公开(公告)号：US10337926B2

公开(公告)日：2019-07-02

申请号：US16191733

申请日：2018-11-15

Applicant: MELEXIS TECHNOLOGIES NV

Inventor： Carl Van Buggenhout ,  Karel Vanroye

IPC: G01J5/02 ,  G01J5/12 ,  G01J5/22 ,  G01J5/00

Abstract: A semiconductor device for measuring IR radiation comprising: at least one sensor pixel; at least one reference pixel shielded from said IR radiation comprising a heater; a controller adapted for: measuring a responsivity by applying power to the heater, while not heating the sensor pixel; measuring a first output signal of an unheated pixel and a first reference output signal of the heated pixel, obtaining the responsivity as a function of a measure of the applied power to the heater and of the difference between the first output signal and the first reference output signal; applying a period of cooling down until the temperature of the reference pixel and the sensor pixel are substantially the same; generating the output signal indicative of the IR radiation, based on the difference between the sensor and the reference output signal, by converting this difference using the responsivity.

公开(公告)号：US20190132159A1

公开(公告)日：2019-05-02

申请号：US16170333

申请日：2018-10-25

Applicant: MELEXIS TECHNOLOGIES NV

Inventor： Michael FREY ,  Thomas FREITAG

IPC: H04L25/02 ,  G06F13/36 ,  G06F13/42 ,  G06F13/40

Abstract: A transmitter for establishing communication between a device and a differential network bus includes current driving means connected to each of the two conduction lines of the differential network bus, through a first and second conduction paths of the transmitter; at least one unidirectional current regulator for extracting a first current equal to a known ratio of a parasitic current circulating through the first conduction path, with a direction inverse to the driving current through the conduction path connected to one of the lines of the differential bus; means for obtaining, from the first current, a second current with a magnitude equal to the original magnitude of the parasitic current; and means for introducing the second current into the second conduction path connected to the other line of the differential bus.

公开(公告)号：US20190113366A1

公开(公告)日：2019-04-18

申请号：US16157306

申请日：2018-10-11

Applicant: Melexis Technologies NV

Inventor： Javier BILBAO DE MENDIZABAL

IPC: G01D5/16

Abstract: A magnetic field sensor is described comprising at least three magnetic flux concentrator sections integrated on a planar substrate, each section being adjacent to at least one of the other sections and being separated by gaps. The sensor comprises at least a first sensing element positioned for sensing flux density in or near the gap between a first section and a second section and at least a second sensing element positioned for sensing flux density in or near the gap between the first section and at least a further section. The magnetic field sensor further comprises further sensing elements arranged to measure changes of the magnetic field in the direction perpendicular to the substrate.

公开(公告)号：US10171018B2

公开(公告)日：2019-01-01

申请号：US15629977

申请日：2017-06-22

Applicant: Melexis Technologies NV

Inventor： Marcel Jakobus Gerardus Braat ,  Marc Lambrechts

IPC: H02H7/08 ,  H02P8/38 ,  H02P6/28 ,  H02P8/22 ,  H02P8/36

Abstract: A method for detecting stall of a multiphase motor operated in a sinusoidal micro-stepped mode. The method comprises: a) measuring at least one phase current and/or measuring the sum of all phase currents at regular time intervals synchronous with the micro-steps, b) calculating the difference between the measured phase current at a first moment and the measured phase current of the same phase at a previous moment and/or the difference between the measured sum of all phase currents at a first moment and the measured sum of all phase currents at a previous synchronous moment, c) analyzing the series of obtained current differences so as to generate a stall detection signal.

公开(公告)号：US20180336145A1

公开(公告)日：2018-11-22

申请号：US15974862

申请日：2018-05-09

Applicant: MELEXIS TECHNOLOGIES NV

Inventor： Philippe LAUGIER ,  Benoit HEROUX ,  Thomas FREITAG

IPC: G06F13/12 ,  G06F11/10

CPC classification number: G06F13/126 ,  G06F9/30 ,  G06F11/08 ,  G06F11/10 ,  G06F11/106 ,  G06F11/1096 ,  G06F11/2043 ,  G06F13/122 ,  G06F15/7832

Abstract: A method for performing an initialization or a reset of a port of an integrated circuit includes: receiving in a device for supervising ports, from a central processing unit of the integrated circuit, a port initialisation signal comprising port initialisation data and one or more parity bits; inverting in the device for supervising ports the one or more parity bits in accordance with the port initialization signal; providing the port initialisation signal comprising the port initialisation data and the inverted one or more parity bits to the port of the integrated circuit; on receipt of the port initialisation signal at the port, inverting again in the port the inverted one or more parity bits, thereby obtaining the original one or more parity bits and storing the port initialisation data and the just obtained original one or more parity bits.

公开(公告)号：US10107898B2

公开(公告)日：2018-10-23

申请号：US14956515

申请日：2015-12-02

Applicant: MELEXIS TECHNOLOGIES NV

Inventor： Volodymyr Seliuchenko

IPC: G01S7/486 ,  H01L27/146 ,  G01S7/484 ,  G01S17/10

Abstract: A semiconductor pixel unit for sensing near-infrared light, and for optionally simultaneously sensing visible light. The pixel unit comprises a single substrate with a first semiconductor region and a second semiconductor region electrically separated by an insulating region, for example a buried oxide layer. The pixel unit is adapted for generating a lateral electrical field in the second region for facilitating transport of photoelectrons generated in the second region by near-infrared light passing through the first region and the insulating region.

公开(公告)号：US20180246191A1

公开(公告)日：2018-08-30

申请号：US15899868

申请日：2018-02-20

Applicant: Melexis Technologies NV

Inventor： Saad AHMAD ,  Volodymyr SELIUCHENKO ,  Sharath PATIL ,  Darrell LIVEZEY ,  Marcelo MIZUKI

IPC: G01S7/486 ,  G01S7/487 ,  G01S17/02

CPC classification number: G01S7/4861 ,  G01S7/4876 ,  G01S17/02 ,  H04N5/3658 ,  H04N5/378

Abstract: A sample and hold system, for capturing and reading a sequence of traces of an input signal. The sample and hold system comprising a readout device, a controller, and a sample and hold array of unit cells. The controller is configured for controlling the sample and hold system, such that during an acquisition phase a trace of samples is taken from the input signal in an original sample order and such that the samples are held in the unit cells wherein the samples are assigned to the unit cells in an acquisition order, such that during a consecutive readout phase the samples are read out from the unit cells wherein the order in which the unit cells are read out corresponds with a readout order, and such that the acquisition order and/or the readout order differs from trace to trace.

公开(公告)号：US09989409B2

公开(公告)日：2018-06-05

申请号：US14964927

申请日：2015-12-10

Applicant: MELEXIS TECHNOLOGIES NV

Inventor： Appolonius Jacobus Van Der Wiel

IPC: G01J1/42 ,  G01J1/16 ,  G01J5/02 ,  G01J5/04 ,  G01J5/06 ,  G01J5/12 ,  G01J5/14 ,  G01J5/20

CPC classification number: G01J1/4228 ,  G01J1/1626 ,  G01J5/0225 ,  G01J5/024 ,  G01J5/0285 ,  G01J5/045 ,  G01J5/06 ,  G01J5/061 ,  G01J5/12 ,  G01J5/14 ,  G01J5/20 ,  G01J2005/0048 ,  G01J2005/063 ,  G01J2005/065 ,  G01J2005/066 ,  G01J2005/068

Abstract: A semiconductor device for measuring IR radiation is disclosed. It comprises a substrate and a cap enclosing a cavity, a sensor pixel in the cavity, comprising a first absorber for receiving said IR radiation, a first heater, first temperature measurement means for measuring a first temperature; a reference pixel in the same cavity, comprising a second absorber shielded from said IR radiation, a second heater, and second temperature measurement means for measuring a second temperature; a control circuit for applying a first/second power to the first/second heater such that the first temperature equals the second temperature; and an output circuit for generating an output signal indicative of the IR radiation based on a difference between the first and second power.

公开(公告)号：US20180017369A1

公开(公告)日：2018-01-18

申请号：US15546789

申请日：2016-01-28

Applicant: MELEXIS TECHNOLOGIES NV ,  K. K. MELEXIS JAPAN TECHNICAL RESEARCH CENTER

Inventor： Takumi YOSHIYA

IPC: G01B7/02

CPC classification number: G01B7/023 ,  F02M51/0653 ,  F02M57/005 ,  F02M65/00 ,  F02M65/005 ,  F02M2200/242 ,  F02M2200/245 ,  G01B7/004

Abstract: To provide a displacement detection device that detects a displacement of a measuring object housed in a casing without changing the design of the casing or while suppressing the design change of the casing.A displacement detection device includes a pair of magnets arranged outside an injector body housing a needle with a space between the magnets and forming a magnetic field in the space, a soft magnetic material connected to the needle inside the injector body and displaced in accordance with the displacement of the needle and disposed in the magnetic field formed by the pair of magnets, and a sensor disposed outside the injector body and in the magnetic field formed by the pair of magnets, and detecting a change in magnetic flux density in accordance with the displacement of the soft magnetic material.

公开(公告)号：US09857247B2

公开(公告)日：2018-01-02

申请号：US14399623

申请日：2013-05-07

Applicant: MELEXIS TECHNOLOGIES NV

Inventor： Samuel Huber ,  Johan Raman ,  Pieter Rombouts ,  Appolonius Jacobus Van Der Wiel

IPC: G01R33/06 ,  G01L1/22 ,  G01R33/07 ,  G01L1/18 ,  G01R33/00 ,  G01L1/12

CPC classification number: G01L1/2293 ,  G01L1/125 ,  G01L1/18 ,  G01R33/0029 ,  G01R33/0035 ,  G01R33/07

Abstract: A method determines isotropic stress by means of a Hall element which includes a plate-shaped area made of a doped semiconductor material and comprises four contacts contacting the plate-shaped area and forming corners of a quadrangle, two neighboring corners of the quadrangle defining an edge thereof. At least one van der Pauw transresistance value in at least one van der Pauw measurement set-up of the Hall element is determined, wherein the four contacts of the Hall element form contact pairs, a contact pair comprising two contacts defining neighboring corners of the quadrangle. One contact pair supplies a current and the other contact pair measures a voltage. A relationship between the supplied current and the measured voltage defines the Van der Pauw transresistance value. The method comprises determining a stress signal which depends on the at least one Van der Pauw transresistance value and determining isotropic stress.