公开(公告)号：US20230133711A1

公开(公告)日：2023-05-04

申请号：US17975617

申请日：2022-10-28

Applicant: SEIKO EPSON CORPORATION

Inventor： Takefumi FUKAGAWA ,  Takashi TAJIRI

IPC: G01J1/06 ,  G01J3/26 ,  G01J3/36

Abstract: A detecting device of the present disclosure includes a light emitting portion that emits light and a light receiving portion including an angle limiting member that limits an angle of incidence of light from the light emitting portion, wherein the light receiving portion has a first light receiving region and a second light receiving region that is spaced further from the light emitting portion than the first light receiving region is, the angle limiting member includes a first limiting region corresponding to the first light receiving region and a second limiting region corresponding to the second light receiving region, and the degree of angle limitation of the second limiting region is smaller than the degree of angle limitation of the first limiting region.

公开(公告)号：US11143551B2

公开(公告)日：2021-10-12

申请号：US16416054

申请日：2019-05-17

Applicant: HANA Microelectronics, Inc.

Inventor： Vanapong Kwangkaew ,  Sirirat Silapapipat ,  Sanjay Mitra

IPC: G01J1/06

Abstract: A sensor comprising a light emitter and light detector directly covered and encapsulated by a layer of light transmissive compound. A gap in the light transmissive compound between the light emitter and the light detector filled with an infrared ink. In some embodiments, an infrared ink can cover at least a portion of a top surface of the sensor and define apertures above the light detector and/or light emitter.

公开(公告)号：US20210231490A1

公开(公告)日：2021-07-29

申请号：US17214978

申请日：2021-03-29

Applicant: Michael Gostein ,  William Stueve

Inventor： Michael Gostein ,  William Stueve

IPC: G01J1/42 ,  G01J1/06 ,  G01J1/04 ,  F24S50/20

Abstract: In one respect, disclosed is a device or system for solar irradiance measurement comprising at least two irradiance sensors deployed outdoors at substantially different angles, such that, by analysis of readings from said irradiance sensors, a direct irradiance, a diffuse irradiance, a global irradiance, and/or a ground-reflected irradiance are determined. In some embodiments the disclosed device or system is stationary and has no moving parts.

公开(公告)号：US10989590B2

公开(公告)日：2021-04-27

申请号：US16542505

申请日：2019-08-16

Applicant: UNM RAINFOREST INNOVATIONS

Inventor： Steven R. J. Brueck ,  Alexander Neumann ,  Payman Zarkesh-Ha

IPC: G01J1/06 ,  G01J3/18 ,  G01J3/02 ,  G01J1/44 ,  G01J3/28 ,  G02B6/122 ,  G02B6/124 ,  H01L27/144 ,  H01L31/02 ,  H01L31/0216 ,  H01L31/0232 ,  H01L31/103 ,  G02B6/12

Abstract: A 2-D sensor array includes a semiconductor substrate and a plurality of pixels disposed on the semiconductor substrate. Each pixel includes a coupling region and a junction region, and a slab waveguide structure disposed on the semiconductor substrate and extending from the coupling region to the region. The slab waveguide includes a confinement layer disposed between a first cladding layer and a second cladding layer. The first cladding and the second cladding each have a refractive index that is lower than a refractive index of the confinement layer. Each pixel also includes a coupling structure disposed in the coupling region and within the slab waveguide. The coupling structure includes two materials having different indices of refraction arranged as a grating defined by a grating period. The junction region comprises a p-n junction in communication with electrical contacts for biasing and collection of carriers resulting from absorption of incident radiation.

公开(公告)号：US10732105B1

公开(公告)日：2020-08-04

申请号：US16277917

申请日：2019-02-15

Applicant: Agilent Technologies, Inc.

Inventor： Guthrie Partridge

IPC: G01J1/06 ,  G01J1/04 ,  H01S3/00 ,  H01S5/022 ,  H01S5/10 ,  H01S5/14 ,  G01N21/25 ,  G01N21/59

Abstract: A system adapted for characterizing gain chips and a method for characterizing gain chips are disclosed. The system includes a probe light source that generates an output light signal characterized by a wavelength that can be varied in response to a wavelength control signal and a mounting stage adapted for receiving a gain chip characterized by a waveguide having a reflective face on a first surface of the gain chip and a transparent face on a second surface of the gain chip. The system also includes an optical system that focuses the output light signal into the waveguide through the transparent face; and a controller that causes the probe light source to generate the output light signal and measures an intensity of light both with and without the gain chip being powered for each of a plurality of different wavelengths to form a gain profile for the gain chip.

公开(公告)号：US10688809B2

公开(公告)日：2020-06-23

申请号：US16037312

申请日：2018-07-17

Applicant: Xerox Corporation

Inventor： Anthony S. Condello ,  Jack T. LeStrange ,  Xin Yang ,  Mandakini Kanungo ,  Peter J. Knausdorf

IPC: B41J11/00 ,  B41J11/22 ,  B41J15/08 ,  B41J15/10 ,  B41J15/12 ,  B41J15/14 ,  G01J1/06 ,  G01J1/42

Abstract: A printer includes an ultraviolet (UV) curing device having UV light emitting diodes (LEDs) to cure UV curable inks ejected onto a surface after the surface travels past a plurality of printheads in the printer. A UV detector having UV sensors is positioned opposite the UV curing device so the UV sensors and UV LEDs are opposite one another in a one-to-one correspondence. A controller operates the UV curing device to direct UV light into the UV detector and receives electrical signals generated by the UV sensors. The controller compares these electrical signals to a predetermined threshold to identify defective LEDs in the UV curing device. The controller then determines how to move the UV curing device across the path of the surface to irradiate areas of the surface previously opposite the defective UV LEDs.

公开(公告)号：US20200003613A1

公开(公告)日：2020-01-02

申请号：US16542505

申请日：2019-08-16

Applicant: STC.UNM

Inventor： Steven R.J. BRUECK ,  Alexander NEUMANN ,  Payman ZARKESH-HA

IPC: G01J1/06 ,  G01J1/44 ,  G01J3/18 ,  G01J3/28 ,  G02B6/122 ,  G02B6/124 ,  H01L27/144 ,  H01L31/02 ,  H01L31/0216 ,  H01L31/0232 ,  H01L31/103 ,  G01J3/02

Abstract: A 2-D sensor array includes a semiconductor substrate and a plurality of pixels disposed on the semiconductor substrate. Each pixel includes a coupling region and a junction region, and a slab waveguide structure disposed on the semiconductor substrate and extending from the coupling region to the region. The slab waveguide includes a confinement layer disposed between a first cladding layer and a second cladding layer. The first cladding and the second cladding each have a refractive index that is lower than a refractive index of the confinement layer. Each pixel also includes a coupling structure disposed in the coupling region and within the slab waveguide. The coupling structure includes two materials having different indices of refraction arranged as a grating defined by a grating period. The junction region comprises a p-n junction in communication with electrical contacts for biasing and collection of carriers resulting from absorption of incident radiation.

公开(公告)号：US20190137336A1

公开(公告)日：2019-05-09

申请号：US16237942

申请日：2019-01-02

Applicant: SPECTRAFY INC.

Inventor： VIKTAR TATSIANKOU ,  RICHARD BEAL

IPC: G01J3/36 ,  G01J1/04 ,  G01N21/31 ,  G01J3/02 ,  G01J1/06 ,  G01N21/53

CPC classification number: G01J3/36 ,  G01J1/0403 ,  G01J1/0411 ,  G01J1/0433 ,  G01J1/0474 ,  G01J1/0492 ,  G01J1/06 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0262 ,  G01J2001/0481 ,  G01J2001/061 ,  G01J2001/4266 ,  G01J2003/1213 ,  G01J2003/2806 ,  G01N21/31 ,  G01N21/538 ,  G01N2201/0616 ,  G01N2201/065

Abstract: Solar spectral irradiance (SSI) measurements are important for solar collector/photovoltaic panel efficiency and solar energy resource assessment as well as being important for scientific meteorological/climate observations and material testing research. To date such measurements have exploited modified diffraction grating based scientific instruments which are bulky, expensive, and with low mechanical integrity for generalized deployment. A compact and cost-effective tool for accurately determining the global solar spectra as well as the global horizontal or tilted irradiances as part of on-site solar resource assessments and module performance characterization studies would be beneficial. An instrument with no moving parts for mechanical and environment stability in open field, non-controlled deployments could exploit software to resolve the global, direct and diffuse solar spectra from its measurements within the 280-4000 nm spectral range, in addition to major atmospheric processes, such as air mass, Rayleigh scattering, aerosol extinction, ozone and water vapour absorptions.

公开(公告)号：US10210963B2

公开(公告)日：2019-02-19

申请号：US15366652

申请日：2016-12-01

Applicant: ASML Netherlands B.V.

Inventor： Vahan A. Senekerimyan ,  Michael A. Purvis ,  Jie L. Ding

IPC: H05G2/00 ,  G21K1/06 ,  G01J1/42 ,  G01T1/16 ,  G03F7/00 ,  G03F7/20 ,  G01J1/04 ,  G01J1/06 ,  G01J1/02

Abstract: A method includes generating light in a light generating chamber, causing a portion of the generated light to pass through a tube having a roughened inner surface, and detecting the portion of the generated light that has passed through the tube using a photodetector. The roughened inner surface of the tube has a surface roughness sufficient to cause grazing incidences of light to be eliminated rather than to be reflected off the roughened inner surface. In one example, the method includes outputting a signal from the photodetector to a controller, with the signal corresponding to the detected portion of the generated light. The light generated in the light generating chamber can be extreme ultraviolet (EUV) light. In tests using roughened and non-roughened protection tubes, the roughened tube was found to minimize or essentially eliminate the contribution to EUV energy from grazing incidence reflections off the inner surface of the tube.

公开(公告)号：US10191022B2

公开(公告)日：2019-01-29

申请号：US15242231

申请日：2016-08-19

Applicant: Michele Hinnrichs

Inventor： Michele Hinnrichs

IPC: G01N33/00 ,  G01J3/18 ,  G02B5/18 ,  G01J3/02 ,  G01N21/3504 ,  G01J3/26 ,  G01J3/28 ,  G01J1/06

Abstract: A spectral radiation gas detector has at least one lenslet with a circular blazed grating for diffraction of radiation to a focal plane. A detector is located at the focal plane receiving radiation passing through the at least one lenslet for detection at a predetermined diffraction order. A plurality of order filters are associated with the at least one lenslet to pass radiation at wavelengths corresponding to the predetermined diffraction order, each filter blocking a selected set of higher orders. A controller is adapted to compare intensity at pixels in the detector associated with each of the plurality of order filters and further adapted to determine a change in intensity exceeding a threshold.