公开(公告)号：US20220301841A1

公开(公告)日：2022-09-22

申请号：US17837773

申请日：2022-06-10

Applicant: Thermo Fisher Scientific (Bremen) GmbH

Inventor： Alexander KHOLOMEEV ,  Gregor QUIRING ,  Frank CZEMPER

IPC: H01J49/00 ,  H01J49/42 ,  H01J49/02 ,  H01J49/28

Abstract: A signal processing unit comprises: at least one data signal input line adapted to receive a measured data signal generated by an image current, the measured data signal comprising an added crosstalk signal induced by a source of electromagnetic disturbance; at least one disturbance signal input line adapted to receive a decoupled disturbance signal, extracted from the source of electromagnetic disturbance; an output line adapted to supply a compensated data signal; a conditioning module, to which the decoupled disturbance signal is supplied via the disturbance signal input line and which provides a compensation signal; and an adding module, to which the measured data signal and the compensation signal are provided and in which the measured data signal and the compensation signal are superposed, whereby the decoupled disturbance signal is conditioned by the conditioning module such that the compensation signal essentially corresponds to an inverted added crosstalk signal.

公开(公告)号：US11101126B2

公开(公告)日：2021-08-24

申请号：US16754629

申请日：2018-12-04

Applicant: INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES

Inventor： Yu Liu ,  Guoqiang Tang ,  Qiuli Li

IPC: H01J49/24 ,  H01J49/14 ,  H01J49/28 ,  H01J49/04

Abstract: A method and system for measuring an inert gas by an ion probe. Embedding a to-be-measured sample into an epoxy resin, to obtain a sample target, where the to-be-measured sample includes an inert gas atom; after putting the obtained sample target into an analysis chamber of the ion probe, vacuumizing the analysis chamber, where the ion probe includes a primary ion source, an electron gun, a mass analyzer, and an ion detector; bombarding the sample target by using a primary ion beam formed by the primary ion source to release the inert gas atom in the sample target; ionizing the released inert gas atom by using an electron beam formed by the electron gun to form an inert gas ion; and analyzing a secondary ion containing the inert gas ion by using the mass analyzer and the ion detector to achieve measurement of the inert gas.

公开(公告)号：US11043370B2

公开(公告)日：2021-06-22

申请号：US16860548

申请日：2020-04-28

Applicant: Battelle Memorial Institute

Inventor： Elizabeth Denis ,  Brian Dockendorff ,  Robert Ewing ,  Eric Wilcox Freeburg ,  Kelsey Morrison ,  Megan Nims ,  Blandina Valenzuela

IPC: H01J49/28 ,  G01N27/62 ,  G01N27/622

Abstract: Disclosed herein are embodiments of a system for selectively ionizing samples that may comprise a plurality of different analytes that are not normally detectable using the same ionization technique. The disclosed system comprises a unique split flow tube that can be coupled with a plurality of ionization sources to facilitate using different ionization techniques for the same sample. Also disclosed herein are embodiments of a method for determining the presence of analytes in a sample, wherein the number and type of detectable analytes that can be identified is increased and sensitivity and selectivity are not sacrificed.

公开(公告)号：US20200258734A1

公开(公告)日：2020-08-13

申请号：US16860548

申请日：2020-04-28

Applicant: Battelle Memorial Institute

Inventor： Elizabeth Denis ,  Brian Dockendorff ,  Robert Ewing ,  Eric Freeburg ,  Kelsey Morrison ,  Megan Nims ,  Blandina Valenzuela

IPC: H01J49/28 ,  G01N27/62

Abstract: Disclosed herein are embodiments of a system for selectively ionizing samples that may comprise a plurality of different analytes that are not normally detectable using the same ionization technique. The disclosed system comprises a unique split flow tube that can be coupled with a plurality of ionization sources to facilitate using different ionization techniques for the same sample. Also disclosed herein are embodiments of a method for determining the presence of analytes in a sample, wherein the number and type of detectable analytes that can be identified is increased and sensitivity and selectivity are not sacrificed.

公开(公告)号：US10720317B2

公开(公告)日：2020-07-21

申请号：US16214566

申请日：2018-12-10

Applicant: MERIDION, LLC

Inventor： Nicholas Wilton

IPC: H01J49/28 ,  H01J49/14 ,  H01J49/00 ,  H01J49/04 ,  H01J49/22 ,  H01J49/32

Abstract: Among other things, we describe methods and apparatus for the ionization of target molecular analytes of interest, e.g., for use in mass spectrometry. In some implementations, a thin molecular stream is emitted in either single or a split mode and encounters both an electron-impact ion source and trochoidal electron monochromator placed sequentially or coincidentally. The first ion source emits high-energy electrons (˜70 eV) to generate characteristic positively-charged mass fragment spectra while the second source emits low-energy electrons in a narrow bandwidth to generate negative molecular ions or other ions via electron capture ionization. The dual ion source may be coupled to analytical instruments such as a gas chromatograph and to any number of mass analyzers such as a polarity switching quadrupole mass analyzer or to multiple mass analyzers.

公开(公告)号：US20200168447A1

公开(公告)日：2020-05-28

申请号：US16636948

申请日：2018-07-26

Applicant: Micromass UK Limited

Inventor： Anatoly Verenchikov

IPC: H01J49/40 ,  H01J49/42 ,  H01J49/06 ,  H01J49/02 ,  H01J49/00 ,  H01J49/28

Abstract: Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi- reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.

公开(公告)号：US20200161119A1

公开(公告)日：2020-05-21

申请号：US16631874

申请日：2018-07-23

Applicant: Micromass UK Limited

Inventor： Keith George Richardson ,  Kevin Giles ,  Steven Derek Pringle ,  Jason Lee Wildgoose ,  David J. Langridge

IPC: H01J49/28 ,  G01N27/62 ,  H01J49/00

Abstract: A method of ion mobility and/or mass spectrometry is disclosed in which the ion mobility and/or mass to charge ratio of an ion is determined using an algorithm or relationship that relates the transit time or average ion velocity of the ion through an ion separation device in which one or more time-varying electric field is used to separate ions passing therethrough to one or more parameters for the device, the mass to charge ratio of the ion and the ion mobility of the ion.

公开(公告)号：US10580635B2

公开(公告)日：2020-03-03

申请号：US16076385

申请日：2017-02-07

Applicant: Luxembourg Institute Of Science And Technology (LIST)

Inventor： Roch Andrzejewski ,  Rachid Barrahma ,  David Dowsett ,  Tom Wirtz

IPC: H01J49/20 ,  H01J49/28 ,  H01J49/24

Abstract: An electromagnet assembly suitable for mass spectrometer comprising one yoke; and two pole pieces; the pole pieces being comprised in a vacuum chamber and being separated from each other by a pole piece gap defining a passage for the charged particles to be deflected; the yoke forming a bridge over the two pole pieces thus defining a magnetic circuit. The electromagnet assembly further comprises one electrical circuit for generating a magnetic flux in the magnetic circuit, the electrical circuit being included in the yoke. The electromagnet assembly is remarkable in that the pole pieces are electrically insulated from the electrical circuit and from the yoke by first electrical insulating means and are electrically insulated from the vacuum chamber.

公开(公告)号：US20190304768A1

公开(公告)日：2019-10-03

申请号：US16306809

申请日：2017-06-05

Applicant: MICROMASS UK LIMITED

Inventor： Emrys Jones ,  Richard Chapman ,  Steven Derek PRINGLE

IPC: H01J49/16 ,  H01J49/14 ,  H01J49/28 ,  H01J49/00

Abstract: A method of analysing a sample is disclosed that comprises surveying a sample in a first mode of operation by directing a spray of charged droplets onto the sample, determining one or more regions of interest in the sample, and analysing the one or more regions of interest in a second different mode of operation by directing a spray of charged droplets onto the sample. The spot size of the spray of charged droplets at a point of impact with the sample may be varied.

公开(公告)号：US10410852B2

公开(公告)日：2019-09-10

申请号：US16059380

申请日：2018-08-09

Applicant: SHIMADZU CORPORATION

Inventor： Kosuke Hosoi

IPC: H01J49/00 ,  H01J49/28 ,  H01J49/02 ,  H01J49/04 ,  H01J49/16 ,  H01J49/24 ,  H01J49/42

Abstract: An analytical device includes: a valve assembly that is connected to a plurality of gas supply conduits; and a gas supply chamber to which a plurality of gases are supplied through the valve assembly, wherein: the valve assembly includes a plurality of valves that regulate flow rates of the plurality of gases supplied to the gas supply chamber through the plurality of gas supply conduits, a fixing member that integrally fixes the plurality of valves, a plurality of first sealing members that seal the plurality of valves against the fixing member, and a retainer that is fastened to the fixing member to integrally press the first sealing member against the fixing member.