公开(公告)号：US08629411B2

公开(公告)日：2014-01-14

申请号：US13181724

申请日：2011-07-13

Applicant: Markus E. Beck ,  Janice C. Lee ,  Erel Milshtein

Inventor： Markus E. Beck ,  Janice C. Lee ,  Erel Milshtein

IPC: G01J1/58 ,  G01R31/265

CPC classification number: G01N21/6489 ,  G01N2021/646 ,  G01N2021/6484 ,  G01N2201/1211

Abstract: This invention relates to temperature-corrected photoluminescence spectroscopy which may be applied to semiconductors and, in particular, photovoltaic films.

Abstract translation: 本发明涉及可应用于半导体，特别是光伏膜的温度校正光致发光光谱。

公开(公告)号：US08618506B2

公开(公告)日：2013-12-31

申请号：US13143518

申请日：2010-01-07

Applicant: Isamu Nakao ,  Koshi Tamamura

Inventor： Isamu Nakao ,  Koshi Tamamura

IPC: G01J1/58 ,  G01N21/64

CPC classification number: G01N21/6408 ,  G01N21/6456 ,  G02B21/16 ,  G02B21/367

Abstract: A fluorescence life measuring apparatus, a fluorescence life measuring method and a program are described that can obtain fluorescence life using a simple configuration. The apparatus moves a stage on which a fluorescent material to be measured is placed, irradiates with excitation light the fluorescent material placed on the stage moved at a constant speed, images afterglow of emitted fluorescence caused by the excitation light, and uses an imaged image to detect the elapsed time from a fluorescence position and afterglow strength at a target afterglow position and calculate the fluorescence life.

Abstract translation: 描述了可以使用简单配置获得荧光寿命的荧光寿命测量装置，荧光寿命测量方法和程序。 该装置移动放置荧光材料的阶段，用激发光照射放置在以恒定速度移动的台上的荧光材料，由激发光引起的发射荧光的余辉，并使用成像图像 从目标余辉位置的荧光位置和余辉强度检测经过时间，计算出荧光寿命。

公开(公告)号：US08586945B2

公开(公告)日：2013-11-19

申请号：US13297872

申请日：2011-11-16

Applicant: Matthias Reuss ,  Johann Engelhardt

Inventor： Matthias Reuss ,  Johann Engelhardt

IPC: G01J1/58

CPC classification number: G02B21/0032 ,  G02B21/0068 ,  G02B21/0076

Abstract: A fluorescence light scanning microscope (2) comprises a light source providing excitation light (8) for exciting a fluorophore in a sample to be imaged for spontaneous emission of fluorescence light, and suppression light (7) for suppressing spontaneous emission of fluorescence light by the fluorophore on a common optical axis (4), the suppression wavelength differing from the excitation wavelength; an objective (19) focusing both the excitation (8) and the suppression (7) light to a focus point; a detector (21) detecting fluorescence light (11) spontaneously emitted by the fluorophore; and a chromatic beam shaping device (1) arranged on the common optical axis (4), and including a birefringent chromatic optical element (3) adapted to shape a polarization distribution of the suppression light (7) such as to produce an intensity zero at the focus point, and to leave the excitation light such as to produce a maximum at the focus point.

Abstract translation: 荧光光扫描显微镜（2）包括提供用于激发要成像的样品中的荧光团以激发荧光的自发发射的激发光（8）的光源，以及用于抑制荧光的自发发射的抑制光（7） 荧光团在共同的光轴（4）上，抑制波长与激发波长不同; 将激发（8）和抑制（7）光聚焦到焦点的目标（19） 检测器（21），检测由荧光团自发发射的荧光（11）; 以及布置在公共光轴（4）上的色光束整形装置（1），并且包括适于使抑制光（7）的偏振分布成形的双折射彩色光学元件（3），以产生在 焦点，并留下激发光，以便在焦点处产生最大值。

公开(公告)号：US20130289921A1

公开(公告)日：2013-10-31

申请号：US13926096

申请日：2013-06-25

Applicant: Suresh Gopalan

Inventor： Suresh Gopalan

IPC: G01J1/58 ,  G06F11/00

CPC classification number: G01J1/58 ,  G06F11/004 ,  G16B25/00

Abstract: Methods and systems for high-confidence utilization of datasets are disclosed. In one embodiment, the method includes selecting a metric for determining substantially optimal combination of true positives and false positives in a data set, applying an optimization technique, and obtaining, from the results of the optimization technique, a value for at least one optimization parameter, the value for at least one optimization parameter resulting in substantially optimal combination of true positives and false positives. A number of true positives and a number of false positives are a function of the one or more optimization parameters.

公开(公告)号：US08569716B2

公开(公告)日：2013-10-29

申请号：US12668734

申请日：2007-07-12

Applicant: Max Sonnleitner

Inventor： Max Sonnleitner

IPC: G01J1/58

CPC classification number: G01N21/648 ,  G01N21/6454

Abstract: The underlying objective is to create an optoelectronic sensor system which illuminates the specimen homogenously and only allows produced fluorescent light to reach the photoactive layer. The objective is achieved substantially by creating a total reflection layer for the introduced light before or above the optoelectronic sensor layer. This can be applied in all fields in which microarray biochips are used.

Abstract translation: 其基本目的是创建一种光电传感器系统，其均匀地照射样品，并且仅允许产生的荧光到达光敏层。 通过在光电传感器层之前或之上形成用于引入的光的全反射层来实现该目的。 这可以应用于使用微阵列生物芯片的所有领域。

公开(公告)号：US20130265407A1

公开(公告)日：2013-10-10

申请号：US13857610

申请日：2013-04-05

Applicant: CARL ZEISS MICROSCOPY GMBH

Inventor： Robin Zur Nieden

IPC: G01J1/58

CPC classification number: G01J1/58 ,  G01N21/6458 ,  G02B21/16

Abstract: A method for determining a critical angle of total reflection based upon images captured at different angles of incidence of a light beam includes illuminating a sample with an excitation light beam, capturing images of at least part of the sample at a plurality of different angles of incidence of the excitation light beam, and determining a critical angle of total reflection at an interface of the sample based upon analysis of the images. An apparatus for determining a critical angle of total reflection at an interface of a sample includes a light source arrangement to illuminate a sample with an angle of incidence, an image capturing arrangement to capture an image of the sample, and a processing arrangement to determine the critical angle of total reflection at an interface of the sample on the basis of an analysis of images captured at a plurality of different angles of incidence.

Abstract translation: 基于以不同的入射角捕获的图像来确定全反射的临界角的方法包括用激发光束照射样品，以多个不同的入射角拍摄至少部分样品的图像 的激发光束，并且基于图像的分析来确定样品的界面处的全反射的临界角。 用于确定样品的界面处的全反射的临界角的装置包括以入射角照射样品的光源装置，用于捕获样品的图像的图像捕获装置，以及用于确定样品的处理装置 基于对以多个不同入射角拍摄的图像的分析，在样品的界面处的全反射的临界角。

公开(公告)号：US08476605B2

公开(公告)日：2013-07-02

申请号：US13379923

申请日：2010-03-04

Applicant: Shigetami Kasai ,  Hiroshi Isa ,  Makoto Iijima ,  Yasushi Nagata

Inventor： Shigetami Kasai ,  Hiroshi Isa ,  Makoto Iijima ,  Yasushi Nagata

IPC: G01J1/58

CPC classification number: C09K11/628 ,  G21K4/00 ,  G21K2004/06

Abstract: A scintillator panel which has achieved enhanced sharpness and sensitivity is disclosed, comprising on a first support a phosphor layer comprising phosphor columnar crystals formed by a process of vapor phase deposition and containing a parent component of cesium iodide (CsI) and an activator of thallium (Tl), and the phosphor layer comprising a first layer of a CsI layer which is in the bottom portion of the phosphor layer and does not contain any activator of thallium, and on the first layer, a second layer of a CsI—Tl layer which contains the activator of thallium and exhibits not more than 32% of a coefficient of variation of concentration of thallium in the direction of thickness.

Abstract translation: 公开了一种实现提高的清晰度和灵敏度的闪烁体面板，其包括在第一支撑件上的荧光体层，该荧光体层包括通过气相沉积工艺形成的荧光体柱状晶体，并含有碘化铯（CsI）的母体成分和铊的活化剂 T1），并且所述荧光体层包括位于所述荧光体层的底部中并且不包含任何铊激活剂的CsI层的第一层，并且在所述第一层上具有CsI-T1层的第二层， 含有铊的活化剂，并且在厚度方向上不超过铊的浓度变化系数的32％以下。

公开(公告)号：US08445867B2

公开(公告)日：2013-05-21

申请号：US13578218

申请日：2011-02-22

Applicant: Paul R. Selvin ,  Paul Dennis Simonson

Inventor： Paul R. Selvin ,  Paul Dennis Simonson

IPC: G01J1/58

CPC classification number: G01N21/6458 ,  G06T3/4069

Abstract: A method of image analysis creates super-resolution images from images with high densities of fluorophores by processing a movie in which the fluorescent molecules or particles are photobleaching or blinking. The method looks for the individual photobleaching events that can be located with high resolution (nm to tens of nanometers scale). The positions of the photobleaching or blinking events are then drawn in a composite image that is at a much higher resolution than the original fluorescence movie.

Abstract translation: 图像分析的方法通过处理荧光分子或颗粒光漂白或闪烁的影片，从具有高密度荧光团的图像产生超分辨率图像。 该方法寻找可以以高分辨率（nm到数十纳米级）定位的各个光漂白事件。 然后将光漂白或闪烁事件的位置绘制在比原始荧光电影高得多的分辨率的合成图像中。

公开(公告)号：US08421034B2

公开(公告)日：2013-04-16

申请号：US13646169

申请日：2012-10-05

Applicant: Olympus Corporation

Inventor： Fumiko Ono

IPC: G01J1/58

CPC classification number: A61B1/05 ,  A61B1/00009 ,  A61B1/043 ,  A61B5/0071 ,  A61B5/0084

Abstract: Provided is a fluoroscopy apparatus comprising a white-light-image generating section that generates a white-light image of observation target, a fluorescence-image generating section that generates a fluorescence image of the observation target, a fluorescence-image correcting section that normalizes the fluorescence image with the white-light image, a displacement calculating section that calculates the displacement of the observation target from a plurality of white-light images generated at time intervals, a region-size calculating section that calculates the size of a region having a fluorescence intensity higher than or equal to a predetermined threshold value from the fluorescence image, and a control unit that controls the fluorescence-image correcting section so that, when the displacement of the observation target relative to the size of the region is larger than or equal to a predetermined proportion, normalization of the fluorescence image is stopped.

Abstract translation: 本发明提供一种荧光透视装置，其包括产生观察对象物的白光图像的白色光图像生成部，产生观察对象物的荧光图像的荧光图像生成部，使该观察对象的荧光图像正常化的荧光图像校正部 具有白光图像的荧光图像;位移计算部，其计算来自以时间间隔生成的多个白光图像的观察对象的位移;区域尺寸计算部，其计算具有荧光的区域的大小; 强度高于或等于来自荧光图像的预定阈值;以及控制单元，其控制所述荧光图像校正部，使得当所述观察对象相对于所述区域的大小的位移大于或等于 预定比例，停止荧光图像的归一化。

公开(公告)号：US08410446B2

公开(公告)日：2013-04-02

申请号：US12525477

申请日：2008-02-04

Applicant: Ryouhei Nakamura ,  Shunsuke Ueda

Inventor： Ryouhei Nakamura ,  Shunsuke Ueda

IPC: G01T1/20 ,  G01J1/58

CPC classification number: G21K4/00 ,  C01F17/0018 ,  C01G15/00 ,  C01G15/006 ,  C04B35/01 ,  C04B35/44 ,  C04B35/6261 ,  C04B35/6455 ,  C04B2235/3206 ,  C04B2235/3224 ,  C04B2235/3229 ,  C04B2235/3232 ,  C04B2235/3272 ,  C04B2235/3279 ,  C04B2235/3286 ,  C04B2235/5436 ,  C04B2235/5445 ,  C04B2235/608 ,  C04B2235/661 ,  C04B2235/725 ,  C04B2235/764 ,  C04B2235/77 ,  C09K11/7774 ,  G01T1/20 ,  G21K2004/06

Abstract: A fluorescent material for a scintillator to be used in a radiation detector is provided. The fluorescent material is designed to have a high fluorescent intensity and a low level of afterglow a short term of 1 to 300 ms after the termination of X-ray radiation.The above fluorescent material contains Ce as an activator. In addition, the material must contain at least Gd, Al, Ga, O, Fe, and a component M. The component M is at least one of Mg, Ti, and Ni. In addition, the composition of the material must be expressed by the general formula: (Gd1-x-zLuxCez)3+a(Al1-u-sGauScs)5−aO12 wherein 0≦a≦0.15, 0≦x≦0.5, 0.0003≦z≦0.0167, 0.2≦u≦0.6, and 0≦s≦0.1, and wherein, regarding the concentrations of Fe and M, Fe: 0.05≦Fe concentration (mass ppm)≦1, and 0≦M concentration (mass ppm)≦50.

Abstract translation: 提供了用于辐射检测器中的闪烁体的荧光材料。 荧光材料被设计为在X射线辐射终止后短时间内具有高的荧光强度和低余量的1至300ms的余辉。 上述荧光材料含有Ce作为活化剂。 此外，材料必须至少含有Gd，Al，Ga，O，Fe和成分M.组分M是Mg，Ti和Ni中的至少一种。 另外，材料的组成必须用以下通式表示：（Gd1-x-zLuxCez）3 + a（Al1-u-sGauScs）5-aO12，其中0＆lt; nlE; a＆nlE; 0.15,0和nlE; x＆ 对于Fe和M的浓度，Fe：0.05＆nlE; Fe浓度（质量ppm）＆nlE; 1和0＆lt; nlE; M＆gt;;＆nlE; z＆nlE; 0.0167,0.2＆nlE; u＆nlE; 0.6和0＆ 浓度（质量ppm）＆nlE; 50。