公开(公告)号：US11631778B2

公开(公告)日：2023-04-18

申请号：US16419055

申请日：2019-05-22

Applicant: Wei Pan

Inventor： Wei Pan

IPC: H01L31/054 ,  H01L31/0475 ,  H02S40/22 ,  H01L31/05 ,  G01J5/08 ,  F21V7/22 ,  A01G9/24 ,  H01Q15/00 ,  F24S25/61 ,  F21V9/20 ,  F21V9/04 ,  A01G9/14 ,  G02B27/01 ,  G02B27/14 ,  G02B6/293 ,  G03B33/12

Abstract: A solar module assembly includes a frame having an upper portion encompassing an area and a mid portion disposed below the upper portion. A plurality of solar panels is arranged in a string, sandwiched between two transparent panes forming a single string panel. The solar panels occupy less than the area of the upper portion. Each of the plurality of solar panels has a pair of opposing edges. A reflector is mounted on the mid portion to reflect light selectively.

公开(公告)号：US20230078159A1

公开(公告)日：2023-03-16

申请号：US17943546

申请日：2022-09-13

Applicant: Stratasys Powder Production Ltd.

Inventor： Gianluca Dorini

IPC: G01J5/80 ,  B29C64/165 ,  B33Y40/10 ,  G01J5/08 ,  B29C64/393 ,  B29C64/209 ,  B29C64/277 ,  B33Y10/00 ,  B33Y50/02 ,  B29C64/153 ,  B29C64/314 ,  G01J5/00

Abstract: A method for determining a set point for a thermal sensor. The method includes: (a) distributing a layer of particulate material forming a build bed surface; (b) optionally, preheating the layer to a temperature below its melting temperature; (c) measuring a first temperature value with a primary or secondary thermal sensor; (d) depositing absorption modifier over the test region and/or surrounding area; (e) heating the test region; (f) measuring a second temperature value with the primary sensor; (g) distributing another layer of material over the preceding layer; repeating steps (b) to (g), such that the test region of each layer reaches a higher temperature than that of the preceding layer, at least until the test region starts to melt; determining a set point for the primary sensor from a characteristic in the evolution of the measured temperature values; and applying the set point to subsequent measurements of the primary sensor.

公开(公告)号：US20230051521A1

公开(公告)日：2023-02-16

申请号：US17403693

申请日：2021-08-16

Applicant: Applied Material, Inc.

Inventor： Wolfgang Aderhold ,  Samuel Howells ,  Amritha Rammohan ,  Huy Q. Nguyen

IPC: H01L21/67 ,  G01J5/00 ,  G01J5/08

Abstract: Embodiments disclosed herein include a method for determining a temperature error of a pyrometer. In an embodiment, the method comprises measuring a first signal with a first sensor of the pyrometer and measuring a second signal with a second sensor of the pyrometer. In an embodiment, the method further comprises determining a reflectivity of a reflector plate from the first signal and the second signal, and determining the temperature error using the reflectivity.

公开(公告)号：US20230045432A1

公开(公告)日：2023-02-09

申请号：US17729873

申请日：2022-04-26

Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor： Chin-Jou KUO ,  Bor-Shiun LEE ,  Ming-Fa CHEN

IPC: G01J5/08 ,  B81B3/00 ,  B81C1/00 ,  G01J5/20 ,  G01J5/02

Abstract: A MEMS infrared sensing device includes a substrate and an infrared sensing component. The infrared sensing component is provided above the substrate. The infrared sensing component includes a sensing plate and at least one supporting element. The sensing plate includes at least one infrared absorbing layer, an infrared sensing layer, a sensing electrode and a plurality of metallic elements. The sensing plate has a plurality of openings. The metallic elements respectively surround the openings. The sensing electrode is connected with the infrared sensing layer, and the metallic elements are spaced apart from one another. The supporting element connecting the sensing plate with the substrate.

公开(公告)号：US20230036090A1

公开(公告)日：2023-02-02

申请号：US17859845

申请日：2022-07-07

Applicant: THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION

Inventor： Yan Liu ,  Aihua Wu ,  Wei Wang ,  Yuwei Zhai ,  Hao Li ,  Chen Ding ,  Xiaodong Jing ,  Baicheng Sheng

IPC: G01J5/48 ,  G01J5/08 ,  G01J5/0806

Abstract: A three-dimensional displacement compensation method is provided. The method includes an obtaining step, a transforming step, a first determining step, a first calculating step and a compensating step. The obtaining step includes obtaining a current image of a measured element captured by a microscopic thermoreflectance thermography device. The transforming step includes two sub-steps. One sub-step uses Fourier transform to calculate a reference image to obtain a first result, and the other sub-step uses Fourier transform to calculate the current image to obtain a second result. The first determining step includes determining a peak point coordinate and a fitting diameter of a point spread function of an optical system of the device. The first calculating step includes calculating a three-dimensional displacement of the position to be compensated relative to the reference position. The compensating step compensates the position to be compensated.

公开(公告)号：US20230018331A1

公开(公告)日：2023-01-19

申请号：US17950635

申请日：2022-09-22

Applicant: Carl Zeiss SMT GmbH

Inventor： Michael STOLZ ,  Timo LAUFER

IPC: G03F7/20 ,  G01J5/08

Abstract: A device (20) for detecting a temperature on a surface (15) of an optical element (14) for semiconductor lithography. The device includes an optical element (14) having a face (16) irradiated with electromagnetic radiation (7, 8, 43), a temperature recording device (21), and a temperature controlled element (22) configured to be temperature-controlled and arranged so that the predominant proportion of the intensity of the thermal radiation (25.2) detected by the temperature recording device and reflected by reflection at the surface of the optical element is emitted by the temperature-controlled element. Also disclosed are an installation (1) for producing a surface (15) of an optical element (14) for semiconductor lithography and a method for producing a surface (15) of an optical element (14) of a projection exposure apparatus (30), wherein the surface is temperature-controlled and the surface temperature is detected during the temperature control.

公开(公告)号：US11546530B2

公开(公告)日：2023-01-03

申请号：US17284600

申请日：2019-08-26

Applicant: SONY CORPORATION

Inventor： Ilya Reshetouski ,  Atsushi Ito

IPC: H04N5/33 ,  G01J5/08 ,  G01J5/0802 ,  G01J1/04 ,  H01L27/146 ,  G01J5/00

Abstract: An artifact caused by secondary reflection is reduced. An imaging device according to an embodiment includes: a diffuser (110) that converts incident light into scattered light whose diameter is expanded in accordance with a propagation distance and outputs the scattered light; and a light receiver (132) that converts light diffused by the diffuser into an electric signal.

公开(公告)号：US11536611B2

公开(公告)日：2022-12-27

申请号：US16627666

申请日：2017-06-30

Applicant: SHENYANG TACO BLUE-TECH CO., LTD.

Inventor： Qixian Xie ,  Jiu Zhang ,  Guohui Mei ,  Bin Liang ,  Jie Sun

IPC: G01J5/00 ,  G01K1/12 ,  B22D2/00 ,  G01N33/205 ,  G01J5/04 ,  G01J5/0818 ,  G01J5/08

Abstract: The disclosure includes a temperature measuring device and a temperature measuring method for measuring the temperature of molten metals. The temperature measuring device includes a temperature sensing element, a support tube, a connecting tube and an exhaust structure. The temperature sensing element is a cermet tube with a closed end and an open end, and can sense the temperature of a molten metal and emit stable thermal radiation energy based on the blackbody cavity principle when being extended into the molten metal. The open end of the cermet tube is fixedly connected to one end of the support tube, the cermet tube is communicated with the support tube, and the other end of the support tube is fixedly connected with the connecting tube. The exhaust structure is used to discharge the smoke inside the cermet tube and the support tube.

公开(公告)号：US20220400607A1

公开(公告)日：2022-12-22

申请号：US17841948

申请日：2022-06-16

Applicant: CNH Industrial America LLC

Inventor： Bart M.A. Missotten ,  Jasper Vanlerberghe ,  Sam Reubens ,  Lucas Deruyter ,  Frederik Tallir ,  Dré W.J. Jongmans ,  Sahand Hajshekoleslami ,  Pieter Van Overschelde

IPC: A01D34/00 ,  A01D34/04 ,  G01J5/08

Abstract: A cutting system includes knives attached to a continuously moving belt-type carrier. The carrier motion moves the knives past stationary counterknife fingers which are attached to or uniform with a cutterbar, as the cutting system is driven through a field of crop stalks, which are cut by the interaction between the knives and counterknives. One or more sensing devices produce signals or images related to the condition of the knives when the knives are moving past the sensing devices. A processing unit processes the signals or images and derives therefrom one or more parameters representative of the condition of the knives, and compares the parameters to a reference, to thereby monitor the condition. An agricultural implement such as a combine harvester, can be equipped with the cutting system.

公开(公告)号：US11504812B2

公开(公告)日：2022-11-22

申请号：US16707133

申请日：2019-12-09

Applicant: Tsinghua University ,  HON HAI PRECISION INDUSTRY CO., LTD.

Inventor： Ying-Cheng Wang ,  Zhong-Zheng Huang ,  Yuan-Hao Jin ,  Qun-Qing Li ,  Shou-Shan Fan

IPC: B23K26/402 ,  G01J5/08 ,  B23K26/00 ,  B23K26/10 ,  B23K26/082 ,  B23K103/00 ,  B23K101/36

Abstract: A method for making an infrared light absorber is provided, and the method includes following steps: providing a first carbon nanotube array on a substrate; truncating the carbon nanotube array by irradiating a top surface of the carbon nanotube array by a laser beam in two directions, the top surface being away from the substrate, wherein the two directions being at an angle, the angle is in a range of 30 degrees to 90 degrees.