公开(公告)号：US09932620B2

公开(公告)日：2018-04-03

申请号：US13537267

申请日：2012-06-29

Applicant: Subramani Sellappan ,  Andrew Hearn ,  Salvatore Seminara

Inventor： Subramani Sellappan ,  Andrew Hearn ,  Salvatore Seminara

IPC: C12M1/34 ,  G01N21/76 ,  G01N1/34 ,  C12Q1/04 ,  G01N21/77 ,  G01N1/38 ,  G01N33/569 ,  G01N1/02 ,  G01N1/40

CPC classification number: C12Q1/04 ,  G01N1/38 ,  G01N21/76 ,  G01N21/77 ,  G01N33/56911 ,  G01N2001/028 ,  G01N2001/4061 ,  G01N2001/4088 ,  G01N2201/02

Abstract: A rapid, sensitive method of separating and detecting microorganisms from a sample potentially containing microorganisms, such as but not limited to bacteria, fungi, yeast, viruses, and the like. The method relies on separation techniques to separate and concentrate the cells from the sample, together with chemical techniques to amplify the amount of detectable signal from low numbers of cells to provide a rapid and sensitive method of detecting microorganisms. This detection method may utilize: a filtration device; a centrifugation device; a system; a swab device; and kit comprising one or more of the devices and components to perform the present method of separating and detecting microorganisms in a sample potentially containing microorganisms. The sample may be a chemical, cosmetic, personal care, pharmaceutical, or consumable good in its raw material, in-process, and/or finished product states that needs to be tested for any contaminating microorganisms prior to shipment to the consumer.

公开(公告)号：US09903817B1

公开(公告)日：2018-02-27

申请号：US15407095

申请日：2017-01-16

Applicant: The United State of America, as represented by the Secretary of the Department of the Interior

Inventor： Karl B. Haase ,  Ward E. Sanford

IPC: G01N21/61 ,  B01D19/00 ,  G01N33/00

CPC classification number: G01N21/61 ,  B01D19/0031 ,  G01N33/004 ,  G01N2201/02

Abstract: The dissolved gas sensor system includes a dissolved gas sensor partially located within a housing and partially extending through the housing lid. The sensor is created by affixing a selectively permeable membrane to a dissolved gas transducer with a waterproof polymer. This forms a membrane cavity between the membrane, polymer, and transducer. The membrane cavity allows the transducer to detect whatever gas or gases can pass through the selectively permeable membrane. These readings pass to a controller located within the housing body that can receive and process data, and store the data in a removable data storage for later retrieval by a user. The controller can also regulate overall power consumption of the system to increase the operating life of the system.

公开(公告)号：US20170341110A1

公开(公告)日：2017-11-30

申请号：US15670033

申请日：2017-08-07

Applicant: Ackley Machine Corporation

Inventor： E. Michael ACKLEY ,  Mark FORD

IPC: B07C5/342 ,  B07C5/36 ,  G01N21/85 ,  G01N21/88 ,  B07C5/34 ,  G01N21/84

CPC classification number: B07C5/3422 ,  B07C5/34 ,  B07C5/3412 ,  B07C5/362 ,  B07C5/363 ,  G01N21/85 ,  G01N21/8806 ,  G01N21/8851 ,  G01N2021/845 ,  G01N2021/8592 ,  G01N2201/02 ,  G01N2201/062 ,  G01N2201/0621 ,  Y10T29/49826

Abstract: An inspection system is configured for use with a conveyer apparatus including carrier bars. Each carrier bar conveys pellet-shaped articles along a predetermined path. The inspection system includes at least one camera unit for sensing a predetermined characteristic of the pellet-shaped articles, a removal unit, and a controller. The removal unit, downstream from the at least one camera unit, removes selected pellet-shaped article(s) from the carrier bar(s) depending on whether the characteristic is sensed by the at least one camera unit. The controller is in communication with the at least one camera unit and the removal unit. The controller provides a signal to the removal unit in accordance with the sensed characteristic. The removal unit includes a rotatable ejection drum having extended vacuum nozzles along its length, equal to the number of articles conveyed in each carrier bar. Each vacuum nozzle selectively removes article(s) from the carrier bar(s) by suction.

公开(公告)号：US09778192B2

公开(公告)日：2017-10-03

申请号：US14632486

申请日：2015-02-26

Applicant: KLA-Tencor Corporation

Inventor： Christophe Wouters ,  Steven Boeykens ,  Carl Smets

IPC: G01N21/00 ,  H04N7/18 ,  G01N21/64 ,  G01N21/88 ,  G01N21/95 ,  G01N21/958

CPC classification number: G01N21/6489 ,  G01N21/8806 ,  G01N21/9501 ,  G01N21/958 ,  G01N2201/02 ,  G01N2201/061 ,  G01N2201/06113 ,  G01N2201/06193 ,  G01N2201/062

Abstract: An object carrier, a system and a method is disclosed for the back light inspection of transparent or semitransparent objects. The carrier has a carrier base layer with photo luminescent properties which carries the transparent or semitransparent object on top of the layer. The transparent or semitransparent object could be a wafer and the object carrier could be a wafer chuck. At least one light source being arranged above the object carrier such that excitation light emitted from the at least one light source is directed through the transparent or semitransparent object to the layer with photo luminescent properties. The light returned from the layer with photo luminescent properties is collected by an objective and registered by a sensor.

公开(公告)号：US09746467B2

公开(公告)日：2017-08-29

申请号：US14354253

申请日：2012-10-25

Applicant: Thibaut Mercey

Inventor： Thibaut Mercey

IPC: G01J3/44 ,  G01N21/55 ,  C12M3/00 ,  G01N33/53 ,  G01N33/554 ,  C40B30/04 ,  C40B60/12 ,  G01N33/543 ,  G01N21/552 ,  G01N21/25

CPC classification number: G01N33/54373 ,  G01N21/253 ,  G01N21/553 ,  G01N2201/02 ,  G01N2201/08 ,  G01N2469/00

Abstract: A microstructured chip (3; 33; 43; 53; 63) for surface plasmon resonance (SPR) analysis, taking the form of a solid formed by: a base (5; 77); an upper surface (4; 44), at least part of which is covered with a metal layer (2; 22; 42; 52; 62); and at least one side surface (55; 66). The chip is characterized in that the aforementioned upper surface is provided with micrometric zones intended to receive species to be analyzed and selected from among n protrusions and m cavities, and in that when n+m≧2 the zones are separated from one another by planar surfaces, with n varying between 1 and j, m varying between 0 and i, and j and i being integers.

公开(公告)号：US09689804B2

公开(公告)日：2017-06-27

申请号：US14577374

申请日：2014-12-19

Applicant: KLA-Tencor Corporation

Inventor： Yakov Bobrov

IPC: G01B11/24 ,  G01N21/88 ,  G01N21/95 ,  H01L21/66

CPC classification number: G01N21/8806 ,  G01B11/24 ,  G01N21/9501 ,  G01N2201/02 ,  G01N2201/06113 ,  H01L22/12

Abstract: A system for inspecting a backside surface of a wafer with multi-channel focus control includes a set of inspection sub-systems including a first inspection sub-system positioned and an additional inspection sub-system. The first and additional inspection sub-systems include an optical assembly, an actuation assembly, where the optical assembly is disposed on the actuation assembly, and a positional sensor configured to sense a position characteristic between a portion of the optical assembly and the backside surface of the wafer. The system also includes a controller configured to acquire one or more wafer profile maps of the backside surface of the wafer and adjust a first focus position of the first inspection sub-system or an additional focus position of the additional inspection sub-system based on the received one or more wafer profile maps.

公开(公告)号：US09664620B2

公开(公告)日：2017-05-30

申请号：US14413806

申请日：2013-06-11

Applicant: Carl Zeiss Microscopy GmbH

Inventor： Helmut Lippert ,  Thomas Kalkbrenner ,  Ingo Kleppe ,  Ralf Wolleschensky

IPC: G02B21/06 ,  G01N21/64 ,  G02B21/16 ,  G02B21/36 ,  G02B21/00 ,  G02B21/26

CPC classification number: G01N21/6458 ,  G01N2021/6463 ,  G01N2201/02 ,  G01N2201/06113 ,  G02B21/0032 ,  G02B21/0048 ,  G02B21/0076 ,  G02B21/008 ,  G02B21/06 ,  G02B21/16 ,  G02B21/26 ,  G02B21/367

Abstract: A microscope including a sample carrier configured to support a sample. Excitation light illuminates the sample via an excitation beam path, Detection light from the sample is guided to detection means via a detection beam path. Through an objective arranged along the optical axis, excitation light is guided in direction of the sample carrier and detection light coming from the sample is guided in direction of the detection means. Beam-splitting means separate excitation light and detection light. Also provided are means for generating a light sheet from excitation light, and means for illuminating the sample with this light sheet. The light sheet lies in a plane at a nonzero angle to the optical axis. The means for illuminating the sample include an optical-deflecting device arranged on or at the sample carrier, which deflects excitation light from the objective into the plane of the light sheet via an optically active surface.

公开(公告)号：US20170118457A1

公开(公告)日：2017-04-27

申请号：US15398240

申请日：2017-01-04

Applicant: GII ACQUISITION, LLC dba GENERAL INSPECTION, LLC

Inventor： Michael G. Nygaard ,  Nathan Andrew-Paul Kujacznski

IPC: H04N13/02 ,  G06K9/62 ,  F42B35/00 ,  G01N21/95

CPC classification number: H04N13/254 ,  B07C5/342 ,  F42B35/00 ,  G01B11/2433 ,  G01N21/909 ,  G01N21/9515 ,  G01N21/952 ,  G01N2201/02 ,  G01N2201/0224 ,  G01N2201/0621 ,  G01N2201/0638 ,  G01N2201/12 ,  G06K9/6202

Abstract: A method and system for inspecting a manufactured part at an inspection station are provided. A supported part is rotated about a measurement axis so that the part moves at predetermined angular increments during at least one rotational scan. A backside beam of collimated radiation is directed at and is occluded by the supported part at each of a first plurality of consecutive increments of movement to create a stream of unobstructed portions of the backside beam in rapid succession passing by and not blocked by the supported part. A frontside beam of radiation is directed at and is reflected by the supported part at each of a second plurality of consecutive increments of movement to create a stream of reflected portions of the frontside beam in rapid succession. The streams of reflected and unobstructed portions are detected at the inspection station to obtain electrical signals which are processed.

公开(公告)号：US09588038B2

公开(公告)日：2017-03-07

申请号：US14641217

申请日：2015-03-06

Applicant: Beckman Coulter, Inc.

Inventor： Robert Retter ,  Yagang Liu ,  Patty Pang ,  Brian Peterson

IPC: G01N21/01 ,  G01N21/03 ,  G01N35/00 ,  G01N35/04 ,  G01N35/10 ,  G01N21/59

CPC classification number: G01N21/03 ,  G01N21/01 ,  G01N21/59 ,  G01N35/0099 ,  G01N35/04 ,  G01N35/10 ,  G01N2021/0346 ,  G01N2035/0465 ,  G01N2035/1039 ,  G01N2035/1062 ,  G01N2201/02 ,  G01N2201/062

Abstract: An analytical system is disclosed. The analytical system includes a storage container configured to store a plurality of capillaries. It also includes a gripper configured to receive at least one of the plurality of capillaries, and move the at least one capillary so that an end of the capillary contacts a sample in a sample container and draws the sample in the capillary. The system also includes a reader configured to detect a signal from the sample in the capillary.

Abstract translation: 公开了一种分析系统。 分析系统包括被配置为存储多个毛细管的存储容器。 它还包括构造成容纳多个毛细管中的至少一个毛细管并且移动至少一个毛细管的夹持器，使得毛细管的一端与样品容器中的样品接触并将样品抽吸在毛细管中。 该系统还包括被配置为检测来自毛细管中的样品的信号的读取器。

公开(公告)号：US09574990B2

公开(公告)日：2017-02-21

申请号：US14377708

申请日：2012-02-28

Applicant: Devin Alexander Mourey ,  Vladek Kasperchik ,  James William Stasiak

Inventor： Devin Alexander Mourey ,  Vladek Kasperchik ,  James William Stasiak

IPC: G01N21/65 ,  G01N21/01

CPC classification number: G01N21/01 ,  G01N21/658 ,  G01N2201/02 ,  G01N2201/068

Abstract: The present disclosure describes a surface enhanced Raman spectroscopy (SERS) apparatus and methods of forming and using the SERS apparatus. An example of a SERS apparatus includes a nanoporous material on an upper surface of a substrate, a plurality of SERS-active structures on an upper surface of the nanoporous material, and a Raman-active material on a surface of each of SERS-active structures.

Abstract translation: 本公开描述了表面增强拉曼光谱（SERS）装置以及形成和使用SERS装置的方法。 SERS装置的实例包括在基底的上表面上的纳米多孔材料，在纳米多孔材料的上表面上的多个SERS-活性结构，以及每个SERS活性结构的表面上的拉曼活性物质 。