Abstract:
An LED light bulb has a hollow LED support/heat sink (222, 602, 702, 900, 802, 1002, 1102, 1216, 1404, 1502, 1606, 1906) with fins (234, 406, 604, 706, 804, 904, 906,1008, 1106, 1620) extending internally and openings at two ends (230, 232, 1522). Heat generated by the LEDs (238, 908, 1242, 1624, 2504) is conducted through the heat sink fins and is removed by a convectively driven air flow that flows through the LED support/heat sink. LEDs are mounted on multiple external faces (236, 404, 910, 1524, 1622) of the LED support/heat sink thereby providing illumination in all directions. Lenses (1246, 2102, 2104) are provided for the LEDs to make the illumination highly uniform.
Abstract:
Provided is an integrated gas discharge tube. In the integrated gas discharge tube, the structure of the gas discharge tube is regulated into an upper cover and an insulative base, and the internal side surface and the external side surface of the bottom surface of the insulative base are respectively subject to electrode integration, so that the discharge effect of the gas discharge tube is effectively increased and the preparation process and the preparation flow of a multi-terminal-to-ground gas discharge tube are greatly simplified so as to greatly simplify the preparation process and to realize batch production and high integration of the gas discharge tube. Also provided is a preparation method for an integrated gas discharge tube.
Abstract:
There is provided an amorphous oxide semiconductor including hydrogen and at least one element of indium (In) and zinc (Zn), the amorphous oxide semiconductor containing one of hydrogen atoms and deuterium atoms of 1×1020 cm−3 or more to 1×1022 cm−3 or less, and a density of bonds between oxygen and hydrogen except bonds between excess oxygen (OEX) and hydrogen in the amorphous oxide semiconductor being 1×1018 cm−3 or less.
Abstract translation:提供了包含氢和铟(In)和锌(Zn)的至少一种元素的非晶氧化物半导体,含有1×1020cm-3以上至1×1022的氢原子和氘原子之一的非晶氧化物半导体 cm 3以下,除了非晶形氧化物半导体中的过量氧(OEX)和氢之间的键之外,氧与氢之间的键的密度为1×1018cm-3以下。
Abstract:
A light emitting device has a light emitting element, and a phosphor layer of phosphor glass to generate fluorescence while being excited by light emitted from the light emitting element. The light emitting element emits ultraviolet light, and the phosphor glass generates visible fluorescence while being excited by the ultraviolet light.
Abstract:
A laser stimulated atom probe for atom probe imaging of dielectric and low conductivity semiconductor materials is disclosed. The laser stimulated atom probe comprises a conventional atom probe providing a field emission tip and ion detector arrangement, a laser system providing a laser short laser pulse and synchronous electronic timing signal to the atom probe, and an optical system for delivery of the laser beam onto the field emitting tip apex. Due to enhanced absorption, it is also possible to realize a photo ionization mechanism, wherein the laser stimulates electronic transitions from the more extended surface atoms, thereby ionizing the surface atom.
Abstract:
In a cathode ray tube socket, contacts to be respectively connected with terminal pins of a cathode ray tube are housed in a body, which has formed therein a chamber for a pair of electrode holders, the electrode holders being removably and adjustably supported in position within the chamber by cooperating projections and depressions, each electrode holder having fitted therein an electrode plate, and semispherical electrode portions projecting from the electrode plates are disposed adjacent each other to define therebetween a spark gap, one of the electrode plates being electrically connected with a contact for high voltage use.
Abstract:
A reliable overload protection tube utilizes a meltable sealing material to mount an electrode within a metallic enclosure. The interelectrode gap between the tube electrodes is adjusted to determine the desired tube breakdown voltage. Voltage in excess of breakdown ionizes the tube and conducts the overload current safely to ground. The sealing material upon excess overload current becomes heated and melted allowing the electrodes to move into a short circuit contact to ground.
Abstract:
An overvoltage protecting element comprises a hollow cylinder of an insulating material, a pair of electrodes sealed to the opposite ends of the cylinder, and a pair of conductive layers disposed on the inner wall of the cylinder so as to be located opposite to the respective electrodes and each having a projection which extends toward the electrode. The conductive layers are of the band type, and one or more projections are provided on a part thereof. In order to prevent deterioration of insulation resistance by repeated discharge, the conductive layers are provided at positions which are electrically insulated from the two main electrodes.
Abstract:
An electron tube socket having a plurality of terminal pin contacts coupled to electrically conductive connectors which define a predetermined spacial distance or spark gap between the connector and a conductor ring for dissipating surges of high voltage electrical energy. The tube socket has discrete gaps formed between the connectors and conductor ring such that arcing is initiated across contiguous edges of the spark gap and the surfaces adjacent the contiguous edges are positioned such that after initiation of arcing, the arcing energy is dissipated along these surfaces. The edges of the connectors and conductor ring are abraded to precisely and accurately control breakdown voltage for protection against over-voltage transients by removing nonmeniscus discontinuities from the edges thereby eliminating low impedance points which vary arc over voltage and facilitate low voltage corona breakdown.