Minute measuring instrument for high speed and large area and method thereof
    1.
    发明授权
    Minute measuring instrument for high speed and large area and method thereof 有权
    用于高速大面积的分钟测量仪及其方法

    公开(公告)号:US08300221B2

    公开(公告)日:2012-10-30

    申请号:US12666064

    申请日:2008-11-11

    CPC classification number: G01B11/06 G01Q30/02

    Abstract: The present invention relates to a minute measuring instrument for high speed and large area and a method thereof, and more particularly, to a minute measuring instrument for high speed and large area which measures properties of a specimen in high speed by a focused-beam ellipsometric part and then minutely remeasures the position showing a singular point by a minute measuring part and a method thereof.

    Abstract translation: 本发明涉及一种高速大面积的微小测量仪器及其方法,更具体地说,涉及一种高速大面积的微小测量仪器,其通过聚焦光椭圆测量仪测量高速样品的性能 然后通过微小的测量部分及其方法精细地重新显示奇点的位置。

    SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE ELLIPSOMETRY
    3.
    发明申请
    SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE ELLIPSOMETRY 有权
    表面等离子体共振传感器使用光束剖面ELLIPSOMETRY

    公开(公告)号:US20120057146A1

    公开(公告)日:2012-03-08

    申请号:US13121079

    申请日:2009-11-30

    CPC classification number: G01N21/553 G01N2021/212

    Abstract: Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film. The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer, in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer so as to generate SPR according to an angle change of the polarized light; and a flow unit which supplies a buffer solution containing a bio material binding to or dissociation from the metal thin film generating surface plasmon, wherein the SPR and the ellipsometric phase change by change in an angle and a wavelength are simultaneously detected.

    Abstract translation: 提供了使用光束轮廓椭偏仪的多通道表面等离子体共振传感器; 更具体地说,涉及一种高灵敏度测量技术,其与使用多入射角测量方法的垂直照明型聚焦光束椭偏仪和沉积有金属薄膜的表面等离子体共振(SPR)感测部件相结合。 多通道表面等离子体共振传感器包括其中光被极化的垂直照明型聚焦光束椭偏仪; 表面等离子体共振(SPR)感测部,其设置在聚焦光束椭偏仪的物镜部分,以便根据偏振光的角度变化产生SPR; 以及流量单元,其提供包含与金属薄膜产生表面等离子体激元结合或解离的生物材料的缓冲溶液,其中同时检测SPR和椭偏相位随角度和波长的变化而改变。

    Organic light emitting display and method of driving the same
    5.
    发明授权
    Organic light emitting display and method of driving the same 有权
    有机发光显示器及其驱动方法

    公开(公告)号:US08269701B2

    公开(公告)日:2012-09-18

    申请号:US12463278

    申请日:2009-05-08

    Inventor: Seung-Won Chegal

    CPC classification number: G09G3/3275 G09G2320/0233 G09G2320/0276

    Abstract: An organic light emitting display and a driving method thereof, capable of increasing manufacturing yield by widening a range of gamma correction. An exemplary organic light emitting display includes a display region with pixels at crossings of data and scan lines; a gamma correction unit; a gamma correction circuit; a data driver; and a scan driver. The gamma correction unit includes first and second register units for storing first and second gamma correction signals, the second gamma correction signal comprising a corrected first gamma correction signal; a booster unit for correcting the second gamma correction signal to generate a third gamma correction signal; and a multiplexer for selecting the second gamma correction signal or the third gamma correction signal outputted from the booster unit, and for transferring it to the gamma correction circuit.

    Abstract translation: 一种有机发光显示器及其驱动方法,其能够通过扩大伽马校正范围来提高制造成品率。 示例性有机发光显示器包括具有数据和扫描线交叉处的像素的显示区域; 伽马校正单元; 伽马校正电路; 数据驱动程序 和扫描驱动程序。 伽马校正单元包括用于存储第一和第二伽马校正信号的第一和第二寄存器单元,第二伽马校正信号包括校正的第一伽马校正信号; 升压单元,用于校正第二伽马校正信号以产生第三伽马校正信号; 以及多路复用器,用于选择从升压单元输出的第二伽马校正信号或第三伽马校正信号,并将其传送到伽马校正电路。

    Single polarizer focused-beam ellipsometer
    6.
    发明授权
    Single polarizer focused-beam ellipsometer 有权
    单偏振器聚光束椭偏仪

    公开(公告)号:US08009292B2

    公开(公告)日:2011-08-30

    申请号:US12666159

    申请日:2008-11-11

    CPC classification number: G01B11/0641 G01N21/211 G01N2021/213

    Abstract: The present invention relates to a single-polarizer focused-beam ellipsometer. An ellipsometer according to the present invention includes a light source (210); a beam splitting part (220) for splitting a light generated in the light source (210) into a polarized light; an objective lens (230) for concentrately irradiating some of light split by the beam splitting part (220) onto a specimen (240); a photodetector (250) for detecting the light passed through the objective lens 230 and the beam splitting part (220) after reflected from the specimen (240) with unit cells; and a central processing unit (260) for correcting the intensity of the light detected by the photodetector (250) into a value corresponding to the unit cell of the photodetector (250) along multiple incidence plane passage of 360° with respect to respective incidence angles and processing the corrected value.

    Abstract translation: 本发明涉及单偏振器聚焦光束椭偏仪。 根据本发明的椭偏仪包括光源(210); 用于将在光源(210)中产生的光分解成偏振光的分束部分(220); 用于将通过分束部分(220)分裂的一些光集中照射到样本(240)上的物镜(230); 用于在从单元电池从样品(240)反射之后检测通过物镜230和分束部分(220)的光的光电检测器(250) 以及中央处理单元(260),用于相对于各个入射角将由光电检测器(250)检测的光的强度校正为与多个入射平面通过360°的光电检测器(250)的单元电池相对应的值 并处理校正值。

    Driving circuit of liquid crystal display
    7.
    发明申请
    Driving circuit of liquid crystal display 有权
    液晶显示器的驱动电路

    公开(公告)号:US20050151715A1

    公开(公告)日:2005-07-14

    申请号:US10934151

    申请日:2004-09-03

    Inventor: Seung Won Chegal

    CPC classification number: G09G3/3688 G11C19/00 G11C19/28

    Abstract: Disclosed is a liquid crystal display device including a liquid crystal panel having a shift register therein and an interface circuit for adjusting DC and AC levels, for compensating for a loss caused by elements and a resister of the shift register. A driving circuit of the liquid crystal display device includes a clock generation unit outputting a first clock signal as a gate clock signal, a second clock signal as an inverse signal of the first clock signal, and a start pulse, and a DC and AC level amplification unit for amplifying the first and second clock signals and the start pulse after adjusting DC and AC levels of the first and second clock signals and the start pulse, and outputting the first and second clock signals and the start pulse to the shift register.

    Abstract translation: 公开了一种液晶显示装置,其包括具有移位寄存器的液晶面板和用于调整DC和AC电平的接口电路,用于补偿由元件引起的损耗和移位寄存器的阻抗。 液晶显示装置的驱动电路包括时钟产生单元,输出第一时钟信号作为栅极时钟信号,第二时钟信号作为第一时钟信号的反相信号,以及起始脉冲,以及DC和AC电平 放大单元,用于在调整第一和第二时钟信号的DC和AC电平和起始脉冲之后放大第一和第二时钟信号和起始脉冲,并将第一和第二时钟信号和起始脉冲输出到移位寄存器。

    Measurement of Fourier Coefficients Using Integrating Photometric Detector
    9.
    发明申请
    Measurement of Fourier Coefficients Using Integrating Photometric Detector 有权
    使用积分光度检测器测量傅里叶系数

    公开(公告)号:US20110077883A1

    公开(公告)日:2011-03-31

    申请号:US12840849

    申请日:2010-07-21

    CPC classification number: G01J1/42 G01J4/00 G01N21/211

    Abstract: Provided is a measurement method of Fourier coefficients using an integrating photometric detector, wherein, when measuring an exposure (Sj) with a predetermined time interval during a predetermined time period using an integrating photometric detector with respect to light of which amplitude varies with the time period, normalized Fourier coefficients (α′2n, β′2n) for a waveform of an intensity of the light is determined by carrying out a discrete Fourier transform with respect to an equation for the measured exposure (Sj).

    Abstract translation: 提供了一种使用积分光度检测器的傅立叶系数的测量方法,其中,当使用积分测光检测器相对于其幅度随时间变化的光在测量预定时间段期间以预定时间间隔的曝光(Sj)时 通过对于测量的曝光(Sj)执行离散傅里叶变换来确定用于光强度的波形的归一化傅立叶系数(α'2n,&bgr;'2n)。

    MINUTE MEASURING INSTRUMENT FOR HIGH SPEED AND LARGE AREA AND THE METHOD OF THEREOF
    10.
    发明申请
    MINUTE MEASURING INSTRUMENT FOR HIGH SPEED AND LARGE AREA AND THE METHOD OF THEREOF 有权
    用于高速和大面积的分钟测量仪器及其方法

    公开(公告)号:US20100321693A1

    公开(公告)日:2010-12-23

    申请号:US12666064

    申请日:2008-11-11

    CPC classification number: G01B11/06 G01Q30/02

    Abstract: The present invention relates to a minute measuring instrument for high speed and large area and a method thereof, and more particularly, to a minute measuring instrument for high speed and large area which measures properties of a specimen in high speed by a focused-beam ellipsometric part and then minutely remeasures the position showing a singular point by a minute measuring part and a method thereof.

    Abstract translation: 本发明涉及一种高速大面积的微小测量仪器及其方法,更具体地说,涉及一种高速大面积的微小测量仪器,其通过聚焦光椭圆测量仪测量高速样品的性能 然后通过微小的测量部分及其方法精细地重新显示奇点的位置。

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