Abstract:
The present invention relates to an apparatus for focusing particle beams using a radiation pressure capable of obtaining the same flow amount and a narrower particle beam width with respect to the particle size and a higher numeral density. It is possible to form the particle beams by applying the radiation pressure to the particles with respect to the flow condition that cannot form the particle beams with respect to the set particle sizes. There is provided an apparatus for focusing particle beams using a radiation pressure, comprising an orifice part that is provided at a predetermined portion of the flow tube, and a lens having a hole with a predetermined diameter for thereby focusing the particle flow into a particle beam and applying a radiation pressure to the flow particles; and a light source supply part (A) provided at a portion opposite to the discharge outlet of the mixing tube.
Abstract:
In certain example embodiments of this invention, there is provided an ion source including an anode and a cathode. In certain example embodiments, a multi-piece outer cathode is provided. The multi-piece outer cathode allows precision adjustments to be made, thereby permitting adjustment of the magnetic gap between the inner and outer cathodes. This allows improved performance to be realized, and/or prolonged operating life of certain components. This may also permit multiple types of gap adjustment to be performed with different sized outer cathode end pieces. In certain example embodiments, cathode fabrication costs may also be reduced.
Abstract:
An ion beam extractor controls a direction and an intensity of ion beams by adjusting a voltage applied to a grid having slits formed therein, thereby enhancing uniformity of an etching rate of a wafer, leading to an increase of productivity of semiconductor diodes. The ion beam extractor comprises an ion source to produce an ion beam and at least one grid located at a rear end of the ion source in a progressing path of the ion beam produced by the ion source to adjust a direction of the ion beam by controlling a voltage applied to the at least one grid.
Abstract:
A multi-grid ion beam source has an extraction grid, an acceleration grid, a focus grid, and a shield grid to produce a highly collimated ion beam. A five grid ion beam source is also disclosed having two shield grids. The extraction grid has a high positive potential and covers a plasma chamber containing plasma. The acceleration grid has a non-positive potential. The focus grid is positioned between the acceleration grid and the shield grid. The combination of the extraction grid and the acceleration grid extracts ions from the plasma. The focus grid acts to change momentum of the ions exiting the acceleration grid, focusing the ions into a more collimated ion beam than previous approaches. In one embodiment, the focus grid has a large positive potential. In another embodiment, the focus grid has a large negative potential.
Abstract:
Positional accuracy of apertures in nonplanar electrodes is improved with a new fabrication method. This method precedes process steps which establish a photoresist pattern that defines apertures with deformation steps which produce a nonplanar electrode. Thus, the deformation steps do not have an opportunity to spatially alter the photoresist pattern. The improved positional accuracy enhances the performance and lifetime of ion thrusters which include nonplanar electrodes that are fabricated with this process.
Abstract:
An ion source for use in an ion implanter. The ion source includes a gas confinement chamber having conductive chamber walls that bound a gas ionization zone. The gas confinement chamber includes an exit opening to allow ions to exit the chamber. A base positions the gas confinement chamber relative to structure for forming an ion beam from ions exiting the gas confinement chamber. A supply of ionizable material routes the material into the gas confinement chamber. An antenna that is supported by the base has a metallic radio frequency conducting segment mounted directly within the gas confinement chamber to deliver ionizing energy into the gas ionization zone.
Abstract:
Carbon-carbon grids for ion optics sets are thermomechanically stable under the extreme temperature changes that are experienced in ion thrusters. Screen, accelerator and decelerator grids are thermomechanically stable, lightweight, and resistant to erosion from ion sputtering and have extended lifetimes over conventional molybdenum grids.
Abstract:
An innovative method is proposed for the production of ion extraction grids, comprising the stages of:disposing a plurality of wires or metallic filaments in a lattice structure;coating said structure with a layer of boron.The coating with boron may take place by thermal reduction of boron trichloride in a hydrogen atmosphere. This makes it possible to produce grids at low cost and with high resistance to sputtering, suitable for use for the extraction, focusing and acceleration of the beam in ion sources for industrial and space applications.
Abstract:
An ion source has the typical chamber wherein ions are produced and caused to be propelled outwardly through at least a pair of grids which have a mutually-aligned respective plurality of apertures. Thus, there are the usual cathode, anode, magnet assembly, ionizable gas inlet and supporting power supplies as well as neutralizing means. First and second grids each have an integrally-formed peripheral marginal portion. A support element has a shape which matches and overlies the marginal portion of one grid, while a clamp has a shape which matches that of and overlies the other marginal portion. The support element and clamp are secured together. First and second mutually-aligned seats are successively spaced around the respective marginal portions. A plurality of insulators, each having of circular cross-section, are individually seated between the two different marginal portions in a manner to cause general alignment while enabling radial movement due to thermal expansion of the marginal portions relative to the support element and the clamp and each other.