)号：US08896823B2
公开(公告)日：2014-11-25
申请号：US13771084
申请日：2013-02-20
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Yoshi Enami
CPC classification number: G01J1/4257 , G01J1/0228 , G01J1/0242 , G01J1/0403 , G01J1/0488 , G01J1/4228 , G01J3/505 , G01J3/51 , G01J2001/4247
Abstract: A light distribution characteristic measurement apparatus for measuring the light distribution characteristic of a light source is provided. The apparatus includes a plurality of detectors arranged so that they have a predetermined relative relationship with each other. One detector has a detection range at least partially overlapping a detection range of another detector adjacent to the former detector. The apparatus further includes a drive unit that drives a plurality of detectors as one unit to update a positional relationship of the plurality of detectors relative to the light source, and a calculation unit that calculates the light distribution characteristic of the light source by performing a process depending on at least one of a relative relationship between a plurality of detectors and overlapping of respective detection ranges thereof, based on respective results of detection that have been acquired by the plurality of detectors at the same timing.
Abstract translation: 提供一种用于测量光源的光分布特性的配光特性测量装置。 该装置包括多个检测器，其布置成使得它们彼此具有预定的相对关系。 一个检测器具有与前一个检测器相邻的另一检测器的检测范围至少部分重叠的检测范围。 该装置还包括：驱动单元，其驱动多个检测器作为一个单元，以更新多个检测器相对于光源的位置关系;以及计算单元，其通过执行处理来计算光源的光分布特性 取决于多个检测器之间的相对关系中的至少一个和其相应检测范围的重叠，基于在相同定时由多个检测器获取的检测结果。
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公开(公告)号：US08866079B2
公开(公告)日：2014-10-21
申请号：US12700397
申请日：2010-02-04
Applicant: Brian A. Floyd , Vipul Jain , Arun S. Natarajan , Scott K. Reynolds
Inventor： Brian A. Floyd , Vipul Jain , Arun S. Natarajan , Scott K. Reynolds
Abstract: A system and method is shown for receiving microwave/millimeter-wave signals. The system and method are balanced and can be effectively implemented on a silicon substrate using single pole double throw switches.
Abstract translation: 示出了用于接收微波/毫米波信号的系统和方法。 该系统和方法是平衡的，并且可以在使用单刀双掷开关的硅衬底上有效地实现。
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公开(公告)号：US08848177B2
公开(公告)日：2014-09-30
申请号：US14263382
申请日：2014-04-28
Applicant: Haas Laser Technologies, Inc.
Inventor： Michael J. Scaggs
CPC classification number: G01J1/4257 , G01J1/0411 , G01J1/0477 , G01J1/1626 , G01N21/95
Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.
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公开(公告)号：US08830453B2
公开(公告)日：2014-09-09
申请号：US13729300
申请日：2012-12-28
Applicant: Jun Zhu , Jing-Lei Zhu , Kai-Li Jiang , Chen Feng , Ji-Qing Wei , Guo-Fan Jin , Shou-Shan Fan
Inventor： Jun Zhu , Jing-Lei Zhu , Kai-Li Jiang , Chen Feng , Ji-Qing Wei , Guo-Fan Jin , Shou-Shan Fan
CPC classification number: G01J1/42 , G01J1/0411 , G01J1/08 , G01J1/4228 , G01J1/4257 , G01J1/58 , G01J2001/4247
Abstract: A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array located on a surface of a substrate. The carbon nanotube array has a top surface away from the substrate. The carbon nanotube array with the substrate is located in an inertia environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a visible light. A reflector is provided, and the visible light is reflected by the reflector. An imaging element images the visible light reflected by the reflector, to obtain an intensity distribution of the light source.
Abstract translation: 用于测量光的强度分布的方法包括提供位于基底表面上的碳纳米管阵列的步骤。 碳纳米管阵列具有远离衬底的顶表面。 具有基板的碳纳米管阵列位于惯性环境或真空环境中。 光源照射碳纳米管阵列的顶面，使碳纳米管阵列发出可见光。 设置反射器，可见光被反射器反射。 成像元件对由反射器反射的可见光进行成像，以获得光源的强度分布。
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