Electrical device measurement probes
    1.
    发明申请
    Electrical device measurement probes 审中-公开
    电气设备测量探头

    公开(公告)号:US20070171958A1

    公开(公告)日:2007-07-26

    申请号:US11337641

    申请日:2006-01-23

    Abstract: A probe for use within a high voltage and high current electrical device is disclosed. The probe comprises an optical fiber, a substrate having a slot, and a photoluminescent material. The fiber has a first and second end and is configured to convey an activation light from the first to second end. A portion of the fiber is within the slot such that the slot receives the second end of the fiber. Emission of the photoluminescent material, as a function of temperature, is known. The photoluminescent material is disposed within at least a portion of the slot that faces the second end of the fiber so that they are in optical communication with each other. A change in intensity of a luminescent light emitted back into the fiber by the photoluminescent material when the activation light is conveyed by the fiber onto the photoluminescent material provides an indication of the integrity of the electrical device.

    Abstract translation: 公开了一种在高压和高电流电气装置内使用的探针。 探针包括光纤,具有狭缝的基底和光致发光材料。 光纤具有第一端和第二端,并且被配置为将激活光从第一端传送到第二端。 纤维的一部分在槽内,使得狭槽接收纤维的第二端。 作为温度的函数的光致发光材料的发射是已知的。 光致发光材料设置在与光纤的第二端相对的槽的至少一部分内,使得它们彼此光学连通。 当活化光被光纤输送到光致发光材料上时,通过光致发光材料发射回到光纤中的发光的强度变化提供了电器件的完整性的指示。

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