Abstract:
A method is used to perform dark current compensation in a sensor (e.g., a CCD or CMOS sensor). A first and second array of devices (e.g., pixels) in the sensor are used to determine a first dark current value. The first array of pixels in the sensor receives impinging light and generates optical energy values therefrom. The second array of pixels in the sensor are used to determine a second dark current value at substantially a same time as the generating of the optical energy values. The second array of devices being non-sensitive to the impinging light. The first and second dark current values are used to compensate the optical energy values.
Abstract:
An infrared absorption gauge includes a detector circuit including a detector for detecting electromagnetic radiation from a sample and for generating a signal representing the radiation received, and means for stabilizing a response characteristic of the detector to the radiation detected thereby, said stabilizing means having a GaAs diode for directing radiation at the detector and means for controlling the radiation source in dependence upon the signal generated by the detector. The stabilizing means thus acts as a negative feedback loop and seeks to maintain the overall illumination irradiating the detector (i.e. the combined illumination that is reflected back from the sample and that is emitted by the GaAs diode), at a substantially constant predetermined level, which tends to linearize and extend the frequency response of the detector to the radiation detected.
Abstract:
Equipment on automotive vehicle is controlled by a system including at least one semiconductor light sensor having variable sensitivity to light. Each light sensor generates a light signal indicative of the intensity of light incident on the light sensor. Control logic varies the sensitivity of the light sensor and generates equipment control signals based on received light signals. Sensitivity of light sensors may be varied by changing the integration time for producing charge from light incident on light transducers, by selecting between light transducers of different sensitivity within the light sensor, by using a light transducer with a sensitivity that is a function of the amount of incident light, and the like. Controlled equipment includes devices such as automatically dimming rearview mirrors, headlamps, and moisture removal means.
Abstract:
The intensity of each lamp which illuminates an object at an inspection station is controlled by controlling driving voltage applied to a power supply which supplies electrical power to the lamp. A phototransistor is used to sense the intensity of the lamp through an optical fiber. The sensor is followed by a digitally-controlled, variable gain circuit whose output is fed to an A-D converter. A microprocessor analyzes the digital signal from the A-D converter and corrects the driving voltage to the power supply to keep the intensity output of the lamp constant, as seen by a camera of a machine vision system. In this way, feedback corrects for a degraded lamp output due to aging. Preferably, the control of the level of lamp intensity can be changed from a remote system console of the machine vision system to reduce the need for access to internal parts, thereby reducing the probability that human error may cause a malfunction. The method and system of the present invention are particularly useful for inspection of digital versatile discs (DVD's) where the illumination must be changed. Also, the method and system are particularly useful in automated production lines where both audio and DVD discs are inspected. The lamp intensity control method and system can quickly change intensities for the appropriate discs.
Abstract:
A quantum well intersubband infrared (IR) photodetector has a spectral response tunable by an external voltage. The photodetector consists of multiple doped quantum wells with different well widths and barrier heights. The preferred embodiment is made by repeating the whole structure of the active region of a multiple quantum well intersubband IR photodetector. Differences between repeats or groups of well widths and barrier heights result in differences in the spectral IR response of the different repeats. The device resistance of a given group is designed to be very different from those for all the other groups. As a function of an applied voltage, the repeat with the highest resistance will be turned on to detect IR with the response peak at a wavelength .lambda..sub.1. Subsequently, the next highest resistance repeat will turn on when increasing voltage with its response peaked at .lambda..sub.2, and so on. Since .lambda..sub.1, .lambda..sub.2 are different from each other, a voltage tunable multicolor photodetector is realized.
Abstract:
The present invention relates to a photosensitive element (1) for detecting flashes of light (2).According to the invention, said photosensitive element (1) includes a control device (4) knowing the instant of the emission of the flashes of light (2) and capable of switching said photosensitive element into one or the other of two different states:a positive accumulation state in which the accumulation capacitor (12) is charged by the light energy from said photosensitive element (1); anda negative accumulation state in which the accumulation capacitor (12) is discharged by the light energy from said photosensitive element (1).
Abstract:
The fire detector includes a carbon dioxide sensor and a microcomputer. When the rate of increase of the concentration of carbon dioxide at the sensor exceeds a threshold, an alarm is produced. The threshold is set at one of three possible levels by the microcomputer in response to the state of the atmosphere at the sensor as determined by the microcomputer based on several variables that are derived from the sensed concentration of carbon dioxide. The derived variables include the average concentration of carbon dioxide, the average rate of change of carbon dioxide concentration, the monotonicity of the increase or decrease of the carbon dioxide concentration and the range of concentrations sensed in each cycle of operation. The threshold setting is determined every ten seconds. In this way, the setting of the rate threshold is responsive to variations in the carbon dioxide level at the sensor that are caused by entities other than a fire, such as the presence or absence of people in a closed room.
Abstract:
A sensor (210) for diagnosis and prognosis of semiconductor device fabrication processes measures specular, scattered, and total surface reflectances and transmittances of semiconductor wafers (124). The sensor (210) comprises a sensor arm (212) and an opto-electronic control box (214), for directing coherent electromagnetic or optical energy in the direction of semiconductor wafer (124). Opto-electronic control box (214) includes circuitry for measuring the amounts of laser powers coherently reflected from and transmitted through the semiconductor wafer (124) surface and the amounts of electromagnetic powers scatter reflected from and transmitted through the semiconductor wafer (124) surface. The present invention determines specular, scattered, and total reflectance and transmittance as well as surface roughness values for semiconductor wafer (124) based on measurements of coherent and scatter reflected and transmitted laser powers. The sensor (210) of the present invention can also provide a go/no-go test of semiconductor fabrication process quality. A process control computer associates with the sensor (210) to respond to spectral reflectance and transmittance measurements yielding surface roughness and thickness measurements as well as diagnosis/prognosis analysis results and control signals.
Abstract:
A system for detecting minute amounts of water contaminant in semi-conductor microelectronic integrated circuits (MIC) includes two lasers 11,12 producing electromagnetic radiation at two discrete wavelengths. Each laser beam being sent through a chopper 13 and 14 respectively and combined via mirror 16 and beam splitter 17 to form a single two part beam along optical axis 22. The beam passes through a reflective beam splitter 26, a quarter wave plate 28 and lens 29 to be directed to a MIC 31 that is mounted onto drive mechanisms 31 and 32. Diffuse reflections from the bottom of the MIC or specular reflections from metallization layers pass back through MIC 31, lens 29, quarter wave plate 28, beam splitter 27 and through lens 48 to detector 47 which compares the intensity of the radiation at the two wavelengths with the intensities of the wavelengths as detected by detector 21 through a lock-in amplifier 49.
Abstract:
A diffusion-type gas sample chamber for use in a gas analyzer consists of an elongated hollow tube having an inwardly-facing specularly-reflective surface that permits the tube to function also as a light pipe for transmitting radiation from a source to a detector through the sample gas. A number of filtering apertures in the wall of the otherwise non-porous hollow tube permit the sample gas to enter and exit freely under ambient pressure. Particles of smoke and dust of a size greater than 0.1 micron are kept out of the chamber by use of a semi-permeable membrane that spans the apertures in the hollow tube. Condensation of the sample gas components is prevented by heating the sample chamber electrically to a temperature above the dew point of the component of concern.