公开(公告)号：US20130025367A1

公开(公告)日：2013-01-31

申请号：US13190813

申请日：2011-07-26

Applicant: MICHAEL KEVIN BRADLEY

Inventor： MICHAEL KEVIN BRADLEY

IPC: G01D11/24 ,  B23P11/00

CPC classification number: G01D11/245 ,  G01N21/01 ,  G01N21/3504 ,  G01N2201/0224 ,  G01N2201/0227 ,  Y10T29/49826

Abstract: A method of protecting a sensor for use in an environment, includes providing a protective enclosure formed in a plurality of sections, at least a first section of the plurality of sections being movable relative to a second section of the plurality of sections so that the protective enclosure can be placed around at least a portion of the sensor; placing the first section adjacent the sensor while the first section and the second section are in an open state; and moving the second section to place the first section and the second section in a closed state in which the first section and the second section encompass the at least a portion of the sensor.

Abstract translation: 一种保护用于环境中的传感器的方法，包括提供形成在多个部分中的保护外壳，所述多个部分中的至少第一部分可相对于所述多个部分的第二部分移动，使得所述保护 外壳可以放置在传感器的至少一部分周围; 当所述第一部分和所述第二部分处于打开状态时，将所述第一部分放置在所述传感器附近; 并且移动所述第二部分以使所述第一部分和所述第二部分处于关闭状态，其中所述第一部分和所述第二部分包围所述传感器的所述至少一部分。

公开(公告)号：US08243275B2

公开(公告)日：2012-08-14

申请号：US12490137

申请日：2009-06-23

Applicant: Masashi Kuwahara ,  Toshio Fukaya ,  Takayuki Shima ,  Junji Tominaga ,  Rie Endo ,  Masahiro Susa ,  Michio Suzuki ,  Koichi Tsutsumi

Inventor： Masashi Kuwahara ,  Toshio Fukaya ,  Takayuki Shima ,  Junji Tominaga ,  Rie Endo ,  Masahiro Susa ,  Michio Suzuki ,  Koichi Tsutsumi

IPC: G01N21/55

CPC classification number: G01N21/211 ,  G01N21/0332 ,  G01N2201/0227 ,  G01N2201/023 ,  G01N2201/0231

Abstract: An apparatus for optical measurement of a liquid or molten material, which has: a transparent container which has a bottom face and is capable of containing a to-be-measured material therein, with the bottom face at least having a flat face and being transparent; and an optical device that irradiates a light to the bottom face of the container and that detects and measures a reflected light from the bottom face; and a method for optically measuring a liquid or molten material using the apparatus.

Abstract translation: 一种用于液体或熔融材料的光学测量的装置，其具有：具有底面并且能够容纳待测材料的透明容器，底面至少具有平坦的表面并且是透明的 ; 以及光学装置，其将光照射到所述容器的底面，并且检测并测量来自所述底面的反射光; 以及使用该装置光学测量液体或熔融材料的方法。

公开(公告)号：US20070291255A1

公开(公告)日：2007-12-20

申请号：US11845580

申请日：2007-08-27

Applicant: David Larsen ,  Zhi Xu

Inventor： David Larsen ,  Zhi Xu

IPC: G01N21/00

CPC classification number: G01J3/02 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/42 ,  G01J3/45 ,  G01J2003/425 ,  G01N21/274 ,  G01N21/31 ,  G01N2021/3137 ,  G01N2201/0227 ,  G01N2201/127

Abstract: Increasing signal to noise ratio in optical spectra obtained by spectrophotometers. An interferometer introduces interference effects into a source light beam. A dual beam configuration splits the source beam having the interference effects into a reference beam and a sample beam. The reference beam interacts with a reference substance and is detected by a reference detector. The sample beam interacts with a sample substance and is detected by a sample detector. An optical spectra of the sample is based on the difference between the detected reference beam and the detected sample beam.

Abstract translation: 通过分光光度计获得的光谱增加信噪比。 干涉仪将干扰效应引入源光束。 双光束配置将具有干涉效应的源光束分解成参考光束和样本光束。 参考光束与参考物质相互作用，并由参考检测器检测。 样品束与样品物质相互作用，并由样品检测器检测。 样品的光谱基于检测到的参考光束和检测到的样品光束之间的差异。

公开(公告)号：US20050277209A1

公开(公告)日：2005-12-15

申请号：US10644745

申请日：2003-08-21

Applicant: Hideki Tanaka

Inventor： Hideki Tanaka

IPC: C23C16/505 ,  G01J1/00 ,  G01N21/68 ,  G01R31/26 ,  G01T1/24 ,  H01J37/32 ,  H01L21/00 ,  H01L21/3065 ,  H01L21/66

CPC classification number: H01J37/32935 ,  G01N21/68 ,  G01N2201/0227 ,  G01N2201/023

Abstract: In a plasma processing apparatus that forms plasma from a process gas by supplying the process gas into a processing container and applying high-frequency power to an electrode provided inside the processing container on which a workpiece is placed and executes specific plasma processing on the processing surface of the workpiece, apparatus state parameter data indicating a state of the plasma processing apparatus are obtained through measurement executed by a parameter measuring instrument, optical data are obtained through measurement executed by an optical measuring instrument and electrical data are obtained through measurement executed by an electrical measuring instrument. A means for plasma leak judgment judges that a plasma leak has occurred if there is a fluctuation in the data.

Abstract translation: 在等离子体处理装置中，通过将处理气体供给到处理容器中并将高频电力施加在设置有工件的处理容器内部的电极上，从而从处理气体形成等离子体，并对处理面进行特定的等离子体处理 通过由参数测量仪器执行的测量获得指示等离子体处理装置的状态的装置状态参数数据，通过光学测量仪器执行的测量获得光学数据，并且通过由电气执行的测量获得电气数据 测量仪器。 用于等离子体泄漏判定的装置判断如果数据有波动，则发生等离子体泄漏。

公开(公告)号：US06930771B2

公开(公告)日：2005-08-16

申请号：US10717316

申请日：2003-11-19

Applicant: Allan Rosencwaig ,  Lanhua Wei

Inventor： Allan Rosencwaig ,  Lanhua Wei

IPC: G01J4/04 ,  G01N21/21 ,  G01N21/95 ,  H01L21/00 ,  H01L21/306 ,  H01L21/66 ,  G01N21/00

CPC classification number: H01L21/02046 ,  G01N21/211 ,  G01N21/9501 ,  G01N2201/0227 ,  G01N2201/023 ,  H01L21/02054 ,  H01L21/67028 ,  H01L21/67115 ,  H01L22/20

Abstract: A method for improving the measurement of semiconductor wafers is disclosed. In the past, the repeatability of measurements was adversely affected due to the unpredictable growth of a layer of contamination over the intentionally deposited dielectric layers. Repeatability can be enhanced by removing this contamination layer prior to measurement. This contamination layer can be effectively removed in a non-destructive fashion by subjecting the wafer to a cleaning step. In one embodiment, the cleaning is performed by exposing the wafer to microwave radiation. Alternatively, the wafer can be cleaned with a radiant heat source. These two cleaning modalities can be used alone or in combination with each other or in combination with other cleaning modalities. The cleaning step may be carried out in air, an inert atmosphere or a vacuum. Once the cleaning has been performed, the wafer can be measured using any number of known optical measurement systems.

公开(公告)号：US06922246B2

公开(公告)日：2005-07-26

申请号：US10372763

申请日：2003-02-21

Applicant: David Nilson ,  Brad Rice ,  Tamara Troy

Inventor： David Nilson ,  Brad Rice ,  Tamara Troy

IPC: A01K1/03 ,  A22B3/00 ,  A61M16/00 ,  A61M16/10 ,  A61M16/18 ,  A61M16/20 ,  G01N21/64 ,  G01J3/30 ,  F21V9/16 ,  G01N21/25

CPC classification number: G01N21/6456 ,  A01K1/031 ,  A61M16/104 ,  A61M16/18 ,  A61M16/202 ,  A61M2016/0039 ,  G01N2021/1787 ,  G01N2021/6463 ,  G01N2021/6471 ,  G01N2021/6484 ,  G01N2201/0227 ,  G01N2201/0826

Abstract: A macroscopic fluorescence illumination assembly is provided for use with an imaging apparatus with a light-tight imaging compartment. The imaging apparatus includes an interior wall defining a view port extending into the imaging compartment to enable viewing of a specimen contained therein. The illumination assembly includes a specimen support surface sized and dimensioned for receipt in the imaging compartment, and oriented to face toward the view port of the imaging apparatus. The support surface is substantially opaque and defines a window portion that enables the passage of light there through. The window portion is selectively sized and dimensioned such that the specimen, when supported atop the support surface, can be positioned and seated over the window portion in a manner forming a light-tight seal substantially there between. The illumination assembly further includes an excitation light source, and a bundle of fiber optic strands having proximal ends thereof in optical communication with the light source. The distal ends of the strands terminate proximate the window portion of the support surface. The distal ends each emit a respective beam of light originating from the light source which are then collectively directed toward the window portion and into a bottom side of the specimen wherein the diffused light passes there through and exits a topside thereof for receipt through the view port to view the fluorescence of the specimen.

公开(公告)号：US20040161853A1

公开(公告)日：2004-08-19

申请号：US10365798

申请日：2003-02-13

Inventor： Zhongping Yang ,  James K. Carney ,  Roy C. Martin

IPC: G01N021/00

CPC classification number: A61B5/0031 ,  G01N21/6428 ,  G01N21/77 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/7759 ,  G01N2021/7786 ,  G01N2201/022 ,  G01N2201/0227

Abstract: A method and apparatus is provided for determining a property of an analyte using a sensing layer whose optical response changes with the analyte. The apparatus includes a housing with an optically transparent window for receiving the sensing layer. The window passes optical stimulation to the sensing layer and the optical response from the sensing layer. A stimulating light emitter is coupled to a first face of an optical body monolithically coupled to the window and a light detector is coupled to a second face of the optical body for receiving the response. The optical response changes as the concentration of the analyte changes. Reference molecules included in the sensing layer can provide a calibration signal to a second light detector mounted on a third face of the optical body. The first, second and third faces of the optical body are different and not coplanar.

Abstract translation: 提供了一种使用其光响应随分析物变化的感测层来确定分析物的性质的方法和装置。 该装置包括具有用于接收感测层的光学透明窗口的壳体。 窗口将光学刺激传递到感测层和来自感测层的光学响应。 刺激光发射器耦合到单体耦合到窗口的光学体的第一面，并且光检测器耦合到光学体的第二面以接收响应。 光学响应随分析物浓度的变化而变化。 包括在感测层中的参考分子可以向安装在光学体的第三面上的第二光检测器提供校准信号。 光学体的第一面，第二面和第三面不同，不共面。

公开(公告)号：US09915605B2

公开(公告)日：2018-03-13

申请号：US15462021

申请日：2017-03-17

Applicant: Dräger Safety AG & Co. KGaA

Inventor： Patrick Schmidt-Kaeding

IPC: G01N21/3504 ,  G01N21/09 ,  G01N21/03

CPC classification number: G01N21/3504 ,  G01N21/09 ,  G01N2021/0314 ,  G01N2021/3513 ,  G01N2201/0227 ,  G01N2201/024 ,  G01N2201/086

Abstract: An in-situ gas-measuring system (1) includes an IR photon source (10) and an IR photon detector (11). The in-situ gas-measuring system (1) has an expansion chamber (12), at which an optical element (16, 16′, 16″) is arranged. A connection element (13) provides a detachable fluid-communicating connection of the expansion chamber (12) to a gas reaction chamber (2). The IR-photon source (10), the optical element (16, 16′, 16″) and the IR photon detector (11) define an optical measuring path, which extends through the expansion chamber (12). The installation and maintenance of the in-situ gas-measuring system (1) are reduced by the features of the in-situ gas-measuring system (1).

公开(公告)号：US20180061610A1

公开(公告)日：2018-03-01

申请号：US15791818

申请日：2017-10-24

Applicant: Schlumberger Technology Corporation

Inventor： Matthieu Simon ,  Anthony Durkowski ,  Christian Stoller

IPC: H01J35/02 ,  E21B47/08 ,  G01V3/30 ,  G01V3/12 ,  G01N23/20 ,  E21B47/01

CPC classification number: H01J35/025 ,  E21B47/011 ,  E21B47/082 ,  E21B47/1015 ,  E21B49/00 ,  G01N9/24 ,  G01N23/20008 ,  G01N2035/00306 ,  G01N2201/0227 ,  G01N2223/05 ,  G01N2223/204 ,  G01N2223/30 ,  G01V3/12 ,  G01V3/30 ,  G01V5/0008 ,  G01V5/04 ,  G01V5/12 ,  H01J3/023 ,  H01J37/061 ,  H01J43/04 ,  H02M7/103 ,  H05G1/10 ,  H05H3/06 ,  H05H5/045 ,  Y10T29/41 ,  Y10T29/49117

Abstract: A well-logging tool may include a sonde housing, and a radiation generator carried by the sonde housing. The radiation generator may include a generator housing, a target carried by the generator housing, a charged particle source carried by the generator housing to direct charged particles at the target, and at least one voltage source coupled to the charged particle source. The at least one voltage source may include a voltage ladder comprising a plurality of voltage multiplication stages coupled in a bi-polar configuration, and at least one loading coil coupled at at least one intermediate position along the voltage ladder. The well-logging tool may further include at least one radiation detector carried by the sonde housing.

公开(公告)号：US09709538B2

公开(公告)日：2017-07-18

申请号：US14239330

申请日：2011-09-30

Applicant: Wei Wu ,  Zhiyong Li ,  Ansoon Kim ,  Min Hu ,  Michael Josef Stuke

Inventor： Wei Wu ,  Zhiyong Li ,  Ansoon Kim ,  Min Hu ,  Michael Josef Stuke

IPC: G01N31/22 ,  G01N21/64 ,  G01N21/65 ,  B01L3/00 ,  B82Y15/00

CPC classification number: G01N31/22 ,  B01L3/5085 ,  B01L3/50853 ,  B01L2200/141 ,  B01L2300/0636 ,  B01L2300/069 ,  B01L2300/0819 ,  B82Y15/00 ,  G01N21/648 ,  G01N21/658 ,  G01N2201/0227 ,  G01N2201/023 ,  Y10T436/25

Abstract: Devices to detect a substance and methods of producing such a device are disclosed. An example device to detect a substance includes a housing defining an externally accessible chamber and a seal to enclose at least a portion of the chamber. The example device also includes a substrate includes nanoparticles positioned within the chamber. The nanoparticles to react to the substance when exposed thereto. The example device also includes a non-analytic solution within the chamber to protect the nanoparticles from premature exposure.