公开(公告)号：US06520652B1

公开(公告)日：2003-02-18

申请号：US09993271

申请日：2001-11-14

Applicant: Rong Huang ,  Brian Cranton ,  Masud Azimi

Inventor： Rong Huang ,  Brian Cranton ,  Masud Azimi

IPC: G02B2700

CPC classification number: G02B27/0018 ,  G02B6/4251 ,  G02B6/4277 ,  G02B2006/12126 ,  H01S5/02208 ,  H01S5/0683 ,  H01S2301/02

Abstract: A method for reducing reflection of undesirable light in an opto-electronic package includes the coating of the interior surfaces of the package with light absorbing materials. Accordingly, when stray or scattered light is incident on package surfaces, reflections are minimized and therefore the optical noise, interference and feedback are reduced.

Abstract translation: 用于减少光电子封装中的不期望光的反射的方法包括用光吸收材料涂覆封装的内表面。 因此，当杂散或散射光入射到封装表面时，反射最小化，因此光噪声，干扰和反馈降低。

公开(公告)号：US20080180661A1

公开(公告)日：2008-07-31

申请号：US11668083

申请日：2007-01-29

Applicant: Gordon C. Brown ,  Michael Burka ,  Brian Cranton ,  David Erickson ,  James Grassi ,  Matthew Patrick Hammond ,  Maximillan Ben Shaffer ,  Pierre Villeneuve

Inventor： Gordon C. Brown ,  Michael Burka ,  Brian Cranton ,  David Erickson ,  James Grassi ,  Matthew Patrick Hammond ,  Maximillan Ben Shaffer ,  Pierre Villeneuve

IPC: G01J3/44

CPC classification number: G01N21/65 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/26 ,  G01J3/36 ,  G01J3/44 ,  G01J2003/1269 ,  G01N2021/1793 ,  G01N2021/8416 ,  G01N2201/0245 ,  G01N2201/067

Abstract: An optical apparatus for measurement of industrial chemical processes. The analyzer uses Raman scattering and performs measurement of chemical concentrations in continuous or batch processes. The analyzer operates at a standoff distance from the analyte (or analytes) and can measure concentrations through an optical port, facilitating continuous, non-destructive, and non-invasive analysis without extracting the analyte or analytes from the process. The analyzer can measure one or several solid, liquid, or gaseous analytes, or a mixture thereof.

Abstract translation: 一种用于测量工业化学工艺的光学装置。 分析仪使用拉曼散射，并在连续或间歇过程中进行化学浓度的测量。 分析仪与分析物（或分析物）隔开距离，并且可以通过光学端口测量浓度，有助于连续，非破坏性和非侵入性分析，而无需从该过程中提取分析物或分析物。 分析仪可以测量一种或多种固体，液体或气体分析物或其混合物。

公开(公告)号：US06762938B2

公开(公告)日：2004-07-13

申请号：US10021936

申请日：2001-12-13

Applicant: Parviz Tayebati ,  Brian Cranton ,  Daryoosh Vakhshoori ,  Masud E. Azimi ,  Kevin J. McCallion

Inventor： Parviz Tayebati ,  Brian Cranton ,  Daryoosh Vakhshoori ,  Masud E. Azimi ,  Kevin J. McCallion

IPC: H05K720

CPC classification number: H01S5/02415 ,  G02B26/001 ,  H01S5/02446 ,  H01S5/02476 ,  Y10S257/93

Abstract: Apparatus is disclosed for providing auxiliary cooling and thermal stability to a temperature sensitive opto-electronic component. The disclosed apparatus comprising a primary thermal control system having a first thermal connection with a primary structure supporting at least one component of an optical system and a second thermal connection being thermally connected with an external environment; and an auxiliary thermal control system having a first thermal connection being thermally connected with the temperature sensitive opto-electronic component, and the auxiliary thermal control system having a second thermal connection being thermally connected with the primary thermal control system whereby the auxiliary thermal control system provides cooling to the temperature sensitive opto-electronic component and the primary thermal control system provides additional cooling to the auxiliary thermal control system through temperature regulation of the primary structure.

Abstract translation: 公开了用于向温度敏感的光电子部件提供辅助冷却和热稳定性的装置。 所公开的设备包括主热控制系统，其具有第一热连接，其具有支撑光学系统的至少一个部件的主结构和与外部环境热连接的第二热连接; 以及辅助热控制系统，其具有与所述感温光电子部件热连接的第一热连接，并且所述辅助热控制系统具有与主热控制系统热连接的第二热连接，由此所述辅助热控制系统提供 冷却到温度敏感的光电子部件，并且主要热控制系统通过一级结构的温度调节为辅助热控制系统提供额外的冷却。

公开(公告)号：US08077309B2

公开(公告)日：2011-12-13

申请号：US11668083

申请日：2007-01-29

Applicant: Gordon C. Brown ,  Michael Burka ,  Brian Cranton ,  David Erickson ,  James Grassi ,  Matthew Patrick Hammond ,  Maximillan Ben Shaffer ,  Pierre Villeneuve

Inventor： Gordon C. Brown ,  Michael Burka ,  Brian Cranton ,  David Erickson ,  James Grassi ,  Matthew Patrick Hammond ,  Maximillan Ben Shaffer ,  Pierre Villeneuve

IPC: G01J3/44

CPC classification number: G01N21/65 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/26 ,  G01J3/36 ,  G01J3/44 ,  G01J2003/1269 ,  G01N2021/1793 ,  G01N2021/8416 ,  G01N2201/0245 ,  G01N2201/067

Abstract: An optical apparatus for measurement of industrial chemical processes. The analyzer uses Raman scattering and performs measurement of chemical concentrations in continuous or batch processes. The analyzer operates at a standoff distance from the analyte (or analytes) and can measure concentrations through an optical port, facilitating continuous, non-destructive, and non-invasive analysis without extracting the analyte or analytes from the process. The analyzer can measure one or several solid, liquid, or gaseous analytes, or a mixture thereof.

Abstract translation: 一种用于测量工业化学工艺的光学装置。 分析仪使用拉曼散射，并在连续或间歇过程中进行化学浓度的测量。 分析仪与分析物（或分析物）隔开距离，并且可以通过光学端口测量浓度，有助于连续，非破坏性和非侵入性分析，而无需从该过程中提取分析物或分析物。 分析仪可以测量一种或多种固体，液体或气体分析物或其混合物。